公开(公告)号：US08172449B2

公开(公告)日：2012-05-08

申请号：US12445463

申请日：2007-11-06

申请人： Yasuaki Yamane ,  Kazuo Yamaguchi ,  Toru Sakatani ,  Sayaka Yamada ,  Kazuhisa Fukutani ,  Koichi Honke

发明人： Yasuaki Yamane ,  Kazuo Yamaguchi ,  Toru Sakatani ,  Sayaka Yamada ,  Kazuhisa Fukutani ,  Koichi Honke

IPC分类号： B29B7/00

CPC分类号： B29B7/482 ,  B29C47/0009 ,  B29C47/0825 ,  B29C47/38 ,  B29C47/402 ,  B29C47/60 ,  B29C47/6031 ,  B29C47/6056 ,  B29C47/6075 ,  B29C47/62 ,  B29C47/625 ,  B29C47/767 ,  Y10T29/49826

摘要： To provide a kneading screw which can reduce such a phenomenon that a disproportional load is imposed onto a shaft of the kneading screw without degrading kneading performance of the kneading screw, a twin screw extruder with the kneading screw, and a method for assembling the kneading screw. In the kneading screw, each of the kneading rotor segments has at least one of a spiral kneading blade or a kneading blade extending in parallel with the axial direction, and is incorporated in the kneading screw such that top blade portions of the kneading blades at the adjacent ends of the kneading rotor segments adjacent to each other in the axial direction of the kneading screw are shifted in phase to each other, and such that the top blade portions of the kneading blades at the respective central positions in the axial direction of the adjacent kneading rotor segments are shifted larger in phase than the case where the top blade portions of the adjacent ends of the adjacent kneading rotor segments are equal in phase to each other.

摘要翻译： 为了提供一种捏合螺杆，能够减少在混炼螺杆的轴上施加不成比例的负荷而不降低捏合螺杆的捏合性能的现象，具有捏合螺杆的双螺杆挤出机和混炼螺杆的组装方法 。 在捏合螺杆中，每个搅拌转子段具有螺旋混合叶片或与轴向平行延伸的捏合叶片中的至少一个，并且被装入捏合螺杆中，使得捏合叶片的顶叶部分 在混炼螺杆的轴向上相邻的混炼用转子段的相邻端部相位移动，使得混炼叶片的顶部叶片部分在相邻的轴向的各个中心位置 混炼转子段的相位偏移比相邻的混炼用转子段的相邻端部的顶部叶片部的相位相等的情况相同。

公开(公告)号：US20100091603A1

公开(公告)日：2010-04-15

申请号：US12445463

申请日：2007-11-06

申请人： Yasuaki Yamane ,  Kazuo Yamaguchi ,  Toru Sakatani ,  Sayaka Yamada ,  Kazuhisa Fukutani ,  Koichi Honke

发明人： Yasuaki Yamane ,  Kazuo Yamaguchi ,  Toru Sakatani ,  Sayaka Yamada ,  Kazuhisa Fukutani ,  Koichi Honke

IPC分类号： B29B7/80 ,  B23P11/00

CPC分类号： B29B7/482 ,  B29C47/0009 ,  B29C47/0825 ,  B29C47/38 ,  B29C47/402 ,  B29C47/60 ,  B29C47/6031 ,  B29C47/6056 ,  B29C47/6075 ,  B29C47/62 ,  B29C47/625 ,  B29C47/767 ,  Y10T29/49826

摘要： To provide a kneading screw which can reduce such a phenomenon that a disproportional load is imposed onto a shaft of the kneading screw without degrading kneading performance of the kneading screw, a twin screw extruder with the kneading screw, and a method for assembling the kneading screw. In the kneading screw, each of the kneading rotor segments has at least one of a spiral kneading blade or a kneading blade extending in parallel with the axial direction, and is incorporated in the kneading screw such that top blade portions of the kneading blades at the adjacent ends of the kneading rotor segments adjacent to each other in the axial direction of the kneading screw are shifted in phase to each other, and such that the top blade portions of the kneading blades at the respective central positions in the axial direction of the adjacent kneading rotor segments are shifted larger in phase than the case where the top blade portions of the adjacent ends of the adjacent kneading rotor segments are equal in phase to each other.

