公开(公告)号：US4990782A

公开(公告)日：1991-02-05

申请号：US370556

申请日：1989-06-23

Applicant: William H. Wellman ,  Russell D. Granneman

Inventor： William H. Wellman ,  Russell D. Granneman

IPC: G01J1/02 ,  F25B21/02 ,  G01J5/02 ,  G01J5/06 ,  H01L31/0216 ,  H01L31/0232 ,  H01L31/024

CPC classification number: H01L31/0232 ,  F25B21/02 ,  G01J5/06 ,  H01L31/02164 ,  H01L31/024

Abstract: A radiation shield 40 is mounted to an uncooled portion, such as an outer case 14, of an IR detector assembly 10 such that it surrounds a thermoelectric cooler 16 and a radiation detector 18. The shield 40 has a curved reflective upper surface 42 having the shape of a toric segment and cylindrical or rectangular reflective sidewalls 44 for imaging the detector 18 and the upper cooler stage upon the tops and sides of lower and slightly warmer cooler stages, which absorb and eliminate radiative energy. This beneficially reduces the heat load upon the coldest stage by excluding hotter surfaces from its view, and by inhibiting reflective couplings of unwanted energy admitted by aperture 46. An aperture 46 defines the effective coldstop for the detector 18.

公开(公告)号：US5414294A

公开(公告)日：1995-05-09

申请号：US40710

申请日：1993-03-31

Applicant: Russell D. Granneman ,  William O. McKeag

Inventor： Russell D. Granneman ,  William O. McKeag

IPC: H01L27/146 ,  H01L31/0352 ,  H01L27/14 ,  H01L31/00 ,  H01L31/02

CPC classification number: H01L31/035281 ,  H01L27/14643 ,  H01L27/14649 ,  Y02E10/50

Abstract: A radiation detector includes a photovoltaic diode mesa structure (16) having of a plurality of sub-mesa structures (16a, 16b). Each of said sub-mesa structures includes a first layer (14a) of semiconductor material having a first type of electrical conductivity and a second layer (14b) having a second type of electrical conductivity such that a p-n junction is formed between the first and the second layers. Metalization (24) is disposed within a trench (30a) that runs between the sub-mesas and includes a tab portion (24a) that extends upwardly over a sidewall of each of said sub-mesa structures so as to electrically contact the second layer contained within each. As a result, each of said sub-mesa structures are electrically connected in parallel. The trench is disposed parallel to a radiation scan axis of the radiation detector and orthogonal to a radiation cross-scan axis of the radiation detector for reducing a width of surface features across the scan axis, thereby reducing a light signature of the detector.

Abstract translation: 辐射检测器包括具有多个子台面结构（16a，16b）的光伏二极管台面结构（16）。 每个所述子台面结构包括具有第一类型导电性的第一半导体材料层（14a）和具有第二类导电性的第二层（14b），使得在第一和第二层之间形成pn结 第二层。 金属化（24）设置在在子台面之间延伸的沟槽（30a）内，并且包括在每个所述子台面结构的侧壁上向上延伸的突出部分（24a），以便电接触所包含的第二层 在每一个。 结果，每个所述子台面结构并联电连接。 沟槽平行于辐射检测器的辐射扫描轴设置并且垂直于辐射检测器的辐射横向扫描轴线，用于减小穿过扫描轴线的表面特征的宽度，由此减小检测器的光签名。

公开(公告)号：US06677588B1

公开(公告)日：2004-01-13

申请号：US07292023

申请日：1988-12-13

Applicant: Russell D. Granneman

Inventor： Russell D. Granneman

IPC: G01J500

CPC classification number: G01J5/061 ,  G01J3/0262 ,  G01J2005/0077 ,  G02B5/003 ,  G02B23/12 ,  G02B27/0018

Abstract: An improved detector assembly 10 having decreased sensitivity both to Narcissism and to stray light ghosting is disclosed herein. The improved detector assembly 10 of the present invention includes a housing 70 having an input aperture 142 in communication with a chamber within said housing. A detector 130 for sensing electromagnetic energy passing through the input aperture 142 within a first field of view is mounted within the chamber. Also mounted within the chamber is a detector mirror 100 for reflecting energy passing through the input aperture 142 within a second field of view outside of the first field of view. The improved assembly 10 of the present invention further includes a second mirror 110 mounted within the chamber for reflecting energy reflected by the first mirror 100 through the input aperture 142.

