公开(公告)号：US20100155223A1

公开(公告)日：2010-06-24

申请号：US12695643

申请日：2010-01-28

申请人： Tza-Jing GUNG ,  Xinyu FU ,  Arvind SUNDARRAJAN ,  Edward P. HAMMOND, IV ,  Praburam GOPALRAJA ,  John C. FORSTER ,  Mark A. PERRIN ,  Andrew S. GILLARD

发明人： Tza-Jing GUNG ,  Xinyu FU ,  Arvind SUNDARRAJAN ,  Edward P. HAMMOND, IV ,  Praburam GOPALRAJA ,  John C. FORSTER ,  Mark A. PERRIN ,  Andrew S. GILLARD

IPC分类号： C23C14/32

CPC分类号： H01J37/3266 ,  C23C14/046 ,  C23C14/0641 ,  C23C14/165 ,  C23C14/358 ,  C23F4/00 ,  H01J37/321 ,  H01J37/32623 ,  H01J37/32688 ,  H01J37/3408 ,  H01L21/2855 ,  H01L21/76844 ,  H01L21/76846 ,  H01L21/76865

摘要： A multi-step process performed in a plasma sputter chamber including sputter deposition from the target and argon sputter etching of the substrate. The chamber includes a quadruple electromagnetic coil array coaxially arranged in a rectangular array about a chamber axis outside the sidewalls of a plasma sputter reactor in back of an RF coil within the chamber. The coil currents can be separately controlled to produce different magnetic field distributions, for example, between a sputter deposition mode in which the sputter target is powered to sputter target material onto a wafer and a sputter etch mode in which the RF coil supports the argon sputtering plasma. A TaN/Ta barrier is first sputter deposited with high target power and wafer bias. Argon etching is performed with even higher wafer bias. A flash step is applied with reduced target power and wafer bias.

摘要翻译： 在等离子体溅射室中执行的包括从靶的溅射沉积和对衬底的氩溅射蚀刻的多步骤过程。 该腔室包括一个四重电磁线圈阵列，该四极电磁线圈阵列围绕室内RF射频线圈背面的等离子体溅射反应器的侧壁外的腔室轴线同轴地布置。 可以单独控制线圈电流以产生不同的磁场分布，例如在其中溅射靶被驱动以将靶材料溅射到晶片上的溅射沉积模式和其中RF线圈支撑氩溅射的溅射蚀刻模式之间 等离子体。 首先以高目标功率和晶片偏置溅射沉积TaN / Ta势垒。 以更高的晶片偏压进行氩蚀刻。 应用闪光步骤，降低目标功率和晶片偏置。

公开(公告)号：US20090233438A1

公开(公告)日：2009-09-17

申请号：US12182988

申请日：2008-07-30

申请人： Peijun DING ,  Rong TAO ,  Zheng XU ,  Daniel C. LUBBEN ,  Suraj RENGARAJAN ,  Michael A. MILLER ,  Arvind SUNDARRAJAN ,  Xianmin TANG ,  John C. FORSTER ,  Jianming FU ,  Roderick C. MOSELY ,  Fusen CHEN ,  Praburam GOPALRAJA

发明人： Peijun DING ,  Rong TAO ,  Zheng XU ,  Daniel C. LUBBEN ,  Suraj RENGARAJAN ,  Michael A. MILLER ,  Arvind SUNDARRAJAN ,  Xianmin TANG ,  John C. FORSTER ,  Jianming FU ,  Roderick C. MOSELY ,  Fusen CHEN ,  Praburam GOPALRAJA

IPC分类号： H01L21/4763

CPC分类号： C23C14/046 ,  C23C14/345 ,  C23C14/3457 ,  C23C14/35 ,  C23C14/358 ,  C23C14/564 ,  C23C14/568 ,  H01J37/321 ,  H01J37/3402 ,  H01J37/3408 ,  H01J37/3441 ,  H01J2237/3327 ,  H01L21/2855 ,  H01L21/76805 ,  H01L21/76814 ,  H01L21/76843 ,  H01L21/76844 ,  H01L21/76846 ,  H01L21/76862 ,  H01L21/76865 ,  H01L21/76868 ,  H01L21/76871 ,  H01L21/76873 ,  H01L21/76876 ,  H01L21/76877 ,  H01L2221/1089

摘要： A magnetron sputter reactor for sputtering deposition materials such as tantalum, tantalum nitride and copper, for example, and its method of use, in which self-ionized plasma (SIP) sputtering and inductively coupled plasma (ICP) sputtering are promoted, either together or alternately, in the same or different chambers. Also, bottom coverage may be thinned or eliminated by ICP resputtering in one chamber and SIP in another. SIP is promoted by a small magnetron having poles of unequal magnetic strength and a high power applied to the target during sputtering. ICP is provided by one or more RF coils which inductively couple RF energy into a plasma. The combined SIP-ICP layers can act as a liner or barrier or seed or nucleation layer for hole. In addition, an RF coil may be sputtered to provide protective material during ICP resputtering. In another chamber an array of auxiliary magnets positioned along sidewalls of a magnetron sputter reactor on a side towards the wafer from the target. The magnetron preferably is a small, strong one having a stronger outer pole of a first magnetic polarity surrounding a weaker outer pole of a second magnetic polarity and rotates about the central axis of the chamber. The auxiliary magnets preferably have the first magnetic polarity to draw the unbalanced magnetic field component toward the wafer. The auxiliary magnets may be either permanent magnets or electromagnets.