摘要翻译： 为了提供一种捏合螺杆，能够减少在混炼螺杆的轴上施加不成比例的负荷而不降低捏合螺杆的捏合性能的现象，具有捏合螺杆的双螺杆挤出机和混炼螺杆的组装方法 。 在捏合螺杆中，每个搅拌转子段具有螺旋混合叶片或与轴向平行延伸的捏合叶片中的至少一个，并且被装入捏合螺杆中，使得捏合叶片的顶叶部分 在混炼螺杆的轴向上相邻的混炼用转子段的相邻端部相位移动，使得混炼叶片的顶部叶片部分在相邻的轴向的各个中心位置 混炼转子段的相位偏移比相邻的混炼用转子段的相邻端部的顶部叶片部的相位相等的情况相同。

公开(公告)号：US20060238760A1

公开(公告)日：2006-10-26

申请号：US11475667

申请日：2006-06-26

申请人： Yukihiro Shibata ,  Shunji Maeda ,  Kazuo Yamaguchi ,  Minoru Yoshida ,  Atsushi Yoshida ,  Kenji Oka ,  Kenji Watanabe

发明人： Yukihiro Shibata ,  Shunji Maeda ,  Kazuo Yamaguchi ,  Minoru Yoshida ,  Atsushi Yoshida ,  Kenji Oka ,  Kenji Watanabe

IPC分类号： G01J4/00

CPC分类号： G01N21/21 ,  G01N21/9501 ,  G01N21/956 ,  G01N21/95607 ,  G02B21/0016

摘要： A defect inspecting apparatus is disclosed that can detect finer defects with high resolution optical images of those defects, and which makes the difference in contrast greater between fine line patterns of a semiconductor device. The defect inspecting apparatus includes a sample mounting device for mounting a sample; lighting and detecting apparatus for illuminating a patterned sample mounted on a mount and detecting the optical image of the reflected light obtained therefrom. Also included is a display for displaying the optical image detected by this lighting and detecting apparatus; an optical parameter setting device for setting and displaying optical parameters for the lighting and detecting apparatus on the display; and optical parameter adjusting apparatus for adjusting optical parameters set for the lighting and detecting apparatus according to the optical parameters set by the optical parameter setting apparatus; a storage device for storing comparative image data; and a defect detecting device for detecting defects from patterns formed on the sample by comparing the optical image detected by the optical image detecting apparatus with the comparative image data stored in the storage.

摘要翻译： 公开了能够利用这些缺陷的高分辨率光学图像检测更细的缺陷的缺陷检查装置，并且使得半导体器件的细线图案之间的对比度差异更大。 缺陷检查装置包括用于安装样品的样品安装装置; 照明和检测装置，用于照亮安装在安装件上的图案样品，并检测由其获得的反射光的光学图像。 还包括用于显示由该照明和检测装置检测的光学图像的显示器; 用于在显示器上设置和显示照明和检测装置的光学参数的光学参数设置装置; 以及光学参数调整装置，用于根据由所述光学参数设定装置设定的光学参数来调整对所述照明和检测装置设定的光学参数; 用于存储比较图像数据的存储装置; 以及缺陷检测装置，用于通过将由光学图像检测装置检测的光学图像与存储在存储器中的比较图像数据进行比较来检测在样本上形成的图案的缺陷。

