Compact balun transformers
    2.
    发明授权
    Compact balun transformers 有权
    紧凑式平衡不平衡变压器

    公开(公告)号:US07692511B2

    公开(公告)日:2010-04-06

    申请号:US12077811

    申请日:2008-03-21

    IPC分类号: H03H7/42 H01P3/08

    摘要: Balun transformers are described wherein multiple transformer loops are implemented in a stacked design with the primary and secondary loops overlying one another. By aligning the loops in a vertical direction, instead of offsetting the loops, the area of the device is reduced. Multiple transformer loops are nested on each level, and the transformer loops on a given level are connected together using a crossover located on a different level.

    摘要翻译: 描述了平衡 - 不平衡变压器,其中多个变压器回路以堆叠设计实现,其中主回路和次级回路彼此重叠。 通过在垂直方向上对准环路,而不是抵消环路,设备的面积减小。 多个变压器回路嵌套在每个级别上,并且给定级别上的变压器环路使用位于不同级别的交叉连接在一起。

    Compact balun transformers
    3.
    发明申请
    Compact balun transformers 有权
    紧凑式平衡不平衡变压器

    公开(公告)号:US20090237175A1

    公开(公告)日:2009-09-24

    申请号:US12077811

    申请日:2008-03-21

    IPC分类号: H03H7/42

    摘要: Balun transformers are described wherein multiple transformer loops are implemented in a stacked design with the primary and secondary loops overlying one another. By aligning the loops in a vertical direction, instead of offsetting the loops, the area of the device is reduced. Multiple transformer loops are nested on each level, and the transformer loops on a given level are connected together using a crossover located on a different level.

    摘要翻译: 描述了平衡 - 不平衡变压器,其中多个变压器回路以堆叠设计实现,其中主回路和次级回路彼此重叠。 通过在垂直方向上对准环路,而不是抵消环路,设备的面积减小。 多个变压器回路嵌套在每个级别上,并且给定级别上的变压器环路使用位于不同级别的交叉连接在一起。

    MCM packages
    5.
    发明申请
    MCM packages 审中-公开
    MCM包

    公开(公告)号:US20090184416A1

    公开(公告)日:2009-07-23

    申请号:US12009805

    申请日:2008-01-22

    IPC分类号: H01L23/36 H01L21/58

    摘要: An RF/IPD package with improved thermal management is described. The IPD substrate is attached to a system substrate with a thin RF chip mounted in the standoff between the IPD substrate and the system substrate. RF interconnections are made between the top of the RF chip and the bottom of the IPD substrate. Heat sinking is provided by bonding a heat sink layer on the RF chip to a heat sink layer on the system substrate. The heat sink may also serve as a ground plane connection. Combinations of other types of integrated devices may be fabricated using this approach.

    摘要翻译: 描述了具有改进的热管理的RF / IPD封装。 IPD基板通过安装在IPD基板和系统基板之间的支架中的薄RF芯片连接到系统基板。 在RF芯片的顶部和IPD基板的底部之间形成RF互连。 通过将RF芯片上的散热层结合到系统基板上的散热层来提供散热。 散热器也可以用作接地平面连接。 可以使用这种方法来组合其他类型的集成装置。

    Testing integrated circuits
    8.
    发明授权
    Testing integrated circuits 失效
    测试集成电路

    公开(公告)号:US07061258B2

    公开(公告)日:2006-06-13

    申请号:US10997629

    申请日:2004-11-24

    IPC分类号: G01R31/02

    CPC分类号: G01R1/0735

    摘要: A flexible membrane test apparatus and test method for high-speed IC chips. The method and apparatus rely on locating the reference components of the test circuit very close to the contact pads of the IC chip under test. This is achieved in one embodiment by locating those components adjacent to the flexible membrane. In another embodiment, the reference components may be attached to the membrane itself, so the length of the runners connecting the contact points of the tester and the critical reference components is optimally reduced. In yet a further embodiment, the entire test circuit, in the form of an IC test chip, is located on the membrane.

    摘要翻译: 一种用于高速IC芯片的柔性膜测试装置和测试方法。 该方法和装置依赖于将测试电路的参考部件定位得非常靠近被测IC芯片的接触焊盘。 这在一个实施例中通过将这些部件定位在与柔性膜相邻的位置来实现。 在另一个实施例中,参考部件可以附接到膜本身,因此连接测试器的接触点和关键参考部件的流道的长度被最佳地减小。 在又一个实施例中,以IC测试芯片的形式的整个测试电路位于膜上。

    Membrane test method and apparatus for integrated circuit testing
    10.
    发明授权
    Membrane test method and apparatus for integrated circuit testing 失效
    用于集成电路测试的膜测试方法和装置

    公开(公告)号:US06867607B2

    公开(公告)日:2005-03-15

    申请号:US10053818

    申请日:2002-01-22

    IPC分类号: G01R1/073 G01R31/02

    CPC分类号: G01R1/0735

    摘要: The specification describes a flexible membrane test apparatus and test method for high-speed IC chips. The method and apparatus rely on locating the reference components of the test circuit very close to the contact pads of the IC chip under test. This is achieved in one embodiment by locating those components adjacent to the flexible membrane. In another embodiment, the reference components may be attached to the membrane itself, so the length of the runners connecting the contact points of the tester and the critical reference components is optimally reduced. In yet a further embodiment, the entire test circuit, in the form of an IC test chip, is located on the membrane.

    摘要翻译: 该说明书描述了用于高速IC芯片的柔性膜测试装置和测试方法。 该方法和装置依赖于将测试电路的参考部件定位得非常靠近被测IC芯片的接触焊盘。 这在一个实施例中通过将这些部件定位在与柔性膜相邻的位置来实现。 在另一个实施例中,参考部件可以附接到膜本身,因此连接测试器的接触点和关键参考部件的流道的长度被最佳地减小。 在又一个实施例中,以IC测试芯片的形式的整个测试电路位于膜上。