LARGE-DEFLECTION MICROACTUATORS
    1.
    发明申请
    LARGE-DEFLECTION MICROACTUATORS 有权
    大型微型切割机

    公开(公告)号:US20130334928A1

    公开(公告)日:2013-12-19

    申请号:US13907242

    申请日:2013-05-31

    发明人: Jason V. Clark

    IPC分类号: H01L41/09

    摘要: Actuators using piezoelectric drives, S-drives, or S-flexures are disclosed. The actuators can include S-drives connected in series to deflect substantially in a common deflection direction. The actuators can also include pairs of piezoelectric elements connected together for rotation in the plane of the pairs. An arm assembly and a forearm assembly can each have a plurality of S-flexures for deflection along substantially orthogonal axes.

    摘要翻译: 公开了使用压电驱动器,S驱动器或S形弯曲件的致动器。 致动器可以包括串联连接的S驱动器,以大体上沿共同的偏转方向偏转。 致动器还可以包括连接在一起以在对的平面中旋转的成对的压电元件。 臂组件和前臂组件可以各自具有多个S形弯曲部,用于沿着大致正交的轴线偏转。

    Large-deflection microactuators
    2.
    发明授权
    Large-deflection microactuators 有权
    大偏转微致动器

    公开(公告)号:US09190600B2

    公开(公告)日:2015-11-17

    申请号:US13907242

    申请日:2013-05-31

    发明人: Jason V. Clark

    IPC分类号: H01L41/09 H02N2/02

    摘要: Actuators using piezoelectric drives, S-drives, or S-flexures are disclosed. The actuators can include S-drives connected in series to deflect substantially in a common deflection direction. The actuators can also include pairs of piezoelectric elements connected together for rotation in the plane of the pairs. An arm assembly and a forearm assembly can each have a plurality of S-flexures for deflection along substantially orthogonal axes.

    摘要翻译: 公开了使用压电驱动器,S驱动器或S形弯曲件的致动器。 致动器可以包括串联连接的S驱动器,以大体上沿共同的偏转方向偏转。 致动器还可以包括连接在一起以在对的平面中旋转的成对的压电元件。 臂组件和前臂组件可以各自具有多个S形弯曲部,用于沿着大致正交的轴线偏转。

    MICROELECTROMECHANICAL SYSTEM LAYOUT USING GENOTYPE PERFORMANCE SIMULATION
    6.
    发明申请
    MICROELECTROMECHANICAL SYSTEM LAYOUT USING GENOTYPE PERFORMANCE SIMULATION 审中-公开
    使用基因型性能模拟的微电子系统布局

    公开(公告)号:US20160132624A1

    公开(公告)日:2016-05-12

    申请号:US14581413

    申请日:2014-12-23

    发明人: Jason V. Clark

    IPC分类号: G06F17/50

    摘要: Methods for producing layout data for devices are described. One method includes using a genetic algorithm to determine a structure of a thermally.operated actuator. Reference system performance characteristics are received and structure genotypes produced, each structure genotype including geometric and thermal properties of each of a plurality of links in the microelectromechanical system, the geometric and thermal properties selected randomly. Respective system performance characteristics of the genotypes are simulated and respective fitness ratings determined with respect to the reference. A second population of structure genotypes is produced using the first population and the determined fitness ratings. The steps are iterated until one of the structure genotypes satisfies selected termination criteria. Layout data corresponding to the geometric properties in the one of the structure genotypes are automatically produced using the controller.

    摘要翻译: 描述了用于生成设备布局数据的方法。 一种方法包括使用遗传算法来确定热操作致动器的结构。 接收参考系统性能特征并产生结构基因型,每种结构基因型包括微机电系统中的多个链节中的每一个的几何和热性质,随机选择的几何和热性质。 模拟基因型的各个系统性能特征,并根据参考确定各自的适应度。 使用第一群体和确定的适合度评分来生产第二种结构基因型群体。 重复这些步骤,直到结构基因型之一满足所选择的终止标准。 使用控制器自动生成与结构基因型之一对应的布局数据。

    MICROELECTROMECHANICAL SYSTEM AND METHODS OF USE
    7.
    发明申请
    MICROELECTROMECHANICAL SYSTEM AND METHODS OF USE 审中-公开
    微电子系统及其使用方法

    公开(公告)号:US20150177272A1

    公开(公告)日:2015-06-25

    申请号:US14407898

    申请日:2013-05-31

    发明人: Jason V. Clark

    摘要: Methods of measuring displacement of a movable mass in a microelectromechanical system (MEMS) include driving the mass against two displacement-stopping surfaces and measuring corresponding differential capacitances of sensing capacitors such as combs. A MEMS device having displacement-stopping surfaces is described. Such a MEMS device can be used in a method of measuring properties of an atomic force microscope (AFM) having a cantilever and a deflection sensor, or in a temperature sensor having a displacement-sensing unit for sensing a movable mass permitted to vibrate along a displacement axis. A motion-measuring device can include pairs of accelerometers and gyroscopes driven 90° out of phase.

    摘要翻译: 测量微机电系统(MEMS)中可移动质量块的位移的方法包括对两个位移停止表面驱动质量,并测量感应电容器(如梳子)的对应微分电容。 描述了具有位移停止表面的MEMS器件。 这种MEMS器件可以用于测量具有悬臂和偏转传感器的原子力显微镜(AFM)的性质的方法中,或者在具有位移感测单元的温度传感器中使用,该位移感测单元用于感测允许沿着 位移轴。 运动测量装置可以包括驱动90°异相的加速度计和陀螺仪对。