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公开(公告)号：US20120134203A1
公开(公告)日：2012-05-31
申请号：US13300139
申请日：2011-11-18
申请人： Seiji Miura , Satoru Hanzawa
发明人： Seiji Miura , Satoru Hanzawa
CPC分类号： G11C13/0007 , G11C8/08 , G11C8/18 , G11C13/0004 , G11C13/004 , G11C13/0061 , G11C13/0069 , G11C13/0097 , G11C2013/0088 , G11C2211/5623
摘要： In a phase change memory, when M bit (8 bits=1 byte) data is written, erase operation and program operation are performed in units of n bit (M>n) data. Further, when M bit data is written, program operation is performed in units of the n bit (M>n) data. Further, when M bit data is read from the memory cell, read operation is performed in units of the n bit (M>n) data. For example, when the data is written into to the phase change memory, the data is not overwritten but program is performed after once erasing the target memory cell. The data size for erasure and the data size for program are made equal. Erase and program operation are performed only for the demanded data size.
摘要翻译： 在相变存储器中，当写入M位（8位= 1字节）数据时，以n位（M> n）数据为单位执行擦除操作和编程操作。 此外，当写入M位数据时，以n位（M> n）数据为单位执行编程操作。 此外，当从存储单元读取M位数据时，以n位（M> n）数据为单位执行读操作。 例如，当数据被写入相变存储器时，数据不被重写，而是在擦除目标存储单元之后执行程序。 擦除的数据大小和程序的数据大小相等。 擦除和编程操作仅针对所需的数据大小执行。
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公开(公告)号：US08773919B2
公开(公告)日：2014-07-08
申请号：US13300139
申请日：2011-11-18
申请人： Seiji Miura , Satoru Hanzawa
发明人： Seiji Miura , Satoru Hanzawa
CPC分类号： G11C13/0007 , G11C8/08 , G11C8/18 , G11C13/0004 , G11C13/004 , G11C13/0061 , G11C13/0069 , G11C13/0097 , G11C2013/0088 , G11C2211/5623
摘要： In a phase change memory, when M bit (8 bits=1 byte) data is written, erase operation and program operation are performed in units of n bit (M>n) data. Further, when M bit data is written, program operation is performed in units of the n bit (M>n) data. Further, when M bit data is read from the memory cell, read operation is performed in units of the n bit (M>n) data. For example, when the data is written into to the phase change memory, the data is not overwritten but program is performed after once erasing the target memory cell. The data size for erasure and the data size for program are made equal. Erase and program operation are performed only for the demanded data size.
摘要翻译： 在相变存储器中，当写入M位（8位= 1字节）数据时，以n位（M> n）数据为单位执行擦除操作和编程操作。 此外，当写入M位数据时，以n位（M> n）数据为单位执行编程操作。 此外，当从存储单元读取M位数据时，以n位（M> n）数据为单位执行读操作。 例如，当数据被写入相变存储器时，数据不被重写，而是在擦除目标存储单元之后执行程序。 擦除的数据大小和程序的数据大小相等。 擦除和编程操作仅针对所需的数据大小执行。
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公开(公告)号：US08711637B2
公开(公告)日：2014-04-29
申请号：US13300139
申请日：2011-11-18
申请人： Seiji Miura , Satoru Hanzawa
发明人： Seiji Miura , Satoru Hanzawa
IPC分类号： G11C7/00
摘要： In a phase change memory, when M bit (8 bits=1 byte) data is written, erase operation and program operation are performed in units of n bit (M>n) data. Further, when M bit data is written, program operation is performed in units of the n bit (M>n) data. Further, when M bit data is read from the memory cell, read operation is performed in units of the n bit (M>n) data. For example, when the data is written into to the phase change memory, the data is not overwritten but program is performed after once erasing the target memory cell. The data size for erasure and the data size for program are made equal. Erase and program operation are performed only for the demanded data size.
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公开(公告)号：US08132063B2
公开(公告)日：2012-03-06
申请号：US13191442
申请日：2011-07-26
申请人： Motoyasu Terao , Satoru Hanzawa , Hitoshi Kume , Minoru Ogushi , Yoshitaka Sasago , Masaharu Kinoshita , Norikatsu Takaura
发明人： Motoyasu Terao , Satoru Hanzawa , Hitoshi Kume , Minoru Ogushi , Yoshitaka Sasago , Masaharu Kinoshita , Norikatsu Takaura
IPC分类号： G11C29/00
CPC分类号： G11C13/0064 , G11C13/0004 , G11C13/004 , G11C13/0069 , G11C29/028 , G11C29/50 , G11C29/50008 , G11C2013/0054 , G11C2213/72
摘要： To realize a fast and highly reliable phase-change memory system of low power consumption, a semiconductor device includes: a memory device which includes a first memory array having a first area including a plurality of first memory cells and a second area including a plurality of second memory cells; a controller coupled to the memory device to issue a command to the memory device; and a condition table for storing a plurality of trial writing conditions. The controller performs trial writing in the plurality of second memory cells a plurality of times based on the plurality of trial writing conditions stored in the condition table, and determines writing conditions in the plurality of first memory cells based on a result of the trial writing. The memory device performs writing in the plurality of first memory cells based on the writing conditions instructed from the controller.
