Sense amplifier method and arrangement
    4.
    发明授权
    Sense amplifier method and arrangement 有权
    感应放大器的方法和布置

    公开(公告)号:US07532528B2

    公开(公告)日:2009-05-12

    申请号:US11772151

    申请日:2007-06-30

    IPC分类号: G11C7/00

    摘要: A memory system having a selectable configuration for sense amplifiers is included. The memory system can include bit cells and a switch module coupled to the bit cell and to a first portion of a sense amplifier. The switch module can connect, disconnect or cross couple the bit cell to the sense amplifier based on a test for the input offset voltage of first portion of the sense amplifier. A similar configuration can be implemented by a second portion of the sense amplifier. The system can also include a programmer module to configure a setting of the switch module and can include a column select module to couple the bit cells to the sense amplifiers based on what column of bit cell is to be read. Other embodiments are also disclosed.

    摘要翻译: 包括具有用于读出放大器的可选配置的存储器系统。 存储器系统可以包括位单元和耦合到位单元和读出放大器的第一部分的开关模块。 开关模块可以基于对读出放大器的第一部分的输入偏移电压的测试来连接,断开或将该位单元交叉耦合到读出放大器。 类似的配置可以由读出放大器的第二部分来实现。 该系统还可以包括用于配置开关模块的设置的编程器模块,并且可以包括列选择模块,以便基于要读取的位单元的列来将位单元耦合到读出放大器。 还公开了其他实施例。

    Signal measurement systems and methods
    6.
    发明授权
    Signal measurement systems and methods 有权
    信号测量系统和方法

    公开(公告)号:US07262632B2

    公开(公告)日:2007-08-28

    申请号:US11095951

    申请日:2005-03-31

    IPC分类号: H03K19/173 G06F7/38

    摘要: Systems and methods are disclosed for measuring signals on an integrated circuit die. In one embodiment, a reference signal is distributed to die locations proximal to the signals to be measured. The reference signal is transmitted over transport paths coupling each of the signals to be measured to the die output. The signals to be measured are transmitted over their respective transport paths and measured at the die output. The relative delay between the signals can be calculated using the reference signal measurements.

    摘要翻译: 公开了用于测量集成电路管芯上的信号的系统和方法。 在一个实施例中,将参考信号分布到靠近待测信号的位置的模具位置。 参考信号通过将要测量的每个信号耦合到管芯输出的传输路径传输。 要测量的信号通过其各自的传输路径传输并在管芯输出端测量。 可以使用参考信号测量来计算信号之间的相对延迟。