CHEMICALLY AMPLIFIED POSITIVE-TYPE PHOTORESIST COMPOSITION FOR THICK FILM, CHEMICALLY AMPLIFIED DRY FILM FOR THICK FILM, AND METHOD FOR PRODUCTION OF THICK FILM RESIST PATTERN
    2.
    发明申请
    CHEMICALLY AMPLIFIED POSITIVE-TYPE PHOTORESIST COMPOSITION FOR THICK FILM, CHEMICALLY AMPLIFIED DRY FILM FOR THICK FILM, AND METHOD FOR PRODUCTION OF THICK FILM RESIST PATTERN 有权
    用于厚膜的化学放大的正极型光电组合物,用于厚膜的化学放大干燥膜,以及用于生产厚膜电阻图案的方法

    公开(公告)号:US20100047715A1

    公开(公告)日:2010-02-25

    申请号:US12515872

    申请日:2007-10-18

    IPC分类号: G03F7/004 G03F7/20

    摘要: Disclosed are a chemically amplified positive-type photoresist composition for a thick film, a chemically amplified dry film for a thick film, and a method for producing a thick film resist pattern, all of which are capable of obtaining a satisfactory resist pattern with high sensitivity even on a substrate having a portion formed of copper on an upper surface thereof. The chemically amplified positive-type photoresist composition for a thick film comprises component (A) which includes at least one compound capable of producing an acid upon irradiation with an actinic ray or radiation, and component (B) which includes at least one resin whose alkali solubility increases by the action of an acid, in which the component (A) includes an onium fluorinated alkyl fluorophosphate having a specific structure.

    摘要翻译: 公开了一种用于厚膜的化学放大正型光致抗蚀剂组合物,用于厚膜的化学放大干膜,以及制造厚膜抗蚀剂图案的方法,所有这些都能够以高灵敏度获得令人满意的抗蚀剂图案 即使在其上表面上具有由铜形成的部分的基板上。 用于厚膜的化学放大正型光致抗蚀剂组合物包含组分(A),其包含至少一种能够在用光化学射线或辐射照射时能够产生酸的化合物,和组分(B),其包含至少一种其碱 通过酸的作用,溶解度增加,其中组分(A)包括具有特定结构的鎓氟化烷基氟磷酸酯。

    Chemically amplified positive-type photoresist composition for thick film, chemically amplified dry film for thick film, and method for production of thick film resist pattern
    3.
    发明授权
    Chemically amplified positive-type photoresist composition for thick film, chemically amplified dry film for thick film, and method for production of thick film resist pattern 有权
    用于厚膜的化学放大正型光致抗蚀剂组合物,用于厚膜的化学放大干膜,以及用于生产厚膜抗蚀剂图案的方法

    公开(公告)号:US08507180B2

    公开(公告)日:2013-08-13

    申请号:US12515872

    申请日:2007-10-18

    IPC分类号: G03F7/039

    摘要: Disclosed are a chemically amplified positive-type photoresist composition for a thick film, a chemically amplified dry film for a thick film, and a method for producing a thick film resist pattern, all of which are capable of obtaining a satisfactory resist pattern with high sensitivity even on a substrate having a portion formed of copper on an upper surface thereof. The chemically amplified positive-type photoresist composition for a thick film comprises component (A) which includes at least one compound capable of producing an acid upon irradiation with an actinic ray or radiation, and component (B) which includes at least one resin whose alkali solubility increases by the action of an acid, in which the component (A) includes an onium fluorinated alkyl fluorophosphate having a specific structure.

    摘要翻译: 公开了一种用于厚膜的化学放大正型光致抗蚀剂组合物,用于厚膜的化学放大干膜,以及制造厚膜抗蚀剂图案的方法,所有这些都能够以高灵敏度获得令人满意的抗蚀剂图案 即使在其上表面上具有由铜形成的部分的基板上。 用于厚膜的化学放大正型光致抗蚀剂组合物包含组分(A),其包含至少一种能够在用光化学射线或辐射照射时能够产生酸的化合物,和组分(B),其包含至少一种其碱 通过酸的作用,溶解度增加,其中组分(A)包括具有特定结构的鎓氟化烷基氟磷酸酯。

    Resin composition and coating method using the same
    4.
    发明申请
    Resin composition and coating method using the same 有权
    树脂组合物和使用其的涂布方法

    公开(公告)号:US20090285985A1

    公开(公告)日:2009-11-19

    申请号:US12453425

    申请日:2009-05-11

    IPC分类号: B05D3/12 C08F2/46

    摘要: To provide a resin composition capable of forming a thin film layer so as to cause tenting over concave portions by conventional coating processes without depending on dry films, and also a coating method so as to cause tenting of the resin composition. A resin composition, which, by spin coating, causes tenting over concave portions formed on a substrate, the resin composition including a resin component (a) and a solvent (b) and has a viscosity of at least 200 cP, and tenting can be achieved by using the resin composition, allowing the resin composition to fall drop wise onto a substrate on which concave portions are formed, and spin coating the substrate at a rotating speed of 300 to 4000 rpm.

