COMPLEMENTARY MIRROR IMAGE EMBEDDED PLANAR RESISTOR ARCHITECTURE
    2.
    发明申请
    COMPLEMENTARY MIRROR IMAGE EMBEDDED PLANAR RESISTOR ARCHITECTURE 有权
    补充镜像图像嵌入式平面电阻结构

    公开(公告)号:US20080093113A1

    公开(公告)日:2008-04-24

    申请号:US11861297

    申请日:2007-09-26

    IPC分类号: H05K1/16

    摘要: A complementary mirror image embedded planar resistor architecture is provided. In the architecture, a complementary hollow structure is formed on a ground plane or an electrode plane to minimize the parasitic resistance, so as to efficiently enhance the application frequency. In addition, in some cases, some signal transmission lines pass through the position below the embedded planar resistor, and if there is no shield at all, serious interference or cross talk phenomenon occurs. Therefore, the complementary hollow structure of the ground plane, the electrode plane, or a power layer adjacent to the embedded planar resistor is designed to be a mesh structure, so as to reduce the interference or cross talk phenomenon. In this manner, the whole resistor structure has preferable high frequency electrical characteristic in the circuit.

    摘要翻译: 提供了一种互补镜像嵌入式平面电阻架构。 在该结构中,在接地平面或电极平面上形成互补的中空结构以最小化寄生电阻,从而有效地提高施加频率。 此外,在某些情况下,一些信号传输线通过嵌入式平面电阻器下方的位置,如果根本没有屏蔽,则会发生严重的干扰或串扰现象。 因此,将接地平面,电极平面或与嵌入式平面电阻器相邻的功率层的互补空心结构设计为网格结构,以减少干扰或串扰现象。 以这种方式,整个电阻器结构在电路中具有优选的高频电特性。

    Complementary mirror image embedded planar resistor architecture
    4.
    发明授权
    Complementary mirror image embedded planar resistor architecture 有权
    互补镜像嵌入式平面电阻架构

    公开(公告)号:US08035036B2

    公开(公告)日:2011-10-11

    申请号:US11861297

    申请日:2007-09-26

    IPC分类号: H05K1/16

    摘要: A complementary mirror image embedded planar resistor architecture is provided. In the architecture, a complementary hollow structure is formed on a ground plane or an electrode plane to minimize the parasitic resistance, so as to efficiently enhance the application frequency. In addition, in some cases, some signal transmission lines pass through the position below the embedded planar resistor, and if there is no shield at all, serious interference or cross talk phenomenon occurs. Therefore, the complementary hollow structure of the ground plane, the electrode plane, or a power layer adjacent to the embedded planar resistor is designed to be a mesh structure, so as to reduce the interference or cross talk phenomenon. In this manner, the whole resistor structure has preferable high frequency electrical characteristic in the circuit.

    摘要翻译: 提供了一种互补镜像嵌入式平面电阻架构。 在该结构中,在接地平面或电极平面上形成互补的中空结构以最小化寄生电阻,从而有效地提高施加频率。 此外,在某些情况下,一些信号传输线通过嵌入式平面电阻器下方的位置,如果根本没有屏蔽,则会发生严重的干扰或串扰现象。 因此,将接地平面,电极平面或与嵌入式平面电阻器相邻的功率层的互补空心结构设计为网格结构,以减少干扰或串扰现象。 以这种方式,整个电阻器结构在电路中具有优选的高频电特性。

    Method for testing component built in circuit board
    7.
    发明申请
    Method for testing component built in circuit board 有权
    电路板内置元件测试方法

    公开(公告)号:US20070152339A1

    公开(公告)日:2007-07-05

    申请号:US11708935

    申请日:2007-02-20

    IPC分类号: H01L21/00 H01L21/4763

    摘要: A method is provided for testing a built-in component including multiple terminals in a multi-layered circuit board. At least one signal pad is provided on a top surface of the multi-layered circuit board for signal transmission. Each of the signal pads are electrically connected to one of the multiple terminals. At least one test pad is provided on the top surface of the multi-layered circuit board and each of the test pads is electrically connected to one of the multiple terminals. Then, detection occurs regarding one of the signal pads and one of the test pads that are electrically connected to a same one of the multiple terminals in order to determine a connection status of an electric path extending from the one signal pad through the same one terminal to the one test pad.

