METHOD FOR FABRICATION OF POLYCRYSTALLINE DIODES FOR RESISTIVE MEMORIES
    3.
    发明申请
    METHOD FOR FABRICATION OF POLYCRYSTALLINE DIODES FOR RESISTIVE MEMORIES 有权
    用于制造电阻记忆体的多晶二极管的方法

    公开(公告)号:US20090200534A1

    公开(公告)日:2009-08-13

    申请号:US12027675

    申请日:2008-02-07

    IPC分类号: H01L47/00 H01L21/36

    摘要: The present invention, in one embodiment, provides a method of producing a PN junction the method including at least the steps of providing a Si-containing substrate; forming an insulating layer on the Si-containing substrate; forming a via through the insulating layer to expose at least a portion of the Si-containing substrate; forming a seed layer of the exposed portion of the Si containing substrate; forming amorphous Si on at least the seed layer; converting at least a portion of the amorphous Si to provide crystalline Si; and forming a first dopant region abutting a second dopant region in the crystalline Si.

    摘要翻译: 本发明在一个实施方案中提供了一种制备PN结的方法,所述方法至少包括提供含Si衬底的步骤; 在含Si衬底上形成绝缘层; 通过所述绝缘层形成通孔以露出所述含Si衬底的至少一部分; 形成含Si衬底的暴露部分的种子层; 在至少种子层上形成非晶态Si; 转化至少一部分非晶Si以提供晶体Si; 以及形成邻接所述晶体Si中的第二掺杂区的第一掺杂区。

    Method for fabrication of polycrystalline diodes for resistive memories
    4.
    发明授权
    Method for fabrication of polycrystalline diodes for resistive memories 有权
    制造用于电阻存储器的多晶二极管的方法

    公开(公告)号:US07955958B2

    公开(公告)日:2011-06-07

    申请号:US12027675

    申请日:2008-02-07

    IPC分类号: H01L21/20

    摘要: The present invention, in one embodiment, provides a method of producing a PN junction the method including at least the steps of providing a Si-containing substrate; forming an insulating layer on the Si-containing substrate; forming a via through the insulating layer to expose at least a portion of the Si-containing substrate; forming a seed layer of the exposed portion of the Si containing substrate; forming amorphous Si on at least the seed layer; converting at least a portion of the amorphous Si to provide crystalline Si; and forming a first dopant region abutting a second dopant region in the crystalline Si.

    摘要翻译: 本发明在一个实施方案中提供了一种制备PN结的方法,所述方法至少包括提供含Si衬底的步骤; 在含Si衬底上形成绝缘层; 通过所述绝缘层形成通孔以暴露所述含Si衬底的至少一部分; 形成含Si衬底的暴露部分的种子层; 在至少种子层上形成非晶态Si; 转化至少一部分非晶Si以提供晶体Si; 以及形成邻接所述晶体Si中的第二掺杂区的第一掺杂区。

    Method for fabrication of crystalline diodes for resistive memories
    6.
    发明授权
    Method for fabrication of crystalline diodes for resistive memories 有权
    制造电阻式存储器晶体二极管的方法

    公开(公告)号:US08637844B2

    公开(公告)日:2014-01-28

    申请号:US13097307

    申请日:2011-04-29

    IPC分类号: H01L47/00

    摘要: The present invention, in one embodiment, provides a method of producing a PN junction the method including at least the steps of providing a Si-containing substrate; forming an insulating layer on the Si-containing substrate; forming a via through the insulating layer to expose at least a portion of the Si-containing substrate; forming a seed layer of the exposed portion of the Si containing substrate; forming amorphous Si on at least the seed layer; converting at least a portion of the amorphous Si to provide crystalline Si; and forming a first dopant region abutting a second dopant region in the crystalline Si.

    摘要翻译: 本发明在一个实施方案中提供了一种制备PN结的方法,所述方法至少包括提供含Si衬底的步骤; 在含Si衬底上形成绝缘层; 通过所述绝缘层形成通孔以露出所述含Si衬底的至少一部分; 形成含Si衬底的暴露部分的种子层; 在至少种子层上形成非晶态Si; 转化至少一部分非晶Si以提供晶体Si; 以及形成邻接所述晶体Si中的第二掺杂区的第一掺杂区。

    METHOD FOR FABRICATION OF CRYSTALLINE DIODES FOR RESISTIVE MEMORIES
    7.
    发明申请
    METHOD FOR FABRICATION OF CRYSTALLINE DIODES FOR RESISTIVE MEMORIES 有权
    用于制造用于电阻记忆体的晶体二极管的方法