    摘要翻译: 为了提供能够形成薄膜层的树脂组合物,以便通过常规的涂布方法在不依赖于干膜的情况下在凹部上产生凸起,以及使树脂组合物隆起的涂布方法。 一种树脂组合物,其通过旋涂引起在形成在基材上的凹部上的隆起,所述树脂组合物包含树脂组分(a)和溶剂(b),并且具有至少200cP的粘度,并且可以 通过使用树脂组合物实现,使树脂组合物滴落到形成有凹部的基板上,并以300〜4000rpm的旋转速度旋转基板。

    Chemically amplified photoresist composition, laminated product, and connection element
    7.
    发明授权
    Chemically amplified photoresist composition, laminated product, and connection element 有权
    化学扩增的光致抗蚀剂组合物,层压产品和连接元件

    公开(公告)号:US07879525B2

    公开(公告)日:2011-02-01

    申请号:US10547830

    申请日:2004-12-03

    IPC分类号: G03F7/00 G03F7/004 G03F7/42

    摘要: There are provided a stable chemically amplified photoresist composition that undergoes no change in alkali solubility prior to irradiation, a photoresist laminated product produced by laminating the photoresist composition onto a support, and a manufacturing method for a photoresist pattern and a manufacturing method for a connection terminal that use the photoresist composition and the laminated product. A chemically amplified photoresist composition is provided comprising (a) a resin that undergoes a change in alkali solubility under the action of acid, (b) a compound that generates acid on irradiation, and (c) a corrosion inhibitor.

    摘要翻译: 提供了稳定的化学放大光致抗蚀剂组合物,其在照射之前不会发生碱溶解度的变化,通过将光致抗蚀剂组合物层压到载体上而制备的光致抗蚀剂层压产品,以及用于光致抗蚀剂图案的制造方法和连接端子的制造方法 使用光致抗蚀剂组合物和层压产品。 提供化学放大光致抗蚀剂组合物,其包含(a)在酸的作用下碱溶性变化的树脂,(b)在照射时产生酸的化合物,和(c)腐蚀抑制剂。

    Thick film photoresist composition and method of forming resist pattern
    8.
    发明授权
    Thick film photoresist composition and method of forming resist pattern 有权
    厚膜光致抗蚀剂组合物和形成抗蚀剂图案的方法

    公开(公告)号:US07598014B2

    公开(公告)日:2009-10-06

    申请号:US10578398

    申请日:2004-11-18

    IPC分类号: G03F7/00 G03F7/004

    摘要: A negative thick film photoresist composition with improved alkali developability is provided. The composition comprises: (A) a resin component containing (a) from 61 to 90% by weight of a structural unit derived from a cyclic alkyl (meth)acrylate ester, and (b) a structural unit derived from a radical polymerizable compound containing a hydroxyl group, (B) a polymerizable compound containing at least one ethylenic unsaturated double bond, (C) a photopolymerization initiator, and (D) an organic solvent.

    摘要翻译: 提供了具有改善的碱显影性的负厚膜光致抗蚀剂组合物。 该组合物包含:(A)含有(a)61〜90重量%的衍生自(甲基)丙烯酸环状烷基酯的结构单元的树脂成分,(b)衍生自含有 羟基,(B)含有至少一个烯属不饱和双键的聚合性化合物,(C)光聚合引发剂,(D)有机溶剂。

    Developer composition for resists and method for formation of resist pattern
    9.
    发明授权
    Developer composition for resists and method for formation of resist pattern 有权
    用于抗蚀剂的显影剂组合物和形成抗蚀剂图案的方法

    公开(公告)号:US07335465B2

    公开(公告)日:2008-02-26

    申请号:US10560155

    申请日:2004-06-10

    IPC分类号: G03F7/30 G03G7/32

    CPC分类号: G03F7/322

    摘要: To provide a developer composition for resists, capable of improving dimensional controllability of a resist pattern. The developer composition for resists comprises an organic quaternary ammonium base as a main component, said developer composition further comprising an anionic surfactant represented by the following general formula (I), and SO42−, the content of S42− being from 0.01 to 1% by mass. In the formula, at least one of R1 and R2 represents an alkyl or alkoxy group having 5 to 18 carbon atoms and the other one represents a hydrogen atom, or an alkyl or alkoxy group having 5 to 18 carbon atoms, and at least one of R3, R4 and R5 represents an ammonium sulfonate group or a sulfonic acid-substituted ammonium group and the others represent a hydrogen atom, an ammonium sulfonate group or a sulfonic acid-substituted ammonium group.

    摘要翻译: 提供能够提高抗蚀剂图案的尺寸可控性的抗蚀剂用显影剂组合物。 用于抗蚀剂的显影剂组合物包含有机季铵碱作为主要成分,所述显影剂组合物还包含由以下通式(I)表示的阴离子表面活性剂和SO 4 - / SUP>,其中S 2 的含量为0.01〜1质量%。 在该式中,R 1和R 2中的至少一个表示具有5至18个碳原子的烷基或烷氧基,另一个表示氢原子,或 具有5至18个碳原子的烷基或烷氧基,并且R 3,R 4和R 5中的至少一个表示磺酸铵基团 或磺酸取代的铵基,其余的表示氢原子,磺酸铵基或磺酸取代的铵基。

    Developer composition for resists and method for formation of resist pattern
    10.
    发明授权
    Developer composition for resists and method for formation of resist pattern 有权
    用于抗蚀剂的显影剂组合物和形成抗蚀剂图案的方法

    公开(公告)号:US07846640B2

    公开(公告)日:2010-12-07

    申请号:US10561802

    申请日:2004-06-22

    IPC分类号: G03C5/00

    CPC分类号: G03F7/322

    摘要: A developer composition for resists which has a high dissolution rate (high developing sensitivity). The developer composition for resists comprises an organic quaternary ammonium base as a main component and a surfactant containing an anionic surfactant represented by formula (I).

    摘要翻译: 具有高溶解速率(高显影灵敏度)的抗蚀剂用显影剂组合物。 抗蚀剂用显影剂组合物包含作为主要成分的有机季铵碱和含有由式(I)表示的阴离子表面活性剂的表面活性剂。