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公开(公告)号:US20160093558A1
公开(公告)日:2016-03-31
申请号:US14848975
申请日:2015-09-09
Applicant: Texas Instruments Incorporated
Inventor: BENJAMIN STASSEN COOK , JUAN ALEJANDRO HERBSOMMER , YONG LIN , RONGWEI ZHANG , ABRAM CASTRO , MATTHEW DAVID ROMIG
IPC: H01L23/495 , H01L23/498 , H01L23/00 , H01L21/48 , H01L21/288
CPC classification number: H01L23/4952 , H01L21/2885 , H01L21/4821 , H01L21/4825 , H01L21/4867 , H01L23/49513 , H01L23/49541 , H01L23/49572 , H01L23/49582 , H01L23/49586 , H01L23/49822 , H01L23/49838 , H01L23/49883 , H01L24/05 , H01L24/32 , H01L24/48 , H01L24/49 , H01L24/73 , H01L24/83 , H01L24/85 , H01L24/92 , H01L25/0657 , H01L25/50 , H01L2224/04042 , H01L2224/0612 , H01L2224/16245 , H01L2224/2919 , H01L2224/32225 , H01L2224/32245 , H01L2224/48227 , H01L2224/48247 , H01L2224/48464 , H01L2224/73265 , H01L2224/75 , H01L2224/83192 , H01L2224/92247 , H01L2225/0651 , H01L2225/06555 , H01L2924/00014 , H01L2924/13055 , H01L2924/14 , H01L2924/1511 , H01L2924/1711 , H01L2924/181 , H01L2924/00 , H01L2924/00012 , H01L2224/45099 , H01L2224/45015 , H01L2924/207 , H01L2924/0665
Abstract: A method of lead frame surface modification includes providing at least one pre-fabricated metal lead frame or package substrate (substrate) unit including a base metal having a die pad and a plurality of contact regions surrounding the die pad. An ink including a material that is a solid or a precursor for a solid that forms a solid upon a curing step or a sintering step that removes a liquid carrier is additively deposited including onto at least one of (i) a region of the die pad and (ii) at one region of at least a first of the contact regions (first contact region). The ink is sintered or cured to remove the liquid carrier so that a substantially solid ink residue remains.
Abstract translation: 引线框架表面改性的方法包括提供至少一个预制金属引线框架或封装基板(基板)单元,其包括具有管芯焊盘和围绕管芯焊盘的多个接触区域的母材。 包括在固化步骤上形成固体的固体的材料或去除液体载体的烧结步骤的材料的油墨被加成沉积,其包括至少一个(i)芯片垫的区域 和(ii)在至少第一接触区域(第一接触区域)的一个区域。 油墨被烧结或固化以除去液体载体,使得残留基本上固体的油墨残余物。
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公开(公告)号:US20170271174A1
公开(公告)日:2017-09-21
申请号:US15614819
申请日:2017-06-06
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: YONG LIN , RONGWEI ZHANG , BENJAMIN STASSEN COOK , ABRAM CASTRO
IPC: H01L21/50 , H01L23/495 , H01L23/00
CPC classification number: H01L21/50 , H01L23/12 , H01L23/13 , H01L23/14 , H01L23/15 , H01L23/3107 , H01L23/3142 , H01L23/49513 , H01L23/49548 , H01L23/49582 , H01L24/29 , H01L24/32 , H01L24/45 , H01L24/48 , H01L24/83 , H01L24/85 , H01L2021/60277 , H01L2224/29116 , H01L2224/2919 , H01L2224/296 , H01L2224/32245 , H01L2224/45116 , H01L2224/45616 , H01L2224/48091 , H01L2224/48247 , H01L2224/48816 , H01L2224/48996 , H01L2224/49171 , H01L2224/73265 , H01L2224/80856 , H01L2224/83192 , H01L2224/8392 , H01L2224/83951 , H01L2224/8502 , H01L2224/85051 , H01L2224/92247 , H01L2924/00014 , H01L2924/14 , H01L2924/3511 , H01L2924/35121 , H01L2224/45099 , H01L2924/0665 , H01L2924/00
Abstract: A method includes applying a die attach material to a die pad of an integrated circuit. The die attach material is employed as a bonding material to the die pad. The method includes mounting an integrated circuit die to the die pad of the integrated circuit via the die attach material. The method includes printing an adhesion deposition material on the die attach material appearing at the interface of the integrated circuit die and the die pad of the integrated circuit to mitigate delamination between the integrated circuit die and the die pad.
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公开(公告)号:US20170194170A1
公开(公告)日:2017-07-06
申请号:US14985034
申请日:2015-12-30
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: YONG LIN , RONGWEI ZHANG , BENJAMIN STASSEN COOK , ABRAM CASTRO
IPC: H01L21/50 , H01L23/495 , H01L23/00
Abstract: A method includes applying a die attach material to a die pad of an integrated circuit. The die attach material is employed as a bonding material to the die pad. The method includes mounting an integrated circuit die to the die pad of the integrated circuit via the die attach material. The method includes printing an adhesion deposition material on the die attach material appearing at the interface of the integrated circuit die and the die pad of the integrated circuit to mitigate delamination between the integrated circuit die and the die pad.
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