Variable resistance memory device

    公开(公告)号:US11239416B2

    公开(公告)日:2022-02-01

    申请号:US16691818

    申请日:2019-11-22

    IPC分类号: H01L45/00

    摘要: A variable resistance memory device includes a first conductive line extending in a first direction, a second conductive line extending in a second direction, the second direction intersecting the first direction on the first conductive line, a fixed resistance layer between the first conductive line and the second conductive line, and a variable resistance layer between the first conductive line and the second conductive line, wherein the fixed resistance layer and the variable resistance layer are electrically connected in parallel to each other between the first conductive line and the second conductive line.

    NON-VOLATILE MEMORY DEVICE AND OPERATION METHOD THEREOF

    公开(公告)号:US20200161328A1

    公开(公告)日:2020-05-21

    申请号:US16662299

    申请日:2019-10-24

    摘要: Provided is a non-volatile memory device including a control logic, a semiconductor layer, a resistance switching layer, a gate oxide layer, and a gate stack including a plurality of gates and a plurality of insulating layers, wherein the plurality of gates and the plurality of insulating layers are stacked alternately with each other. The resistance switching layer is provided between the semiconductor layer and the gate stack. The gate oxide layer is provided between the resistance switching layer and the gate stack. A cell string including a plurality of memory cells is formed by the gate stack, the resistance switching layer, and the gate oxide layer.