Abstract translation: 本文公开了一种改进的检测器组件10，其具有降低的自恋和偏光重影的灵敏度。 本发明的改进的检测器组件10包括壳体70，壳体70具有与所述壳体内的腔室连通的输入孔142。 用于感测通过第一视场内的输入孔142的电磁能的检测器130安装在腔室内。 还安装在腔室内的是用于在第一视场外的第二视野内反射通过输入孔142的能量的检测镜100。 本发明的改进的组件10还包括安装在室内的第二反射镜110，用于反射由第一反射镜100反射的能量通过输入孔142。

公开(公告)号：US5502300A

公开(公告)日：1996-03-26

申请号：US44437

申请日：1993-03-31

Applicant: William O. McKeag ,  Russell D. Granneman

Inventor： William O. McKeag ,  Russell D. Granneman

IPC: G02B5/04 ,  H01L27/146 ,  H01J3/14

CPC classification number: H01L27/14643 ,  G02B5/045 ,  H01L27/14625

Abstract: A focal plane array (10) of radiation detectors (10b) has all features inclined with respect to an illuminating beam of radiation. That is, all features that would be orthogonally disposed with respect to an incoming wavefront are instead inclined to the incoming wavefront, an arrangement referred to as compound tipping. The disclosed embodiments of the invention create a compound tipping of the focal plane array such that there are no features of the array, such as mesa edges and sidewalls, that lie in the plane of the incoming wavefront. As a result, only a small amount of scattered light is observed, and the optical signature is significantly reduced. The invention substantially eliminates the optical signature by simultaneously tipping the focal plane features (optically and/or mechanically) in both major array axes, without degrading the imaging performance of the detective assembly.

Abstract translation: 辐射检测器（10b）的焦平面阵列（10）具有相对于照射辐射束倾斜的所有特征。 也就是说，相对于入射波前将正交设置的所有特征相反地倾向于入射波前，称为复合倾翻的布置。 所公开的本发明的实施例产生焦平面阵列的复合倾斜，使得不存在位于入射波前的平面中的阵列的诸如台面边缘和侧壁的特征。 结果，仅观察到少量的散射光，并且光学特征显着降低。 本发明通过在两个主阵列轴上同时倾斜焦平面特征（光学和/或机械）而基本上消除了光学特征，而不降低检测组件的成像性能。

公开(公告)号：US08471206B1

公开(公告)日：2013-06-25

申请号：US12502883

申请日：2009-07-14

Applicant: Joseph Kostrzewa ,  Russell D. Granneman

Inventor： Joseph Kostrzewa ,  Russell D. Granneman

IPC: G01J5/46

CPC classification number: G01J5/045 ,  G01J5/0285 ,  G01J2005/0077

Abstract: Systems and methods are directed to determining the vacuum integrity within a vacuum package assembly containing an infrared detector, such as within an infrared imaging device. For example for an embodiment, a method of performing a vacuum pressure test on a vacuum package includes changing a first parameter value associated with an infrared detector within the vacuum package to vary a temperature of the infrared detector; measuring a second parameter value associated with the infrared detector based on the changing of the first parameter value; comparing the second parameter value to a threshold value; and determining a vacuum pressure condition of the vacuum package based on the comparing of the second parameter value to the threshold value.

Abstract translation: 系统和方法涉及在包含红外检测器（例如在红外成像装置内）的真空封装组件内确定真空完整性。 例如，对于实施例，对真空包装件进行真空压力测试的方法包括改变与真空包装内的红外检测器相关联的第一参数值以改变红外检测器的温度; 基于所述第一参数值的改变来测量与所述红外检测器相关联的第二参数值; 将所述第二参数值与阈值进行比较; 以及基于所述第二参数值与所述阈值的比较来确定所述真空组件的真空压力条件。

公开(公告)号：US5327005A

公开(公告)日：1994-07-05

申请号：US809819

申请日：1991-12-18

Applicant: Russell D. Granneman

Inventor： Russell D. Granneman

IPC: G01J1/02 ,  G01J1/42 ,  H01L27/14 ,  H01L31/0216 ,  H01L31/0352 ,  H01L31/10 ,  H01L31/103 ,  H01L31/00

CPC classification number: H01L31/1032 ,  H01L31/02161 ,  H01L31/035281 ,  Y02E10/50

Abstract: An IR detector array (10) wherein a metal contact pad (20) makes contact to an underlying radiation detector through one or more thin, electrically conductive stripes (20a). The striped pad contact shape is used in conjunction with a highly absorptive and opaque coating (18) that is interposed between a bottom surface of the contact pad and a top surface of the radiation detector. The highly absorptive coating serves to mask the bottom surface of the metal contact pad from any radiation that would impinge thereon and be reflected. As a result, stray or unabsorbed radiation reaching to a region of the contact pad encounters only the relatively small target presented by the edge of the one or more thin electrically conductive stripes. Furthermore, the one or more thin stripes are aligned with respect to a radiation scan axis and/or rotation axis so as to further minimize the width of the contact edge presented to the unabsorbed radiation, thereby further reducing the probability of an unwanted reflection occurring.

Abstract translation: 一种IR检测器阵列（10），其中金属接触焊盘（20）通过一个或多个细的导电条纹（20a）与下面的辐射检测器接触。 条形垫接触形状与介于接触垫的底表面和辐射探测器的顶表面之间的高吸收和不透明涂层（18）结合使用。 高吸收性涂层用于将金属接触垫的底表面从任何会在其上撞击并被反射的辐射掩蔽。 结果，到达接触焊盘区域的杂散或未被吸收的辐射仅遇到由一个或多个细导电条纹的边缘呈现的相对小的目标。 此外，一个或多个细条相对于辐射扫描轴线和/或旋转轴线对准，以便进一步减小呈现给未吸收辐射的接触边缘的宽度，从而进一步降低不希望的反射发生的可能性。