摘要翻译： 为了实现低功耗的快速且高度可靠的相变存储器系统，半导体器件包括：存储器件，其包括具有包括多个第一存储器单元的第一区域的第一存储器阵列和包括多个第一存储器单元的第二区域 第二存储单元; 控制器，其耦合到所述存储器设备以向所述存储器设备发出命令; 以及用于存储多个试写条件的条件表。 控制器基于存储在条件表中的多个试写条件，在多个第二存储单元中执行多次尝试写入，并且基于试写的结果来确定多个第一存储单元中的写入条件。 存储器件基于从控制器指示的写入条件在多个第一存储器单元中执行写入。
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公开(公告)号：US07885102B2
公开(公告)日：2011-02-08
申请号：US12377271
申请日：2006-09-15
申请人： Satoru Hanzawa , Yoshikazu Iida
发明人： Satoru Hanzawa , Yoshikazu Iida
IPC分类号： G11C11/00
CPC分类号： G11C13/0069 , G11C13/0004 , G11C13/004 , G11C2213/79
摘要： In a memory array MCA which includes memory cells MC each having a variable-resistance-based memory device RQ and a select transistor MQ, an object is to receive a fixed quantity of storage data for a short time, and to realize writing operation to the memory cell, with suppressed peak current. In order to achieve the object, the data bus occupation time in rewriting operation is shortened by using plural sense amplifiers and storing storage data temporarily, and plural programming circuits are provided and activated using the control signals with different phases. By the above, the phase change memory system with low current consumption can be realized, without causing degradation of the utilization ratio of the data bus.
摘要翻译： 在包括具有可变电阻的存储器件RQ和选择晶体管MQ的存储单元MC的存储器阵列MCA中，目的是在短时间内接收固定量的存储数据，并且实现对 存储单元，具有抑制的峰值电流。 为了实现该目的，通过使用多个读出放大器和临时存储存储数据来缩短重写操作中的数据总线占用时间，并且使用具有不同相位的控制信号来提供和激活多个编程电路。 通过上述，可以实现具有低电流消耗的相变存储器系统，而不会降低数据总线的利用率。
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公开(公告)号：US07619911B2
公开(公告)日：2009-11-17
申请号：US10579911
申请日：2003-11-21
申请人： Satoru Hanzawa , Junji Shigeta , Shinichiro Kimura , Takeshi Sakata , Riichiro Takemura , Kazuhiko Kajigaya
发明人： Satoru Hanzawa , Junji Shigeta , Shinichiro Kimura , Takeshi Sakata , Riichiro Takemura , Kazuhiko Kajigaya
IPC分类号： G11C15/00
CPC分类号： G11C15/04 , G11C15/043
摘要： In a memory array structured of memory cells using a storage circuit STC and a comparator CP, either one electrode of a source electrode or a drain electrode of a transistor, whose gate electrode is connected to a search line, of a plurality of transistors structuring the comparator CP is connected to a match line HMLr precharged to a high voltage. Further, a match detector MDr is arranged on a match line LMLr precharged to a low voltage to discriminate a comparison signal voltage generated at the match line according to the comparison result of data. According to such memory array structure and operation, comparison operation can be performed at low power and at high speed while influence of search-line noise is avoided in a match line pair. Therefore, a low power content addressable memory which allows search operation at high speed can be realized.
摘要翻译： 在使用存储电路STC和比较器CP的存储器单元构成的存储器阵列中，将栅电极连接到搜索线的晶体管的源电极或漏电极的一个电极，构成 比较器CP连接到预充电到高电压的匹配线HMLr。 此外，匹配检测器MDr布置在预充电到低电压的匹配线LMLr上，以根据数据的比较结果来识别在匹配线处产生的比较信号电压。 根据这种存储器阵列结构和操作，可以在低功率和高速度下执行比较操作，同时在匹配线对中避免搜索线噪声的影响。 因此，可以实现允许高速搜索操作的低功率内容可寻址存储器。
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公开(公告)号：US07505299B2
公开(公告)日：2009-03-17
申请号：US11976531
申请日：2007-10-25
CPC分类号： G11C11/405 , G11C11/4097 , H01L27/0207 , H01L27/108 , H01L27/10814 , H01L27/10873
摘要： A semiconductor memory device that can achieve high-speed operation or that is highly integrated and simultaneously can achieve high-speed operation is provided. Transistors are disposed on both sides of diffusion layer regions to which capacitor for storing information is connected and other diffusion layer region of each transistor is connected to the same bit line. When access to a memory cell is made, two transistors are activated and the information is read. When writing operation to the memory cell is carried out, two transistors are used and electric charges are written to the capacitor.
