ELECTRON EMITTING DEVICE
    1.
    发明申请
    ELECTRON EMITTING DEVICE 审中-公开
    电子发射装置

    公开(公告)号:US20120091881A1

    公开(公告)日:2012-04-19

    申请号:US13252001

    申请日:2011-10-03

    IPC分类号: H01J19/24 H01J1/304

    摘要: The present invention provides an electron emitting device that includes a cathode, and a gate onto which electrons field-emitted from the cathode are irradiated. The gate includes at least a layer containing molybdenum and oxygen provided at a portion onto which the electrons field-emitted from the cathode are irradiated. The layer has peaks in a range of 397 eV through 401 eV, a range of 414 eV through 418 eV, a range of 534 eV through 538 eV, and a range of 540 eV through 547 eV, respectively, in a spectrum measured by electron energy loss spectroscopy using a transmission electron microscope.

    摘要翻译: 本发明提供一种电子发射器件,其包括阴极和从阴极发射的电子被照射到其上的栅极。 栅极包括至少一层含有钼和氧的层,其设置在从阴极发射的电子被照射的部分上。 该层在通过电子测量的光谱中分别具有在397eV至401eV的范围内的峰值,414eV至418eV的范围,534eV至538eV的范围以及540eV至547eV的范围内的峰值 使用透射电子显微镜的能量损失光谱。

    Probe-holding apparatus, sample-obtaining apparatus, sample-processing apparatus, sample-processing method and sample-evaluating method
    6.
    发明授权
    Probe-holding apparatus, sample-obtaining apparatus, sample-processing apparatus, sample-processing method and sample-evaluating method 失效
    探头保持装置,取样装置,样品处理装置,样品处理方法和样品评价方法

    公开(公告)号:US07531797B2

    公开(公告)日:2009-05-12

    申请号:US12029766

    申请日:2008-02-12

    申请人: Taiko Motoi

    发明人: Taiko Motoi

    IPC分类号: H01J37/08

    摘要: A sample processing apparatus includes a stage for supporting a sample, a first temperature controller for controlling a temperature of the sample, an ion beam generator for irradiating the sample with an ion beam, and a detector for detecting a signal emitted from the sample in response to the irradiation of the ion beam. Also provided is a probe for obtaining a part of the sample processed by the irradiation of the ion beam and conveying it to a sample table, a second temperature controller for controlling a temperature of the probe, and a third temperature controller for controlling a temperature of the sample table.

    摘要翻译: 样品处理装置包括用于支撑样品的台,用于控制样品温度的第一温度控制器,用离子束照射样品的离子束发生器和用于检测从样品发射的信号的检测器 对离子束的照射。 还提供了一种用于获得通过照射离子束并将其传送到样品台的样品的一部分的探针,用于控制探针的温度的第二温度控制器和用于控制探针的温度的第三温度控制器 样品表。

    Color filter
    8.
    发明授权
    Color filter 失效
    滤色片

    公开(公告)号:US4793692A

    公开(公告)日:1988-12-27

    申请号:US808507

    申请日:1985-12-13

    摘要: A color filter is provided by forming a vapor-deposited green colorant layer of an octa-4,5-phenylphthalocyanine colorant which is octa-4,5-phenylphthalocyanine or a metal complex thereof represented by the formula: ##STR1## wherein R is Cu, GaOH, VO, Ni, Pd, Pb, Mg, Ca or Co. The spectral characteristics of the green colorant layer may be corrected with a yellow colorant such as an isoindolinone colorant or an anthraquinone colorant.

    摘要翻译: 通过形成八氢-4,5-苯基酞菁着色剂的蒸镀绿色着色层来提供滤色片,该着色剂是八氢-4,5-苯基酞菁或其由下式表示的金属络合物:其中R是Cu ,GaOH,VO,Ni,Pd,Pb,Mg,Ca或Co。绿色着色剂层的光谱特性可以用黄色着色剂如异吲哚啉酮着色剂或蒽醌着色剂进行校正。

    Method of Manufacturing A Nano Structure By Etching, Using A Substrate Containing Silicon
    9.
    发明申请
    Method of Manufacturing A Nano Structure By Etching, Using A Substrate Containing Silicon 有权
    通过蚀刻制造纳米结构的方法,使用含有硅的衬底

    公开(公告)号:US20110027998A1

    公开(公告)日:2011-02-03

    申请号:US12880188

    申请日:2010-09-13

    IPC分类号: H01L21/308

    摘要: A method of manufacturing a nano structure by etching, using a substrate containing Si. A focused Ga ion or In ion beam is irradiated on the surface of the substrate containing Si. The Ga ions or the In ions are injected while sputtering away the surface of the substrate so that a layer containing Ga or In is formed on the surface of the substrate. Dry etching by a gas containing fluorine (F) is performed with the layer containing the Ga or the In formed on the surface of the substrate taken as an etching mask, and the nano structure is formed having a pattern of at least 2 μm tin in depth according to a predetermined line width.

    摘要翻译: 使用含有Si的基板通过蚀刻制造纳米结构体的方法。 将聚焦的Ga离子或In离子束照射在含有Si的衬底的表面上。 注入Ga离子或In离子,同时溅射衬底的表面,使得在衬底的表面上形成含有Ga或In的层。 使用含有氟(F)的气体进行干蚀刻,其中包含形成在基板表面上的Ga或In的层作为蚀刻掩模,并且纳米结构形成为具有至少2μm锡的图案 根据预定线宽度的深度。

    METHOD FOR FABRICATING THREE-DIMENSIONAL PHOTONIC CRYSTAL
    10.
    发明申请
    METHOD FOR FABRICATING THREE-DIMENSIONAL PHOTONIC CRYSTAL 失效
    制备三维光子晶体的方法

    公开(公告)号:US20080286892A1

    公开(公告)日:2008-11-20

    申请号:US12119168

    申请日:2008-05-12

    IPC分类号: H01L21/00 G02B6/10

    摘要: A method for fabricating a three-dimensional photonic crystal comprises the steps of: forming a dielectric thin film; injecting ions selectively into the dielectric thin film by using a focus ion beam to form a mask on the dielectric thin film; forming a pattern by selectively removing an exposed part of the dielectric thin film at which the mask is not formed on the dielectric thin film; forming a sacrificial layer on the dielectric thin film having the pattern formed therein; and flattening the sacrificial layer formed on the dielectric thin film until the pattern comes to the surface.

    摘要翻译: 一种制造三维光子晶体的方法包括以下步骤:形成电介质薄膜; 通过使用聚焦离子束将离子选择性地注入到电介质薄膜中以在电介质薄膜上形成掩模; 通过选择性地去除在电介质薄膜上没有形成掩模的电介质薄膜的暴露部分来形成图案; 在其上形成图案的电介质薄膜上形成牺牲层; 并且平坦化形成在电介质薄膜上的牺牲层,直到图案到达表面。