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公开(公告)号:US10985141B2
公开(公告)日:2021-04-20
申请号:US16726752
申请日:2019-12-24
Applicant: TOSHIBA MEMORY CORPORATION
Inventor: Masaru Koyanagi
IPC: H01L25/065 , H03K99/00 , G11C5/06 , G11C8/12 , H01L23/00 , G11C29/00 , G06F3/06 , G11C16/08 , H01L23/48 , H01L23/50 , G11C16/04
Abstract: A semiconductor device includes first, second and third stacked chips with a first, second and third substrate, respectively, at least three first, second and third logical circuits, respectively, and at least two first, second and third vias, respectively, and a fourth chip stacked on the third chip having a fourth substrate, and at least three fourth logical circuits. First and second ones of the first to third logical circuits of the first to fourth chips are each configured to perform a first and second logical operation, respectively, on a first and second address input signal, respectively, received at the respective chip to thereby output a first and second address output signal, respectively. Third ones are each configured to activate the respective chip based on at least the second address output signal transmitted within the respective chip.
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公开(公告)号:US10811393B2
公开(公告)日:2020-10-20
申请号:US16298576
申请日:2019-03-11
Applicant: Toshiba Memory Corporation
Inventor: Mikihiko Ito , Masaru Koyanagi , Masafumi Nakatani , Shinya Okuno , Shigeki Nagasaka , Masahiro Yoshihara , Akira Umezawa , Satoshi Tsukiyama , Kazushige Kawasaki
IPC: G11C16/30 , H01L25/065 , G11C16/10 , G11C16/14 , G11C16/32 , G11C16/26 , H01L27/10 , G11C16/08 , G11C16/12 , G11C16/34 , G11C16/04
Abstract: According to one embodiment, a memory device includes: a first chip including a first circuit, first and second terminals; a second chip including a second circuit and a third terminal; and an interface chip including first and second voltage generators. The first chip is between the second chip and the interface chip. The first terminal is connected between the first circuit and the first voltage generator. A third end of the second terminal is connected to the third terminal and a fourth end of the second terminal is connected to the second voltage generator. A fifth end of the third terminal is connected to the second circuit and a sixth end of the third terminal is connected to the second voltage generator via the second terminal. The third end overlaps with the sixth end, without overlapping with the fourth end.
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公开(公告)号:USRE47355E1
公开(公告)日:2019-04-16
申请号:US15649125
申请日:2017-07-13
Applicant: TOSHIBA MEMORY CORPORATION
Inventor: Dai Nakamura , Hiroyuki Kutsukake , Kenji Gomikawa , Takeshi Shimane , Mitsuhiro Noguchi , Koji Hosono , Masaru Koyanagi , Takashi Aoi
Abstract: A non-volatile semiconductor storage device includes: a memory cell array having memory cells arranged therein, the memory cells storing data in a non-volatile manner; and a plurality of transfer transistors transferring a voltage to the memory cells, the voltage to be supplied for data read, write and erase operations with respect to the memory cells. Each of the transfer transistors includes: a gate electrode formed on a semiconductor substrate via a gate insulation film; and diffusion layers formed to sandwich the gate electrode therebetween and functioning as drain/source layers. Upper layer wirings are provided above the diffusion layers and provided with a predetermined voltage to prevent depletion of the diffusion layers at least when the transfer transistors become conductive.
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公开(公告)号:US10186487B2
公开(公告)日:2019-01-22
申请号:US15688848
申请日:2017-08-28
Applicant: Toshiba Memory Corporation
Inventor: Kazushige Kawasaki , Mikihiko Ito , Masaru Koyanagi
IPC: H01L23/538 , H01L25/065 , H01L23/498
Abstract: A semiconductor device includes a first chip having a through via, a second chip having a first terminal that is electrically connected to the through via, and a substrate having a second terminal disposed on a first surface thereof and electrically connected to the first terminal. When viewed along a straight line that intersects a center axis that is perpendicular to the first surface and intersects a center point of the substrate, the first terminal is disposed further towards the center axis than the second terminal and the through via is disposed further towards the center axis than the first terminal.
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公开(公告)号:US10157894B2
公开(公告)日:2018-12-18
申请号:US15819468
申请日:2017-11-21
Applicant: TOSHIBA MEMORY CORPORATION
Inventor: Masaru Koyanagi
IPC: H01L25/07 , H01L25/065 , H03K99/00 , G06F3/06 , G11C5/06 , G11C8/12 , G11C29/00 , G11C16/08 , H01L23/48 , H01L23/50 , G11C16/04 , H01L23/00
Abstract: A semiconductor device includes a first chip having a first via and a second via through the first chip; and a second chip provided on the first chip and having a third via and a fourth via through the second chip. The first chip includes: a first logical operation circuit configured to perform a first logical operation (NOT) on a first address input signal to output a first address output signal to the second chip through the first via; a second logical operation circuit connected to the first logical operation circuit, the second logical operation circuit being configured to perform a second logical operation (XOR) on a second address input signal and the first address output signal to output a second address output signal to the second chip through the second via; and a first activation circuit connected to the second logical operation circuit, the first activation circuit being configured to activate the first chip based on at least the second address output signal.
