NITRIDE SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
    1.
    发明申请
    NITRIDE SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME 有权
    氮化物半导体器件及其制造方法

    公开(公告)号:US20120126290A1

    公开(公告)日:2012-05-24

    申请号:US13360275

    申请日:2012-01-27

    IPC分类号: H01L29/778

    摘要: A nitride semiconductor device includes: a first nitride semiconductor layer; a second nitride semiconductor layer formed on the first nitride semiconductor layer and having a wider band gap than the first nitride semiconductor layer; and a third nitride semiconductor layer formed on the second nitride semiconductor layer. A region of the third nitride semiconductor layer located below the gate electrode is formed with a control region having a p-type conductivity, and a region of the third nitride semiconductor layer located between the gate electrode and each of the source electrode and the drain electrode is formed with a high resistive region having a higher resistance than the that of the control region.

    摘要翻译: 氮化物半导体器件包括:第一氮化物半导体层; 形成在所述第一氮化物半导体层上并且具有比所述第一氮化物半导体层更宽的带隙的第二氮化物半导体层; 以及形成在所述第二氮化物半导体层上的第三氮化物半导体层。 位于栅电极下方的第三氮化物半导体层的区域形成有具有p型导电性的控制区域,以及位于栅电极与源电极和漏极之间的第三氮化物半导体层的区域 形成有具有比控制区域更高的电阻的高电阻区域。

    TRANSISTOR AND METHOD FOR FABRICATING THE SAME
    2.
    发明申请
    TRANSISTOR AND METHOD FOR FABRICATING THE SAME 有权
    晶体管及其制造方法

    公开(公告)号:US20080149965A1

    公开(公告)日:2008-06-26

    申请号:US11939899

    申请日:2007-11-14

    IPC分类号: H01L29/80 H01L21/335

    摘要: A transistor includes: a first semiconductor layer and a second semiconductor layer with a first region and a second region, which are sequentially formed above a substrate; a first p-type semiconductor layer formed on a region of the second semiconductor layer other than the first and second regions; and a second p-type semiconductor layer formed on the first p-type semiconductor layer. The first p-type semiconductor layer is separated from a drain electrode by interposing therebetween a first groove having a bottom composed of the first region, and from a source electrode by interposing therebetween a second groove having a bottom composed of the second region.

    摘要翻译: 晶体管包括:第一半导体层和具有第一区域和第二区域的第二半导体层,其顺序地形成在衬底上; 形成在除了第一和第二区域之外的第二半导体层的区域上的第一p型半导体层; 以及形成在第一p型半导体层上的第二p型半导体层。 第一p型半导体层与漏电极分离,其间具有由第一区域构成的底部的第一沟槽和源极电极之间插入具有由第二区域构成的底部的第二沟槽。

    NITRIDE SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
    3.
    发明申请
    NITRIDE SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME 有权
    氮化物半导体器件及其制造方法

    公开(公告)号:US20110114967A1

    公开(公告)日:2011-05-19

    申请号:US13010238

    申请日:2011-01-20

    IPC分类号: H01L29/205 H01L29/78

    摘要: A nitride semiconductor device includes: a substrate; a first nitride semiconductor layer formed over the substrate; a second nitride semiconductor layer formed on the first nitride semiconductor layer and having a larger band gap energy than the first nitride semiconductor layer; a third nitride semiconductor layer formed on the second nitride semiconductor layer and including a p-type nitride semiconductor with at least a single-layer structure; a gate electrode formed on the third nitride semiconductor layer; and a source electrode and a drain electrode formed in regions located on both sides of the gate electrode, respectively. The third nitride semiconductor layer has a thickness greater in a portion below the gate electrode than in a portion below the side of the gate electrode.

    摘要翻译: 氮化物半导体器件包括:衬底; 形成在所述基板上的第一氮化物半导体层; 形成在所述第一氮化物半导体层上并且具有比所述第一氮化物半导体层更大的带隙能量的第二氮化物半导体层; 形成在所述第二氮化物半导体层上并且包括具有至少单层结构的p型氮化物半导体的第三氮化物半导体层; 形成在所述第三氮化物半导体层上的栅电极; 以及分别形成在位于栅电极两侧的区域中的源电极和漏电极。 所述第三氮化物半导体层的厚度比所述栅极电极侧的部分的厚度大。

    BIDIRECTIONAL SWITCHING DEVICE AND BIDIRECTIONAL SWITCHING CIRCUIT USING THE SAME
    5.
    发明申请
    BIDIRECTIONAL SWITCHING DEVICE AND BIDIRECTIONAL SWITCHING CIRCUIT USING THE SAME 有权
    双向切换装置和双向切换电路

    公开(公告)号:US20130009676A1

    公开(公告)日:2013-01-10

    申请号:US13613724

    申请日:2012-09-13

    IPC分类号: H01L29/78 H03K3/00

    摘要: A bidirectional switching device includes a semiconductor multilayer structure made of a nitride semiconductor, a first ohmic electrode and a second ohmic electrode which are formed on the semiconductor multilayer structure, and a first gate electrode and a second gate electrode. The first gate electrode is covered with a first shield electrode having a potential substantially equal to that of the first ohmic electrode. The second gate electrode is covered with the second shield electrode having a potential substantially equal to that of the second ohmic electrode. An end of the first shield electrode is positioned between the first gate electrode and the second gate electrode, and an end of the second shield electrode is positioned between the second gate electrode and the first gate electrode.

    摘要翻译: 双向开关器件包括由半导体多层结构上形成的由氮化物半导体,第一欧姆电极和第二欧姆电极构成的半导体多层结构以及第一栅电极和第二栅电极。 第一栅电极被第一屏蔽电极覆盖,该第一屏蔽电极的电位基本上等于第一欧姆电极的电位。 第二栅电极被第二屏蔽电极覆盖,其电位基本上等于第二欧姆电极的电位。 第一屏蔽电极的端部位于第一栅极电极和第二栅极电极之间,第二屏蔽电极的端部位于第二栅极电极和第一栅极电极之间。

    NITRIDE SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
    6.
    发明申请
    NITRIDE SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME 审中-公开
    氮化物半导体器件及其制造方法

    公开(公告)号:US20120061729A1

    公开(公告)日:2012-03-15

    申请号:US13295762

    申请日:2011-11-14

    IPC分类号: H01L29/778 H01L21/20

    摘要: A nitride semiconductor device includes a semiconductor layer stack including a first nitride semiconductor layer and a second nitride semiconductor layer stacked in this order on a substrate. A p-type third nitride semiconductor layer is selectively formed on the semiconductor layer stack, and a gate electrode is formed on the third nitride semiconductor layer. A first ohmic electrode and a second ohmic electrode are formed on regions of the semiconductor layer stack located at both sides of the third nitride semiconductor layer, respectively. A first gate electrode forms a Schottky contact with the third nitride semiconductor layer.

    摘要翻译: 氮化物半导体器件包括在衬底上依次堆叠的第一氮化物半导体层和第二氮化物半导体层的半导体层堆叠。 在半导体层堆叠上选择性地形成p型第三氮化物半导体层,在第三氮化物半导体层上形成栅电极。 分别在位于第三氮化物半导体层两侧的半导体层堆叠的区域上形成第一欧姆电极和第二欧姆电极。 第一栅电极与第三氮化物半导体层形成肖特基接触。