公开(公告)号：US20060210144A1

公开(公告)日：2006-09-21

申请号：US11325552

申请日：2006-01-05

申请人： Kazuo Yamaguchi ,  Toshifumi Honda ,  Yuji Takagi ,  Munenori Fukunishi

发明人： Kazuo Yamaguchi ,  Toshifumi Honda ,  Yuji Takagi ,  Munenori Fukunishi

IPC分类号： G06K9/00

CPC分类号： G06T7/0006 ,  G06T2207/10061 ,  G06T2207/30148

摘要： A reviewing apparatus, for enabling to conduct detailed review (ADR) and/or defect classification (ADC), effectively, through making alignment of defects detected in an upstream inspecting apparatus into the reviewing apparatus, with certainty and at high accuracy, and further within a short time-period, comprises a defect selecting portion 240 for selecting or picking up a plural number of alignment candidates from a large numbers defects, upon defect inspection information, which is detected within the inspecting apparatus, an electron microscope 21 (30) for obtaining a SEM image of the plural number of alignment candidates, through picking up an image on each of the plural number of alignment candidates, which are selected or picked up, narrowly, and a determining portion 243 for calculating out characteristic quantities relating to the plural number of alignment candidates, upon basis of the obtained SEM images thereof, and for determining on suitableness/unsuitableness for use in alignment relating to the plural number of alignment candidates, upon basis of the characteristic quantities calculated therewith.

摘要翻译： 一种审查装置，能够有效地进行详细审查（ADR）和/或缺陷分类（ADC），通过将上游检测装置中检测到的缺陷与确定性和准确性进行对准，并进一步在 短时间段包括用于从大量缺陷中选择或拾取多个对准候选的缺陷选择部分240，在检查装置内检测到的缺陷检查信息时，具有电子显微镜21（30），用于 通过拾取选择或拾取的多个对准候选者中的每一个上的图像，以及用于计算与多个对准候选者相关的特征量的确定部分243，获得多个对准候选的SEM图像; 基于所获得的SEM图像和用于确定适合性/不适合性的对准候选数 基于由其计算的特征量，与多个对准候选对齐。

公开(公告)号：US06690469B1

公开(公告)日：2004-02-10

申请号：US09397334

申请日：1999-09-14

申请人： Yukihiro Shibata ,  Shunji Maeda ,  Kazuo Yamaguchi ,  Minoru Yoshida ,  Atsushi Yoshida ,  Kenji Oka ,  Kenji Watanabe

发明人： Yukihiro Shibata ,  Shunji Maeda ,  Kazuo Yamaguchi ,  Minoru Yoshida ,  Atsushi Yoshida ,  Kenji Oka ,  Kenji Watanabe

IPC分类号： G01J400

CPC分类号： G01N21/21 ,  G01N21/9501 ,  G01N21/956 ,  G01N21/95607 ,  G02B21/0016

摘要： A defect inspecting apparatus is disclosed that can detect finer defects with high resolution optical images of those defects, and which makes the difference in contrast greater between fine line patterns of a semiconductor device. The defect inspecting apparatus includes a sample mounting device for mounting a sample; lighting and detecting apparatus for illuminating a patterned sample mounted on a mount and detecting the optical image of the reflected light obtained therefrom. Also included is a display for displaying the optical image detected by this lighting and detecting apparatus; an optical parameter setting device for setting and displaying optical parameters for the lighting and detecting apparatus on the display; and optical parameter adjusting apparatus for adjusting optical parameters set for the lighting and detecting apparatus according to the optical parameters set by the optical parameter setting apparatus; a storage device for storing comparative image data; and a defect detecting device for detecting defects from patterns formed on the sample by comparing the optical image detected by the optical image detecting apparatus with the comparative image data stored in the storage.

摘要翻译： 公开了能够利用这些缺陷的高分辨率光学图像检测更细的缺陷的缺陷检查装置，并且使得半导体器件的细线图案之间的对比度差异更大。 缺陷检查装置包括用于安装样品的样品安装装置; 照明和检测装置，用于照亮安装在安装件上的图案样品，并检测由其获得的反射光的光学图像。 还包括用于显示由该照明和检测装置检测的光学图像的显示器; 用于在显示器上设置和显示照明和检测装置的光学参数的光学参数设置装置; 以及光学参数调整装置，用于根据由所述光学参数设定装置设定的光学参数来调整对所述照明和检测装置设定的光学参数; 用于存储比较图像数据的存储装置; 以及缺陷检测装置，用于通过将由光学图像检测装置检测的光学图像与存储在存储器中的比较图像数据进行比较来检测在样本上形成的图案的缺陷。

