Abstract:
A memory controller includes an interleaving component configured to determine an access sequence of a plurality of memory units based on estimated execution times for the respective memory units to perform an operation, and a processor configured to access the memory units in the determined access sequence to perform the operation in an interleaved manner.
Abstract:
A semiconductor memory apparatus includes an address determination block configured to output an address as one of a row address and a column address according to an internal command; a row address decoding block configured to decode the row address and enable a word line; a column address decoding block configured to decode a partial column address of the column address and enable a column select signal; a data select signal generation block configured to enable a data select signal according to the row address and a remaining column address of the column address; and a data storage region configured to store or output data according to the word line, the column select signal and the data select signal.
Abstract:
The present technology relates to an electronic device. According to the present technology, a storage device having improved original data recovery capability may include a memory device including a plurality of memory cells, and configured to perform a read operation on data stored in the plurality of memory cells according to read mode information, and to output read data associated with the read operation and a memory controller configured to receive the read data, change the read mode information when error correction decoding for the read data fails, and control the memory device to perform the read operation again according to the changed read mode information. The read mode information may include information on a data interface between the memory device and the memory controller.
Abstract:
A controller, a memory system and an operating method thereof are disclosed. The operating method of a controller includes controlling a nonvolatile memory device to perform a first erase operation on invalidated memory blocks; allocating a target memory block for a write operation among the memory blocks on which the first erase operation is performed; controlling the nonvolatile memory device to perform an erase state verifying operation on the target memory block; and controlling the nonvolatile memory device to perform the write operation on the target memory block when the erase state verifying operation indicates that an erase state of the target memory block satisfies a set condition.
Abstract:
A semiconductor memory device includes a memory cell array, a peripheral circuit, a control logic, and a temperature sensor. The memory cell array includes a plurality of memory cells. The peripheral circuit performs an operation on the memory cell array. The control logic controls an operation of the peripheral circuit, and generates a ready-busy signal representing whether the operation of the peripheral circuit is completed. The temperature sensor measures a temperature of the semiconductor memory device. The control logic generates the ready-busy signal, based on the temperature.
Abstract:
A semiconductor apparatus may include a mode control circuit configured to output differential output signals which swing in a current mode logic (CML) area and a first control signal, in response to a power-down mode signal; a first circuit unit configured to be provided with the differential output signals, and operate in a power-down mode; and a second circuit unit configured to be provided with the differential output signals, and be interrupted in its operation in the power-down mode.
Abstract:
A memory system includes a memory device and a memory controller. The memory device includes a plurality of memory cells. The memory controller controls the memory device to perform a plurality of read operations on memory cells included in a selected physical page among the plurality of memory cells. The memory controller calculates an inverted bit number representing different bit values, based on a plurality of read data received from the memory device. The memory controller performs a read reclaim operation on the selected physical page, based on the inverted bit number.
Abstract:
An electronic system includes a memory controller and a memory. The memory controller generates a plurality of controller clocks having different phases from one another based on a reference clock signal. The memory generates a plurality of internal clocks having different phases from one another by receiving first and second clocks having a phase difference from each other, and outputs one of odd-ordered data and even-ordered data in synchronization with the plurality of internal clocks.
Abstract:
An electronic system includes a memory controller and a memory. The memory controller generates a plurality of controller clocks having different phases from one another based on a reference clock signal. The memory generates a plurality of internal clocks having different phases from one another by receiving first and second clocks having a phase difference from each other, and outputs one of odd-ordered data and even-ordered data in synchronization with the plurality of internal clocks.
Abstract:
A storage device having an improved operation speed includes a memory controller for controlling a memory device. The memory controller includes a parameter data generator for generating parameter data for changing a parameter value related to an operation of the memory device, and a parameter controller for outputting the parameter data. The parameter data includes an error protection field associated with the parameter value.