    摘要翻译: 提供一种用于在多层电路板中测试包括多个端子的内置组件的方法。 在用于信号传输的多层电路板的顶表面上提供至少一个信号焊盘。 每个信号焊盘电连接到多个端子中的一个。 在多层电路板的顶表面上提供至少一个测试焊盘,并且每个测试焊盘电连接到多个端子之一。 然后,对于电连接到多个端子中的一个的一个信号焊盘和测试焊盘之一进行检测,以便确定从一个信号焊盘延伸通过相同的一个端子的电通路的连接状态 到一个测试垫。

    Method for testing component built in circuit board
    8.
    发明授权
    Method for testing component built in circuit board 有权
    电路板内置元件测试方法

    公开(公告)号:US07714590B2

    公开(公告)日:2010-05-11

    申请号:US11708935

    申请日:2007-02-20

    摘要: A method is provided for testing a built-in component including multiple terminals in a multi-layered circuit board. At least one signal pad is provided on a top surface of the multi-layered circuit board for signal transmission. Each of the signal pads are electrically connected to one of the multiple terminals. At least one test pad is provided on the top surface of the multi-layered circuit board and each of the test pads is electrically connected to one of the multiple terminals. Then, detection occurs regarding one of the signal pads and one of the test pads that are electrically connected to a same one of the multiple terminals in order to determine a connection status of an electric path extending from the one signal pad through the same one terminal to the one test pad.

    摘要翻译: 提供一种用于在多层电路板中测试包括多个端子的内置组件的方法。 在用于信号传输的多层电路板的顶表面上提供至少一个信号焊盘。 每个信号焊盘电连接到多个端子中的一个。 在多层电路板的顶表面上提供至少一个测试焊盘,并且每个测试焊盘电连接到多个端子之一。 然后,对于电连接到多个端子中的一个的一个信号焊盘和测试焊盘之一进行检测,以便确定从一个信号焊盘延伸通过相同的一个端子的电通路的连接状态 到一个测试垫。

    Apparatus and method for testing component built in circuit board
    9.
    发明授权
    Apparatus and method for testing component built in circuit board 有权
    用于测试电路板内置组件的装置和方法

    公开(公告)号:US07345366B2

    公开(公告)日:2008-03-18

    申请号:US11131741

    申请日:2005-05-18

    IPC分类号: H01L23/48 H01L23/58 G01R31/26

    摘要: A multi-layered circuit board a built-in component including multiple terminals, at least one signal pad formed on a top surface of the multi-layered circuit board for signal transmission, each of the at least one signal pad corresponding to one of the multiple terminals, and at least one test pad formed on the top surface of the multi-layered circuit board, each of the at least one test pad corresponding to one of the at least one signal pad for testing an electric path extending from the one signal pad through the one terminal to the each of the at least one test pad.

    摘要翻译: 一种多层电路板,包括多个端子的内置组件,至少一个形成在用于信号传输的多层电路板的顶表面上的信号焊盘,所述至少一个信号焊盘中的每一个对应于多个 端子和形成在多层电路板的顶表面上的至少一个测试焊盘,所述至少一个测试焊盘中的每一个对应于至少一个信号焊盘中的一个,用于测试从一个信号焊盘延伸的电路径 通过所述一个端子到所述至少一个测试垫中的每一个。

    Apparatus and method for testing component built in circuit board
    10.
    发明申请
    Apparatus and method for testing component built in circuit board 有权
    用于测试电路板内置组件的装置和方法

    公开(公告)号:US20060261482A1

    公开(公告)日:2006-11-23

    申请号:US11131741

    申请日:2005-05-18

    IPC分类号: H01L23/52

    摘要: A multi-layered circuit board a built-in component including multiple terminals, at least one signal pad formed on a top surface of the multi-layered circuit board for signal transmission, each of the at least one signal pad corresponding to one of the multiple terminals, and at least one test pad formed on the top surface of the multi-layered circuit board, each of the at least one test pad corresponding to one of the at least one signal pad for testing an electric path extending from the one signal pad through the one terminal to the each of the at least one test pad.

    摘要翻译: 一种多层电路板,包括多个端子的内置组件,至少一个形成在用于信号传输的多层电路板的顶表面上的信号焊盘,所述至少一个信号焊盘中的每一个对应于多个 端子和形成在多层电路板的顶表面上的至少一个测试焊盘,所述至少一个测试焊盘中的每一个对应于至少一个信号焊盘中的一个,用于测试从一个信号焊盘延伸的电路径 通过所述一个端子到所述至少一个测试垫中的每一个。