公开(公告)号：US5795968A

公开(公告)日：1998-08-18

申请号：US783288

申请日：1997-01-10

申请人： Tetsuro Kuga ,  Hiromasa Miyaji ,  Moriyuki Sato ,  Masami Okabe ,  Makoto Morimoto ,  Seiga Itoh ,  Motoo Yamasaki ,  Yoshiharu Yokoo ,  Kazuo Yamaguchi ,  Hajime Yoshida ,  Yoshinori Komatsu

发明人： Tetsuro Kuga ,  Hiromasa Miyaji ,  Moriyuki Sato ,  Masami Okabe ,  Makoto Morimoto ,  Seiga Itoh ,  Motoo Yamasaki ,  Yoshiharu Yokoo ,  Kazuo Yamaguchi ,  Hajime Yoshida ,  Yoshinori Komatsu

IPC分类号： A61K38/00 ,  C07K1/107 ,  C07K1/113 ,  C07K1/12 ,  C07K14/535 ,  C07K16/24 ,  C07K17/06 ,  C12N15/70

CPC分类号： C07K1/1077 ,  C07K1/113 ,  C07K14/535 ,  C07K16/243 ,  C07K17/06 ,  C12N15/70 ,  A61K38/00

摘要： Novel hG-CSF polypeptide derivatives having an amino acid sequence derived from the amino acid sequence of the human granulocyte colony stimulating factor polypeptide by substitution of at least one amino acid by a different amino acid and/or deletion of at least one amino acid, recombinant plasmids containing a DNA fragment insert coding for any of these hG-CSF polypeptide derivatives, microorganisms carrying one of such plasmids, methods of producing the hG-CSF polypeptide derivatives using the microorganisms, a monoclonal antibody binding to the hG-CSF polypeptide derivative, and chemically modified hG-CSF or derivatives thereof are disclosed.

摘要翻译： 具有衍生自人粒细胞集落刺激因子多肽的氨基酸序列的氨基酸序列的新型hG-CSF多肽衍生物通过用不同氨基酸取代至少一个氨基酸和/或缺失至少一个氨基酸，重组体 含有编码这些hG-CSF多肽衍生物中的任何一种的DNA片段插入片段的质粒，携带这种质粒之一的微生物，使用微生物生产hG-CSF多肽衍生物的方法，与hG-CSF多肽衍生物结合的单克隆抗体，以及 公开了化学修饰的hG-CSF或其衍生物。

公开(公告)号：US5153120A

公开(公告)日：1992-10-06

申请号：US652151

申请日：1991-02-07

申请人： Ryoichi Katsumata ,  Toru Mizukami ,  Shigenori Ohta ,  Moriyuki Sato ,  Kazuo Yamaguchi

发明人： Ryoichi Katsumata ,  Toru Mizukami ,  Shigenori Ohta ,  Moriyuki Sato ,  Kazuo Yamaguchi

IPC分类号： C12N15/09 ,  C12N9/10 ,  C12N15/54 ,  C12R1/125

CPC分类号： C12N9/104 ,  Y10S435/832

摘要： The present invention provides a recombinant DNA comprised of a vector DNA and a DNA fragment containing a gene coding for .gamma.-glutamyl transpeptidase derived from Bacillus subtilis. The invention also provides a process for producing .gamma.-glutamyl transpeptidase, which comprises culturing in a culture medium a microorganism belonging to the genus Bacillus which is carrying recombinant DNA comprised of a vector DNA and DNA fragment which contains a gene coding for .gamma.-glutamyl transpeptidase derived from the genus Bacillus, accumulating .gamma.-glutamyl transpeptidase in the culture, and recovering .gamma.-glutamyl transpeptidase therefrom.

