摘要:
A semiconductor memory cell array includes a plurality of bit-lines, a plurality of word-lines, a plurality of memory cells, a plurality of dummy memory cells, a plurality of dummy bit-lines, and a plurality of dummy word-lines. The dummy bit-lines are in outer regions of the bit-lines. The dummy word-lines are in outer regions of the word-lines. The dummy bit-lines are maintained in a floating state. The dummy word-lines retain a turn-off voltage.
摘要:
A semiconductor memory cell array includes a plurality of bit-lines, a plurality of word-lines, a plurality of memory cells, a plurality of dummy memory cells, a plurality of dummy bit-lines, and a plurality of dummy word-lines. The dummy bit-lines are in outer regions of the bit-lines. The dummy word-lines are in outer regions of the word-lines. The dummy bit-lines are maintained in a floating state. The dummy word-lines retain a turn-off voltage.
摘要:
A high-speed double or quadrature data rate interface semiconductor device and a method thereof are provided. A transmitter (e.g., a data transmitting semiconductor device) for high-speed data transmission transmits a first strobe signal and a second strobe signal, which have a phase difference of 90 degrees there-between, a first group (byte of) data, and a second group (byte of) data. The transmitter adjusts the phase of at least one of the first and second strobe signals based on phase-error information fed back from a receiver and then transmits the phase-adjusted strobe signal to the receiver. The receiver receives the first and second strobe signals from the transmitter and receives the first group (byte of) data and the second group (byte of) data using the first and second strobe signals. The receiver does not require a phase-locked loop (PLL) or a delay-locked loop (DLL), thereby decreasing the circuit area and power consumption of the receiver. In addition, since source synchronization is realized using a strobe signal, phase noise can be efficiently removed.
摘要:
An antifuse circuit includes a protection circuit. The antifuse circuit receives a program voltage using a non-connection (NC) pin or ball of a semiconductor device. The protection circuit prevents an unintended voltage lower than the program voltage from being applied to the antifuse circuit.
摘要:
An antifuse circuit includes a protection circuit. The antifuse circuit receives a program voltage using a non-connection (NC) pin or ball of a semiconductor device. The protection circuit prevents an unintended voltage lower than the program voltage from being applied to the antifuse circuit.
摘要:
A high-speed double or quadrature data rate interface semiconductor device and a method thereof are provided. A transmitter (e.g., a data transmitting semiconductor device) for high-speed data transmission transmits a first strobe signal and a second strobe signal, which have a phase difference of 90 degrees there-between, a first group (byte of) data, and a second group (byte of) data. The transmitter adjusts the phase of at least one of the first and second strobe signals based on phase-error information fed back from a receiver and then transmits the phase-adjusted strobe signal to the receiver. The receiver receives the first and second strobe signals from the transmitter and receives the first group (byte of) data and the second group (byte of) data using the first and second strobe signals. The receiver does not require a phase-locked loop (PLL) or a delay-locked loop (DLL), thereby decreasing the circuit area and power consumption of the receiver. In addition, since source synchronization is realized using a strobe signal, phase noise can be efficiently removed.
摘要:
A semiconductor memory cell array includes a plurality of bit-lines, a plurality of word-lines, a plurality of memory cells, a plurality of dummy memory cells, a plurality of dummy bit-lines, and a plurality of dummy word-lines. The dummy bit-lines are in outer regions of the bit-lines. The dummy word-lines are in outer regions of the word-lines. The dummy bit-lines are maintained in a floating state. The dummy word-lines retain a turn-off voltage
摘要:
A semiconductor memory device includes a memory cell array in which a plurality of memory cells are arranged. The semiconductor memory device includes an error correcting code (ECC) circuit configured to generate parity data based on main data, write a codeword including the main data and the parity data in the memory cell array, read the codeword from a selected memory cell row to generate syndromes, and correct errors in the read codeword on a per symbol basis based on the syndromes. The main data includes first data of a first memory cell of the selected memory cell row and second data of a second memory cell of the selected memory cell row. The first data and the second data are assigned to one symbol of a plurality of symbols, and the first memory cell and the second memory cell are adjacent to each other in the memory cell array.
摘要:
Provided are an anti-fuse, an anti-fuse circuit, and a method of fabricating the anti-fuse. The anti-fuse includes a semiconductor substrate, an isolation region, a channel diffusion region, a gate oxide layer, and a gate electrode. The semiconductor substrate includes a top surface and a bottom portion, the bottom portion of the semiconductor substrate having a first conductivity type. The isolation region is disposed inward from the top surface of the semiconductor substrate to a first depth. The channel diffusion region is disposed inward from the top surface of the semiconductor substrate to a second depth, the second depth located at a depth where the channel diffusion region meets an upper boundary of the bottom portion of the semiconductor substrate. The channel diffusion region is surrounded by the isolation region, the first depth is a greater distance from the top surface of the semiconductor substrate than the second depth, and the channel diffusion region has a second conductivity type opposite to the first conductivity type. The gate oxide layer is disposed on the channel diffusion region, and the gate electrode is disposed on the gate oxide layer to cover a top surface of the gate oxide layer.
摘要:
A memory device includes a clock receiving block, a data transceiver block, a phase detection block, and a phase information transmitter. The clock receiving block is configured to receive a clock signal from a memory controller through a clock signal line and generate a data sampling clock signal and an edge sampling clock signal. The data transceiver block is configured to receive a data signal from the memory controller through a data signal line. The phase detection block is configured to generate phase information in response to the data sampling clock signal, the edge sampling clock signal and the data signal. The phase information transmitter is configured to transmit the phase information to the memory controller through a phase information signal line that is separate from the data signal line.