Memory test system including semiconductor memory device suitable for testing an on-die termination, and method thereof
    1.
    发明申请
    Memory test system including semiconductor memory device suitable for testing an on-die termination, and method thereof 有权
    包括适合于测试片上终端的半导体存储器件的存储器测试系统及其方法

    公开(公告)号:US20080052571A1

    公开(公告)日:2008-02-28

    申请号:US11892846

    申请日:2007-08-28

    CPC classification number: G11C29/02 G11C29/022 G11C29/025

    Abstract: Example embodiments relate to a memory test system having a semiconductor memory device, a coupling circuit and a tester. The semiconductor memory device may include a plurality of first output nodes and a plurality of second output nodes. The first output nodes may be connected to respective first on-die termination circuits that may not be tested, and the second output nodes may be connected to second on-die termination circuits that may be tested. The semiconductor memory device may be configured to generate test signals of the second on-die termination circuits and to provide the test signals to the second output nodes. The coupling circuit may be configured to connect the first output nodes and the second output nodes to communication channels, respectively. The tester may be configured to test a logic state of the test signals of the communication channels.

    Abstract translation: 示例实施例涉及具有半导体存储器件,耦合电路和测试器的存储器测试系统。 半导体存储器件可以包括多个第一输出节点和多个第二输出节点。 第一输出节点可以连接到可能不被测试的相应的第一片上终端电路,并且第二输出节点可以连接到可以被测试的第二片上终端电路。 半导体存储器件可以被配置为产生第二片上终端电路的测试信号,并将测试信号提供给第二输出节点。 耦合电路可以被配置为分别将第一输出节点和第二输出节点连接到通信信道。 测试器可以被配置为测试通信信道的测试信号的逻辑状态。

    CIRCUIT AND METHOD FOR SAMPLING VALID COMMAND USING EXTENDED VALID ADDRESS WINDOW IN DOUBLE PUMPED ADDRESS SCHEME MEMORY DEVICE
    2.
    发明申请
    CIRCUIT AND METHOD FOR SAMPLING VALID COMMAND USING EXTENDED VALID ADDRESS WINDOW IN DOUBLE PUMPED ADDRESS SCHEME MEMORY DEVICE 有权
    在双重抽取地址方案存储器件中使用扩展有效地址窗口采样有效命令的电路和方法

    公开(公告)号:US20080225626A1

    公开(公告)日:2008-09-18

    申请号:US12128464

    申请日:2008-05-28

    CPC classification number: G06F12/02 G11C7/1078 G11C7/109

    Abstract: Provided are a circuit and method for sampling a valid command using a valid address window extended for a high-speed operation in a double pumped address scheme memory device. A method for extending the valid address window includes: inputting a valid command signal and a first address signal at the first cycle of a clock signal; inputting a second address signal at the second cycle of the clock signal; generating a decoded command signal and extended first and second internal address signals respectively in response to the command signal and the address signals; and latching and decoding the extended first and second internal address signals in response to the decoded command signal.

    Abstract translation: 提供了一种用于在双抽取地址方案存储器件中使用扩展用于高速操作的有效地址窗口来对有效命令进行采样的电路和方法。 扩展有效地址窗口的方法包括:在时钟信号的第一周期输入有效的命令信号和第一地址信号; 在时钟信号的第二周期输入第二地址信号; 响应于命令信号和地址信号分别产生解码的命令信号和扩展的第一和第二内部地址信号; 以及响应于解码的命令信号来锁存和解码扩展的第一和第二内部地址信号。

    SMALL SWING SIGNAL RECEIVER FOR LOW POWER CONSUMPTION AND SEMICONDUCTOR DEVICE INCLUDING THE SAME
    7.
    发明申请
    SMALL SWING SIGNAL RECEIVER FOR LOW POWER CONSUMPTION AND SEMICONDUCTOR DEVICE INCLUDING THE SAME 有权
    用于低功耗的小触发信号接收器和包括其的半导体器件

    公开(公告)号:US20070188201A1

    公开(公告)日:2007-08-16

    申请号:US11566651

    申请日:2006-12-04

    CPC classification number: H03K19/0013 H03K19/018521

    Abstract: A circuit including a voltage boost circuit coupled to a first node and a second node, and configured to apply a boosted first node voltage to the second node; and an inverter circuit coupled to the first node, the second node, and a third node, and configured to generate a signal on the third node in response to the signals on the first node and the second node.

    Abstract translation: 一种电路,包括耦合到第一节点和第二节点的升压电路,并且被配置为将升压的第一节点电压施加到所述第二节点; 以及反相器电路,其耦合到所述第一节点,所述第二节点和第三节点,并且被配置为响应于所述第一节点和所述第二节点上的信号而在所述第三节点上生成信号。

    CIRCUIT AND METHOD FOR SAMPLING VALID COMMAND USING EXTENDED VALID ADDRESS WINDOW IN DOUBLE PUMPED ADDRESS SCHEME MEMORY DEVICE
    8.
    发明申请
    CIRCUIT AND METHOD FOR SAMPLING VALID COMMAND USING EXTENDED VALID ADDRESS WINDOW IN DOUBLE PUMPED ADDRESS SCHEME MEMORY DEVICE 有权
    在双重抽取地址方案存储器件中使用扩展有效地址窗口采样有效命令的电路和方法

    公开(公告)号:US20070121418A1

    公开(公告)日:2007-05-31

    申请号:US11560746

    申请日:2006-11-16

    CPC classification number: G06F12/02 G11C7/1078 G11C7/109

    Abstract: Provided are a circuit and method for sampling a valid command using a valid address window extended for a high-speed operation in a double pumped address scheme memory device. A method for extending the valid address window includes: inputting a valid command signal and a first address signal at the first cycle of a clock signal; inputting a second address signal at the second cycle of the clock signal; generating a decoded command signal and extended first and second internal address signals respectively in response to the command signal and the address signals; and latching and decoding the extended first and second internal address signals in response to the decoded command signal.

    Abstract translation: 提供了一种用于在双抽取地址方案存储器件中使用扩展用于高速操作的有效地址窗口来对有效命令进行采样的电路和方法。 扩展有效地址窗口的方法包括:在时钟信号的第一周期输入有效的命令信号和第一地址信号; 在时钟信号的第二周期输入第二地址信号; 响应于命令信号和地址信号分别产生解码的命令信号和扩展的第一和第二内部地址信号; 以及响应于解码的命令信号来锁存和解码扩展的第一和第二内部地址信号。

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