Scanning probe microscope and specimen surface structure measuring method
    5.
    发明申请
    Scanning probe microscope and specimen surface structure measuring method 失效
    扫描探针显微镜和样品表面结构测量方法

    公开(公告)号:US20050242283A1

    公开(公告)日:2005-11-03

    申请号:US10503701

    申请日:2003-02-05

    摘要: A digital probing type atomic force microscope (AFM) for measuring high aspect structures with high precision. A probe 21 is vibrated while moved to the vicinity of an atomic force region on a specimen surface. The position of the probe is measured when a specified atomic force is detected in the atomic force region. The probe is then moved away from the specimen surface. A servo system for maintaining a gap between the probe and specimen surface is stopped. The probe is moved to a measurement point along the specimen surface while kept away from the specimen. The vibration frequency is a frequency slightly offset from the cantilever resonance point. The atomic force is detected based on the vibration amplitude of the cantilever.

    摘要翻译: 数字探测型原子力显微镜(AFM),用于高精度测量高端面结构。 探针21在移动到试样表面的原子力区域附近时振动。 当在原子力区域中检测到指定的原子力时,测量探针的位置。 然后将探头从样品表面移开。 停止用于保持探针和试样表面之间的间隙的伺服系统。 探头沿着试样表面移动到测量点,同时远离试样。 振动频率是与悬臂共振点稍微偏移的频率。 基于悬臂振动幅度检测原子力。