摘要翻译： 例如，用于溅射诸如钽，氮化钽和铜的沉积材料的磁控溅射反应器及其使用方法，其中促进了自离子等离子体（SIP）溅射和电感耦合等离子体（ICP）溅射，其一起或者 交替地，在相同或不同的室中。 此外，底部覆盖可以通过在一个室中的ICP再溅射和另一个室中的SIP来减薄或消除。 SIP由在溅射期间施加到靶的不均匀磁强度和高功率的磁极的小磁控管促进。 ICP由一个或多个将RF能量感应耦合到等离子体中的RF线圈提供。 组合的SIP-ICP层可以作为孔的衬垫或屏障或种子或成核层。 此外，可以在ICP溅射期间溅射RF线圈以提供保护材料。 在另一个腔室中，辅助磁体阵列沿磁控溅射反应器的侧壁朝着晶片从目标侧面定位。 磁控管优选地是小而强的，具有围绕第二磁极性较弱的外极的第一磁极的更强的外极并围绕腔的中心轴旋转。 辅助磁体优选地具有第一磁极以将不平衡的磁场分量拉向晶片。 辅助磁体可以是永磁体或电磁体。

公开(公告)号：US20080110747A1

公开(公告)日：2008-05-15

申请号：US11933157

申请日：2007-10-31

申请人： Peijun DING ,  Rong TAO ,  Zheng XU ,  Daniel LUBBEN ,  Suraj RENGARAJAN ,  Michael MILLER ,  Arvind SUNDARRAJAN ,  Xianmin TANG ,  John FORSTER ,  Jianming FU ,  Roderick MOSELY ,  Fusen CHEN ,  Praburam GOPALRAJA

发明人： Peijun DING ,  Rong TAO ,  Zheng XU ,  Daniel LUBBEN ,  Suraj RENGARAJAN ,  Michael MILLER ,  Arvind SUNDARRAJAN ,  Xianmin TANG ,  John FORSTER ,  Jianming FU ,  Roderick MOSELY ,  Fusen CHEN ,  Praburam GOPALRAJA

IPC分类号： C23C14/35 ,  C23C14/04 ,  C23C14/56 ,  C23C14/34

CPC分类号： C23C14/046 ,  C23C14/345 ,  C23C14/3457 ,  C23C14/35 ,  C23C14/358 ,  C23C14/564 ,  C23C14/568 ,  H01J37/321 ,  H01J37/3402 ,  H01J37/3408 ,  H01J37/3441 ,  H01J2237/3327 ,  H01L21/2855 ,  H01L21/76805 ,  H01L21/76814 ,  H01L21/76843 ,  H01L21/76844 ,  H01L21/76846 ,  H01L21/76862 ,  H01L21/76865 ,  H01L21/76868 ,  H01L21/76871 ,  H01L21/76873 ,  H01L21/76876 ,  H01L21/76877 ,  H01L2221/1089

摘要： A magnetron sputter reactor for sputtering deposition materials such as tantalum, tantalum nitride and copper, for example, and its method of use, in which self-ionized plasma (SIP) sputtering and inductively coupled plasma (ICP) sputtering are promoted, either together or alternately, in the same or different chambers. Also, bottom coverage may be thinned or eliminated by ICP resputtering in one chamber and SIP in another. SIP is promoted by a small magnetron having poles of unequal magnetic strength and a high power applied to the target during sputtering. ICP is provided by one or more RF coils which inductively couple RF energy into a plasma. The combined SIP-ICP layers can act as a liner or barrier or seed or nucleation layer for hole. In addition, an RF coil may be sputtered to provide protective material during ICP resputtering. In another chamber an array of auxiliary magnets positioned along sidewalls of a magnetron sputter reactor on a side towards the wafer from the target. The magnetron preferably is a small, strong one having a stronger outer pole of a first magnetic polarity surrounding a weaker outer pole of a second magnetic polarity and rotates about the central axis of the chamber. The auxiliary magnets preferably have the first magnetic polarity to draw the unbalanced magnetic field component toward the wafer. The auxiliary magnets may be either permanent magnets or electromagnets.

