Electronic device processing equipment having contact gasket between chamber parts
    2.
    发明授权
    Electronic device processing equipment having contact gasket between chamber parts 失效
    电子设备处理设备在室部件之间具有接触垫片

    公开(公告)号:US06695318B2

    公开(公告)日:2004-02-24

    申请号:US09760853

    申请日:2001-01-17

    IPC分类号: F16J1502

    CPC分类号: H01J37/32458 H01J37/32477

    摘要: An arrangement for improved thermal and/or electrical coupling between parts disposed in electronic device processing equipment is provided. In an illustrated embodiment, an improved coupling between a chamber liner and a chamber wall is provided which can be utilized in semiconductor processing equipment. The arrangement includes a compressible coupling or gasket which is compressed between a wedge ring and the chamber wall. The chamber liner is coupled to the wedge ring, so that the chamber liner is coupled to the chamber wall by way of the wedge ring and compressible coupling.

    摘要翻译: 提供了一种用于改善设置在电子设备处理设备中的部件之间的热和/或电耦合的装置。 在图示的实施例中,提供了腔室衬套和室壁之间的改进的联接,其可用于半导体加工设备中。 该装置包括在楔形环和腔室壁之间被压缩的可压缩联接器或垫圈。 腔室衬套联接到楔形环,使得腔室衬套通过楔环和可压缩联接件联接到腔室壁。

    Scanner for GCIB system
    5.
    发明授权
    Scanner for GCIB system 有权
    GCIB系统扫描仪

    公开(公告)号:US08791430B2

    公开(公告)日:2014-07-29

    申请号:US13411329

    申请日:2012-03-02

    IPC分类号: B01J19/12

    摘要: Disclosed are an apparatus, system, and method for scanning a substrate or other workpiece through a gas-cluster ion beam (GCIB), or any other type of ion beam. The workpiece scanning apparatus is configured to receive and hold a substrate for irradiation by the GCIB and to scan it through the GCIB in two directions using two movements: a reciprocating fast-scan movement, and a slow-scan movement. The slow-scan movement is actuated using a servo motor and a belt drive system, the belt drive system being configured to reduce the failure rate of the workpiece scanning apparatus.

    摘要翻译: 公开了一种用于通过气体簇离子束(GCIB)或任何其它类型的离子束扫描衬底或其它工件的装置,系统和方法。 工件扫描装置被配置为接收和保持用于GCIB照射的基板,并且通过两次运动通过GCIB在两个方向上进行扫描:往复式快速扫描运动和慢扫描运动。 使用伺服电动机和皮带驱动系统来驱动缓慢扫描运动,所述皮带驱动系统被配置为降低工件扫描装置的故障率。

    Heater assembly for high throughput chemical treatment system
    6.
    发明授权
    Heater assembly for high throughput chemical treatment system 有权
    用于高通量化学处理系统的加热器组件

    公开(公告)号:US08115140B2

    公开(公告)日:2012-02-14

    申请号:US12183597

    申请日:2008-07-31

    IPC分类号: F27B5/14 C23C16/00 F23Q7/00

    摘要: A heater assembly configured to elevate a temperature of a processing element in a chemical treatment system is described. The heater assembly may be configured to uniformly heat a large area processing element, such as a processing element that spans a plurality of substrates. Additionally, for example, the heater assembly may be configured to elevate a temperature of an upper assembly, a gas injection assembly, a substrate holder, a chamber wall, or any combination of two or more thereof.

    摘要翻译: 描述了构造成提高化学处理系统中的处理元件的温度的加热器组件。 加热器组件可以被配置为均匀加热大面积的处理元件,例如跨越多个基板的处理元件。 此外,例如,加热器组件可以被配置为提升上部组件,气体注入组件,衬底保持器,室壁或其两个或更多个的任何组合的温度。

    HEATER ASSEMBLY FOR HIGH THROUGHPUT CHEMICAL TREATMENT SYSTEM
    7.
    发明申请
    HEATER ASSEMBLY FOR HIGH THROUGHPUT CHEMICAL TREATMENT SYSTEM 有权
    用于高通量化学处理系统的加热器组件

    公开(公告)号:US20100025389A1

    公开(公告)日:2010-02-04

    申请号:US12183597

    申请日:2008-07-31

    IPC分类号: F23Q7/00

    摘要: A heater assembly configured to elevate a temperature of a processing element in a chemical treatment system is described. The heater assembly may be configured to uniformly heat a large area processing element, such as a processing element that spans a plurality of substrates. Additionally, for example, the heater assembly may be configured to elevate a temperature of an upper assembly, a gas injection assembly, a substrate holder, a chamber wall, or any combination of two or more thereof.

    摘要翻译: 描述了构造成提高化学处理系统中的处理元件的温度的加热器组件。 加热器组件可以被配置为均匀加热大面积的处理元件,例如跨越多个基板的处理元件。 此外,例如,加热器组件可以被配置为提升上部组件,气体注入组件,衬底保持器,室壁或其两个或更多个的任何组合的温度。