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公开(公告)号:US09853013B2
公开(公告)日:2017-12-26
申请号:US15232391
申请日:2016-08-09
Applicant: TOSHIBA MEMORY CORPORATION
Inventor: Masaru Koyanagi
IPC: H01L25/065 , H03K99/00 , G06F3/06 , G11C5/06 , G11C8/12 , G11C29/00 , G11C16/08 , H01L23/48 , H01L23/50 , G11C16/04 , H01L23/00
CPC classification number: H01L25/0657 , G06F3/0688 , G11C5/063 , G11C8/12 , G11C16/0483 , G11C16/08 , G11C29/88 , H01L23/481 , H01L23/50 , H01L24/16 , H01L24/32 , H01L24/48 , H01L24/73 , H01L2224/0401 , H01L2224/04042 , H01L2224/05552 , H01L2224/0557 , H01L2224/16145 , H01L2224/16225 , H01L2224/32145 , H01L2224/32225 , H01L2224/48091 , H01L2224/48106 , H01L2224/48227 , H01L2224/73204 , H01L2224/73207 , H01L2224/73257 , H01L2224/73265 , H01L2225/0651 , H01L2225/06513 , H01L2225/06517 , H01L2225/06541 , H01L2225/06562 , H01L2924/00014 , H01L2924/13091 , H01L2924/1438 , H03K99/00 , H01L2924/00 , H01L2924/00012 , H01L2224/45099 , H01L2224/45015 , H01L2924/207 , H01L2224/85399 , H01L2224/05599
Abstract: According to one embodiment, a semiconductor device includes chips and a first selection circuit. Each of the chips has at least first and second vias for transmitting at least first and second address signals, wherein these chips are stacked to be electrically connected via the first and second vias. The first selection circuit is provided in each chip, and includes a logic circuit that selects a chip based on at least the first and second address signals, and supplies a result of operating the first and second address signals to the subsequent chip.
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公开(公告)号:US10734360B2
公开(公告)日:2020-08-04
申请号:US16121171
申请日:2018-09-04
Applicant: TOSHIBA MEMORY CORPORATION
Inventor: Satoshi Tsukiyama , Masaru Koyanagi , Mikihiko Ito , Kazushige Kawasaki
IPC: H01L25/065 , H01L23/00
Abstract: A semiconductor device includes a base member and semiconductor chips stacked on the base member. The semiconductor chips include a first semiconductor chip and a second semiconductor chip adjacent to the first semiconductor chip. The first semiconductor chip includes a semiconductor substrate, a functional layer and through electrodes. The through electrodes extend from the back surface to the front surface of the semiconductor substrate, and are electrically connected to the functional layer on the front surface. The second semiconductor chip is electrically connected to the first semiconductor chip through connection members connected to the through electrodes. The functional layer includes first and second contact pads. The second contact pad is positioned at a level between the semiconductor substrate and the first contact pad. The through electrodes include a first through electrode connected to the first contact pad and a second through electrode connected to the second contact pad.
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公开(公告)号:US10679710B2
公开(公告)日:2020-06-09
申请号:US16120294
申请日:2018-09-02
Applicant: TOSHIBA MEMORY CORPORATION
Inventor: Yasuhiro Hirashima , Masaru Koyanagi , Mikihiko Ito , Kei Shiraishi , Fumiya Watanabe
Abstract: A semiconductor device comprises an input circuit that includes a first comparator configured to output a first output signal and a second output signal having a phase opposite to that of the first output signal, based on a comparison result of a first input signal and a second input signal which is a complementary signal of the first input signal. A duty ratio of the first output signal and a duty ratio of the second output signal are different from a duty ratio of the first input signal and a duty ratio of the second input signal, respectively.
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公开(公告)号:US20200014385A1
公开(公告)日:2020-01-09
申请号:US16571023
申请日:2019-09-13
Applicant: Toshiba Memory Corporation
Inventor: Yasuhiro HIRASHIMA , Masaru Koyanagi , Yutaka Takayama
IPC: H03K19/0175 , H01L23/538
Abstract: A semiconductor device includes a latch circuit including a first inverter configured to output a first signal based on an input signal, a second inverter configured to output a first clock signal based on a first strobe signal, a third inverter configured to output a second clock signal based on a second strobe signal, a first clock generation circuit configured to generate a third clock signal having transitions that are delayed with respect to the first clock signal, a second clock generation circuit configured to generate a fourth clock signal having transitions that are delayed with respect to the second clock signal, a fourth inverter configured to output an inversion signal of the first signal in accordance with the third and fourth clock signals, and a data latch circuit configured to latch an output signal of the fourth inverter.
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公开(公告)号:US10461750B2
公开(公告)日:2019-10-29
申请号:US15907264
申请日:2018-02-27
Applicant: TOSHIBA MEMORY CORPORATION
Inventor: Yasuhiro Hirashima , Masaru Koyanagi , Yutaka Takayama
IPC: G11C7/10 , H03K3/00 , H03K19/0175 , H01L23/538
Abstract: A semiconductor device includes a latch circuit including a first inverter configured to output a first signal based on an input signal, a second inverter configured to output a first clock signal based on a first strobe signal, a third inverter configured to output a second clock signal based on a second strobe signal, a first clock generation circuit configured to generate a third clock signal having transitions that are delayed with respect to the first clock signal, a second clock generation circuit configured to generate a fourth clock signal having transitions that are delayed with respect to the second clock signal, a fourth inverter configured to output an inversion signal of the first signal in accordance with the third and fourth clock signals, and a data latch circuit configured to latch an output signal of the fourth inverter.
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