公开(公告)号：US5130536A

公开(公告)日：1992-07-14

申请号：US603402

申请日：1990-10-26

申请人： Seiichi Sato ,  Kazuo Yamaguchi ,  Yoshi Kurosawa ,  Atsushi Ueda ,  Masami Matsumura

发明人： Seiichi Sato ,  Kazuo Yamaguchi ,  Yoshi Kurosawa ,  Atsushi Ueda ,  Masami Matsumura

IPC分类号： G01D5/36 ,  G01D5/245 ,  G01D5/30 ,  H03M1/30

CPC分类号： H03M1/308 ,  G01D5/2457

摘要： An optical rotary encoder having a rotatable pulse scale having a row of code pattern with specific light-permeable or-deflection slits each for outputting a reference position signal and other light-permeable or reflection slits each adapted to reduce the amount of light for outputting an angular signal, both of the optical signals being photoelectronically converted and the waveform of the resultant electric signals being shaped based on threshold voltages into electric pulse signals indicative of a reference angle of 0.degree. and the accumulated angle of rotation, in which the circumferential width of each specific reference slit is made narrower than that of other slit so that the pulse width for angular position indicating of the angular pulse signal is always equal and constant for ensuring more accurate detection of the angle of rotation.

摘要翻译： 一种光学旋转编码器，其具有可旋转的脉冲刻度，其具有一排代码图案，具有特定的光透射或偏转狭缝，每个狭缝用于输出参考位置信号和其他透光或反射狭缝，每个适于减少用于输出 角度信号，两个光信号被光电转换，并且所得到的电信号的波形根据阈值电压被成形为表示参考角度0°的电脉冲信号和累积的旋转角度，其中圆周宽度 每个特定的参考狭缝比其他狭缝窄，使得指示角度脉冲信号的角位置的脉冲宽度总是相等和恒定的，以确保更准确地检测旋转角度。

公开(公告)号：US5074718A

公开(公告)日：1991-12-24

申请号：US574198

申请日：1990-08-29

申请人： Akihiro Ushitora ,  Kazuo Yamaguchi ,  Tsuneo Asanagi

发明人： Akihiro Ushitora ,  Kazuo Yamaguchi ,  Tsuneo Asanagi

IPC分类号： E03F3/00 ,  E03F1/00 ,  E03F7/00

CPC分类号： E03F1/007 ,  E03F1/006 ,  Y10T137/402

摘要： A vacuum-type sewage collecting apparatus is arranged in such a manner that sewage discharged from the houses or facilities is once accumulated in a cesspool, and the sewage accumulated in the cesspool is then collected through a vacuum valve and a vacuum sewage pipe, the interior of which is under a negative pressure. The vacuum valve is operated by negative pressure taken from a vacuum source and supplied to the vacuum valve via a connecting pipe. The negative pressure for operating the vacuum valve is taken from a portion of a vacuum sewage pipe which is elevated at a level higher than that of the vacuum valve and is disposed downstream of the vacuum valve. Alternatively, the negative pressure may be directly taken from an accumulating tank, the inner pressure of which has been evacuated by a vacuum pump, from a pipe which establishes a connection between the accumulating tank and the vacuum pump, or from a tank connected to the pipe connecting the accumulating tank and the vacuum pump. In this way, a high negative pressure can be supplied to the vacuum valve to effectively and completely open the vacuum valve to thereby perform an efficient discharge of the sewage through the same valve.

公开(公告)号：US4862460A

公开(公告)日：1989-08-29

申请号：US918499

申请日：1986-10-14

申请人： Kazuo Yamaguchi

发明人： Kazuo Yamaguchi

IPC分类号： G01R31/28 ,  G01R31/3181 ,  G01R31/3183 ,  G01R31/319 ,  G11C29/00 ,  G11C29/56

CPC分类号： G01R31/31921 ,  G11C29/56 ,  G01R31/31813 ,  G01R31/31926

摘要： A test pattern generator includes: an algorithmic pattern generator, a sequential pattern generator, a selector for selecting one of an algorithmic pattern and a sequential pattern for use with a specified pin of an object device to be tested; and a pattern controller for controlling the selector, whereby data to be supplied to a pin or pin block can be assigned in real time by the pattern controller.

摘要翻译： 测试图形生成器包括：算法模式生成器，顺序模式生成器，用于选择算法模式之一的选择器和用于要测试的对象设备的指定引脚的顺序模式; 以及用于控制选择器的模式控制器，由模式控制器实时地分配要提供给引脚或引脚块的数据。