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1.
公开(公告)号:US20230384667A1
公开(公告)日:2023-11-30
申请号:US18155545
申请日:2023-01-17
Applicant: Samsung SDI Co., Ltd.
Inventor: Seol Hee LIM , Jaebum LIM , Yaeun SEO , Sumin JANG , Soobin LIM , Minyoung LEE , Jimin KIM , Jaeyeol BAEK , Eunmi KANG , Changsoo WOO
IPC: G03F7/004 , C07F7/22 , H01L21/027 , H01L21/308 , H01L21/311 , H01L21/3213
CPC classification number: G03F7/0042 , C07F7/2224 , H01L21/0271 , H01L21/3081 , H01L21/31144 , H01L21/32139
Abstract: A semiconductor photoresist composition including an organometallic compound represented by Chemical Formula 1 and a solvent and a method of forming patterns using the same are disclosed.
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2.
公开(公告)号:US20210179519A1
公开(公告)日:2021-06-17
申请号:US17117324
申请日:2020-12-10
Applicant: SAMSUNG SDI CO., LTD.
Inventor: Jaebum LIM
IPC: C07C15/14 , C01B32/184 , C07F5/05 , G03F7/11 , G03F7/09
Abstract: A compound, a synthesis method of the compound, a hardmask composition including the compound, and a method of forming patterns using the hardmask composition, the compound including a condensed or non-condensed polycyclic aromatic core having 40 or more carbon atoms and a plurality of substituents at a periphery of the core, wherein the plurality of substituents are each independently a substituted or unsubstituted C3 to C20 branched alkyl group, a C6 to C30 aryl group substituted with a substituted or unsubstituted C3 to C20 branched alkyl group, a C3 to C30 cycloalkyl group substituted with a substituted or unsubstituted C3 to C20 branched alkyl group, a C3 to C30 heterocyclic group substituted with a substituted or unsubstituted C3 to C20 branched alkyl group, or a combination thereof.
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公开(公告)号:US20190233576A1
公开(公告)日:2019-08-01
申请号:US16339451
申请日:2017-07-21
Applicant: SAMSUNG SDI CO., LTD.
Inventor: Hyeonil JUNG , Sunghwan KIM , Seunghyun KIM , Yushin PARK , Jaebum LIM
IPC: C08G61/12 , H01L21/033 , H01L21/027 , H01L21/02 , C08G61/10 , G03F7/16 , G03F7/20 , G03F7/26 , C09D165/00
CPC classification number: C08G61/124 , C08G61/02 , C08G61/10 , C08G61/12 , C08G2261/11 , C08G2261/1414 , C08G2261/1422 , C08G2261/148 , C08G2261/228 , C08G2261/314 , C08G2261/3241 , C09D165/00 , G03F7/00 , G03F7/09 , G03F7/162 , G03F7/168 , G03F7/20 , G03F7/26 , H01L21/02118 , H01L21/02282 , H01L21/027 , H01L21/0276 , H01L21/033 , H01L21/0332 , H01L21/3081 , H01L21/31144 , H01L21/32139
Abstract: Disclosed are a polymer including a structural unit represented by Chemical Formula 1 and a structural unit represented by Chemical Formula 2, an organic layer composition including the polymer, and a method of forming patterns using the organic layer composition. The Chemical Formulae 1 and 2 are the same as defined in the specification.
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公开(公告)号:US20220334489A1
公开(公告)日:2022-10-20
申请号:US17642734
申请日:2020-06-03
Applicant: SAMSUNG SDI CO., LTD.
Inventor: Jaebum LIM
IPC: G03F7/20 , G03F7/004 , G03F7/11 , C07D403/10 , C07C43/285
Abstract: The present invention relates to a hardmask composition including a compound represented by Chemical Formula 1 and a solvent, a hardmask layer including a cured product of the hardmask composition, and a pattern forming method using the hardmask composition. In Chemical Formula 1, the definitions of A, R1 to R5, and n are as described in the specification.
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公开(公告)号:US20200017678A1
公开(公告)日:2020-01-16
申请号:US16455942
申请日:2019-06-28
Applicant: SAMSUNG SDI CO., LTD.
Inventor: Jaebum LIM , Sunyoung YANG , Sunghwan KIM , Seunghyun KIM , Yushin PARK
IPC: C08L65/02 , H01L21/027 , H01L21/3213 , G03F7/11
Abstract: A hardmask composition, a hardmask layer, and a method of forming patterns, the composition including a solvent; and a polymer that includes a substituted biphenylene structural unit, wherein one phenylene of the biphenylene of the substituted biphenylene structural unit is substituted with at least one of a hydroxy-substituted C6 to C30 aryl group, and a hydroxy-substituted C3 to C30 heteroaryl group.
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