摘要翻译： 提供了可以实现高速操作或高度集成并同时实现高速操作的半导体存储器件。 晶体管设置在扩散层区域的两侧，用于存储信息的电容器被连接到，并且每个晶体管的其它扩散层区域连接到相同的位线。 当访问存储器单元时，两个晶体管被激活并且读取该信息。 当对存储单元进行写操作时，使用两个晶体管，并将电荷写入电容器。
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公开(公告)号：US07505296B2
公开(公告)日：2009-03-17
申请号：US11877310
申请日：2007-10-23
IPC分类号： G11C15/00
CPC分类号： G11C15/04 , G11C15/043
摘要： The range-specified IP addresses are effectively stored to reduce the number of necessary entries thereby the memory capacity of TCAM is improved. The representative means of the present invention is that: the storage information (entry) and the input information (comparison information or search key) are the common block code such that any bit must be the logical value ‘1’; Match-lines are hierarchically structured and memory cells are arranged at the intersecting points of a plurality of sub-match lines and a plurality of search lines; Further the sub-match lines are connected to main-match lines through the sub-match detectors, respectively and main-match detectors are arranged on the main-match lines.
摘要翻译： 有效存储范围指定的IP地址，以减少必要条目的数量，从而提高TCAM的存储容量。 本发明的代表性手段是：存储信息（条目）和输入信息（比较信息或搜索关键字）是公共块码，使得任何位必须是逻辑值“1”; 匹配线是分层结构的，并且存储器单元被布置在多个子匹配线和多条搜索线的交叉点处; 此外，子匹配线分别通过子匹配检测器连接到主匹配线，并且主匹配检测器被布置在主匹配线上。
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公开(公告)号：US20060158924A1
公开(公告)日：2006-07-20
申请号：US11280170
申请日：2005-11-17
IPC分类号： G11C11/24
CPC分类号： G11C11/4094 , G11C7/12 , G11C7/18 , G11C11/4074 , G11C11/4097 , G11C2211/4013 , H01L27/0207 , H01L27/10882
摘要： A write command is inputted from an outside, voltages of bit lines become VDL and VSS, and a voltage in accordance with a threshold voltage (LVT: low threshold voltage, MVT: mid threshold voltage, HVT: high threshold voltage) of a memory cell transistor is written into a storage node of a capacitor via the memory cell transistor. Thereafter, when a plate line connected to a plate side of the capacitor is driven from voltage VPL to voltage VPH and the voltage of the storage node is increased due to coupling, the voltage VDL of the bit line is reduced to the voltage VDP, and the voltage excessively written into the storage node is reduced in accordance with a level of a threshold voltage of the memory cell transistor, thereby reducing a variation in the voltage of the storage node due to a variation in the threshold voltage.
摘要翻译： 从外部输入写命令，位线的电压变为VDL和VSS，以及根据存储单元的阈值电压（LVT：低阈值电压，MVT：中间阈值电压，HVT：高阈值电压）的电压 晶体管经由存储单元晶体管写入电容器的存储节点。 此后，当连接到电容器的板侧的板线从电压VPL驱动到电压VPH并且存储节点的电压由于耦合而增加时，位线的电压VDL被降低到电压VDP，并且 根据存储单元晶体管的阈值电压的电平降低过度写入存储节点的电压，从而减小由于阈值电压的变化引起的存储节点的电压的变化。
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公开(公告)号：US06946704B2
公开(公告)日：2005-09-20
申请号：US10808510
申请日：2004-03-25
CPC分类号： H01L27/2454 , G11C13/0004 , G11C2213/79 , H01L27/2463 , H01L45/06 , H01L45/1233 , H01L45/144
摘要： A semiconductor memory cell and forming method thereof utilizes a vertical select transistor to eliminate the problem of a large cell surface area in memory cells of the related art utilizing phase changes. A memory cell with a smaller surface area than the DRAM device of the related art is achieved by the present invention. Besides low power consumption during read operation, the invention also provides phase change memory having low power consumption even during write operation. Phase change memory also has stable read-out operation.
摘要翻译： 半导体存储单元及其形成方法利用垂直选择晶体管来消除利用相位变化的现有技术的存储单元中的大的单元表面积的问题。 通过本发明实现了具有比现有技术的DRAM器件更小的表面积的存储单元。 除了读取操作中的低功耗之外，本发明还提供即使在写入操作期间具有低功耗的相变存储器。 相变存储器也具有稳定的读出操作。
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