    公开(公告)号:US20110198557A1

    公开(公告)日:2011-08-18

    申请号:US13097307

    申请日:2011-04-29

    IPC分类号: H01L47/00

    摘要: The present invention, in one embodiment, provides a method of producing a PN junction the method including at least the steps of providing a Si-containing substrate; forming an insulating layer on the Si-containing substrate; forming a via through the insulating layer to expose at least a portion of the Si-containing substrate; forming a seed layer of the exposed portion of the Si containing substrate; forming amorphous Si on at least the seed layer; converting at least a portion of the amorphous Si to provide crystalline Si; and forming a first dopant region abutting a second dopant region in the crystalline Si.

    摘要翻译: 本发明在一个实施方案中提供了一种制备PN结的方法,所述方法至少包括提供含Si衬底的步骤; 在含Si衬底上形成绝缘层; 通过所述绝缘层形成通孔以露出所述含Si衬底的至少一部分; 形成含Si衬底的暴露部分的种子层; 在至少种子层上形成非晶态Si; 转化至少一部分非晶Si以提供晶体Si; 以及形成邻接所述晶体Si中的第二掺杂区的第一掺杂区。

    Phase change memory cells having vertical channel access transistor and memory plane
    8.
    发明授权
    Phase change memory cells having vertical channel access transistor and memory plane 有权
    具有垂直通道存取晶体管和存储器平面的相变存储单元

    公开(公告)号:US08350316B2

    公开(公告)日:2013-01-08

    申请号:US12471287

    申请日:2009-05-22

    IPC分类号: H01L29/732

    摘要: Memory devices are described along with methods for manufacturing. A memory device as described herein comprises a plurality of word lines overlying a plurality of bit lines, and a plurality of field effect transistors. Field effect transistors in the plurality of field effect transistors comprises a first terminal electrically coupled to a corresponding bit line in the plurality of bit lines, a second terminal overlying the first terminal, and a channel region separating the first and second terminals and adjacent a corresponding word line in the plurality of word lines. The corresponding word line acts as the gate of the field effect transistor. A dielectric separates the corresponding word line from the channel region. A memory plane comprises programmable resistance memory material electrically coupled to respective second terminals of the field effect transistors, and conductive material on the programmable resistance memory material and coupled to a common voltage.

    摘要翻译: 描述存储器件以及制造方法。 如本文所述的存储器件包括覆盖多个位线的多个字线和多个场效应晶体管。 多个场效应晶体管中的场效应晶体管包括电耦合到多个位线中的相应位线的第一端子,覆盖第一端子的第二端子和分离第一和第二端子并且相邻 多行字线中的字线。 相应的字线用作场效应晶体管的栅极。 电介质将对应的字线与沟道区分开。 存储器平面包括电耦合到场效应晶体管的相应第二端子的可编程电阻存储器材料,以及可编程电阻存储器材料上的导体材料并耦合到公共电压。

    Polysilicon plug bipolar transistor for phase change memory
    10.
    发明授权
    Polysilicon plug bipolar transistor for phase change memory 有权
    用于相变存储器的多晶硅插头双极晶体管

    公开(公告)号:US08030635B2

    公开(公告)日:2011-10-04

    申请号:US12353219

    申请日:2009-01-13

    IPC分类号: H01L29/02

    摘要: Memory devices and methods for manufacturing are described herein. A memory device described herein includes a plurality of memory cells. Memory cells in the plurality of memory cells comprise respective bipolar junction transistors and memory elements. The bipolar junction transistors are arranged in a common collector configuration and include an emitter comprising doped polysilicon having a first conductivity type, the emitter contacting a corresponding word line in a plurality of word lines to define a pn junction. The bipolar junction transistors include a portion of the corresponding word line underlying the emitter acting as a base, and a collector comprising a portion of the single-crystalline substrate underlying the base.

    摘要翻译: 本文描述了存储器件和制造方法。 本文描述的存储器件包括多个存储器单元。 多个存储单元中的存储单元包括相应的双极结型晶体管和存储元件。 双极结晶体管被布置成共同的集电极配置,并且包括发射器,其包括具有第一导电类型的掺杂多晶硅,发射极与多个字线中的对应字线接触以限定pn结。 双极结晶体管包括作为基极的发射极下面的相应字线的一部分,以及包含基底下方的单晶衬底的一部分的集电极。