摘要翻译： 用于溅射诸如钽，氮化钽和铜的沉积材料的磁控溅射反应器及其使用方法，其中促进了自离子等离子体（SIP）溅射和电感耦合等离子体（ICP）溅射，其一起或者 交替地，在相同或不同的室中。 此外，底部覆盖可以通过在一个室中的ICP再溅射和另一个室中的SIP来减薄或消除。 SIP由在溅射期间施加到靶的不均匀磁强度和高功率的磁极的小磁控管促进。 ICP由一个或多个将RF能量感应耦合到等离子体中的RF线圈提供。 组合的SIP-ICP层可以作为孔的衬垫或屏障或种子或成核层。 此外，可以在ICP溅射期间溅射RF线圈以提供保护材料。 在另一个腔室中，辅助磁体阵列沿磁控溅射反应器的侧壁朝着晶片从目标侧面定位。 磁控管优选地是小而强的，具有围绕第二磁极性较弱的外极的第一磁极的更强的外极并围绕腔的中心轴旋转。 辅助磁体优选地具有第一磁极以将不平衡的磁场分量拉向晶片。 辅助磁体可以是永磁体或电磁体。

公开(公告)号：US20130316533A1

公开(公告)日：2013-11-28

申请号：US13906543

申请日：2013-05-31

申请人： Bo ZHENG ,  Arvind SUNDARRAJAN ,  Xinyu FU

发明人： Bo ZHENG ,  Arvind SUNDARRAJAN ,  Xinyu FU

IPC分类号： H01L21/768 ,  H01L21/02

CPC分类号： H01L21/02063 ,  H01J37/32082 ,  H01L21/02057 ,  H01L21/0206 ,  H01L21/28518 ,  H01L21/28556 ,  H01L21/28568 ,  H01L21/743 ,  H01L21/768

摘要： Native oxides and associated residue are removed from surfaces of a substrate by sequentially performing two plasma cleaning processes on the substrate in a single processing chamber. The first plasma cleaning process removes native oxide formed on a substrate surface by generating a cleaning plasma from a mixture of ammonia (NH3) and nitrogen trifluoride (NF3) gases, condensing products of the cleaning plasma on the native oxide to form a thin film that contains ammonium hexafluorosilicate ((NH4)2SiF6), and subliming the thin film off of the substrate surface. The second plasma cleaning process removes remaining residues of the thin film by generating a second cleaning plasma from nitrogen trifluoride gas. Products of the second cleaning plasma react with a few angstroms of the bare silicon present on the surface, forming silicon tetrafluoride (SiF4) and lifting off residues of the thin film.

摘要翻译： 通过在单个处理室中在衬底上依次执行两个等离子体清洗工艺，从衬底的表面除去天然氧化物和相关残留物。 第一等离子体清洁工艺通过从氨（NH 3）和三氟化氮（NF 3）气体的混合物中产生清洁等离子体，从而将清洁等离子体的产物冷凝在天然氧化物上，从而去除在基底表面上形成的天然氧化物，形成薄膜， 含有六氟硅酸铵（（NH 4）2 SiF 6），并将薄膜从衬底表面上升华。 通过从三氟化氮气体产生第二清洗等离子体，第二等离子体清洗工艺去除剩余的薄膜残留物。 第二清洗等离子体的产物与表面上存在的裸硅几埃反应，形成四氟化硅（SiF4）并提取薄膜的残留物。

公开(公告)号：US20170104056A1

公开(公告)日：2017-04-13

申请号：US15288594

申请日：2016-10-07

申请人： Guan Huei SEE ,  Chin Hock TOH ,  Glen T. MORI ,  Arvind SUNDARRAJAN

发明人： Guan Huei SEE ,  Chin Hock TOH ,  Glen T. MORI ,  Arvind SUNDARRAJAN

IPC分类号： H01L49/02 ,  H01L21/768 ,  H01L21/02 ,  H01L23/522 ,  H01L23/532 ,  H01L21/311 ,  H01L21/3213

CPC分类号： H01L28/60 ,  H01L21/0217 ,  H01L21/02181 ,  H01L21/02183 ,  H01L21/31105 ,  H01L21/31127 ,  H01L21/32133 ,  H01L21/76802 ,  H01L21/76831 ,  H01L21/76846 ,  H01L21/76877 ,  H01L23/5223 ,  H01L23/5228 ,  H01L23/53223 ,  H01L23/53238 ,  H01L23/5329 ,  H01L28/20

摘要： Methods of processing a substrate include: providing a substrate having a polymer dielectric layer, a metal pad formed within the polymer dielectric layer and a first metal layer formed atop the polymer dielectric layer; depositing a polymer layer atop the substrate; patterning the polymer layer to form a plurality of openings, wherein the plurality of openings comprises a first opening formed proximate the metal pad; depositing a first barrier layer atop the polymer layer; depositing a dielectric layer atop the first barrier layer; etching the dielectric layer and the first barrier layer from within the first opening and a field region of the polymer layer; depositing a second barrier layer atop the substrate; depositing a second metal layer atop the substrate wherein the second metal layer fills the plurality of openings; and etching the second metal layer from a portion of the field region of the polymer layer.