Near field analysis apparatus having irradiation-side guide light and light-collection-side guide light
    1.
    发明授权
    Near field analysis apparatus having irradiation-side guide light and light-collection-side guide light 有权
    近场分析装置具有照射侧引导灯和集光侧引导光

    公开(公告)号:US07235807B2

    公开(公告)日:2007-06-26

    申请号:US11316402

    申请日:2005-12-22

    IPC分类号: G01N21/86

    CPC分类号: G01Q60/22

    摘要: A near field analysis apparatus comprising: an irradiation optical system comprising an irradiation-side adjustable optical system for adjusting the position or angle of an optical axis thereof, and irradiating irradiation-side guide light onto an adjustment surface via the irradiation-side adjustable optical system; a light collecting optical system comprising a light-collection-side adjustable optical system for adjusting the position or angle of an optical axis thereof, and irradiating light-collection-side guide light onto the adjustment surface via the light-collection-side adjustable optical system; an irradiation-side adjustment device for adjusting the position or angle of the irradiation-side adjustable optical system such that the spots of the guide light, which are observed at the adjustment surface, match; and a light-collection-side adjustment device for adjusting the position or angle of the light-collection-side adjustable optical system such that the spots of the guide light, which are observed at the adjustment surface, match.

    摘要翻译: 一种近场分析装置,包括:照射光学系统,包括用于调节其光轴的位置或角度的照射侧可调节光学系统,并且经由照射侧可调节光学系统将照射侧引导光照射到调整表面上 ; 光收集光学系统,包括用于调节其光轴的位置或角度的采光侧可调光学系统,以及经由采光侧可调节光学系统将光收集侧引导光照射到调节表面上 ; 照射侧调节装置,用于调节照射侧可调节光学系统的位置或角度,使得在调节表面观察到的引导光点相匹配; 以及采集侧调整装置,其用于调整所述收光侧可调光学系统的位置或角度,使得在所述调整面观察到的所述引导光的光斑匹配。

    Near field analysis apparatus
    2.
    发明申请
    Near field analysis apparatus 有权
    近场分析仪

    公开(公告)号:US20060131493A1

    公开(公告)日:2006-06-22

    申请号:US11316402

    申请日:2005-12-22

    IPC分类号: H01J40/14

    CPC分类号: G01Q60/22

    摘要: A near field analysis apparatus comprising: an irradiation optical system comprising an irradiation-side adjustable optical system for adjusting the position or angle of an optical axis thereof, and irradiating irradiation-side guide light onto an adjustment surface via the irradiation-side adjustable optical system; a light collecting optical system comprising a light-collection-side adjustable optical system for adjusting the position or angle of an optical axis thereof, and irradiating light-collection-side guide light onto the adjustment surface via the light-collection-side adjustable optical system; an irradiation-side adjustment device for adjusting the position or angle of the irradiation-side adjustable optical system such that the spots of the guide light, which are observed at the adjustment surface, match; and a light-collection-side adjustment device for adjusting the position or angle of the light-collection-side adjustable optical system such that the spots of the guide light, which are observed at the adjustment surface, match.

    摘要翻译: 一种近场分析装置,包括:照射光学系统,包括用于调节其光轴的位置或角度的照射侧可调节光学系统,并且经由照射侧可调节光学系统将照射侧引导光照射到调整表面上 ; 光收集光学系统,包括用于调节其光轴的位置或角度的采光侧可调光学系统,以及经由采光侧可调节光学系统将光收集侧引导光照射到调节表面上 ; 照射侧调节装置,用于调节照射侧可调节光学系统的位置或角度,使得在调节表面观察到的引导光点相匹配; 以及采集侧调整装置,其用于调整所述收光侧可调光学系统的位置或角度,使得在所述调整面观察到的所述引导光的光斑匹配。

    SIDE AIRBAG DEVICE FOR REAR SEAT
    4.
    发明申请

    公开(公告)号:US20180194318A1

    公开(公告)日:2018-07-12

    申请号:US15816502

    申请日:2017-11-17

    摘要: A side airbag device for a rear seat relating to the technique of the present disclosure includes: an airbag module that is provided at an interior of a side garnish that is disposed between a vehicle body side portion and a vehicle transverse direction outer side of a seatback of a rear seat; a tubular flow regulating cloth that is provided at an interior of a side airbag of the airbag module, at a periphery of an inflator; and an airbag door that is provided at the side garnish, and that has a hinge portion and a tear portion at a periphery thereof, and that is pushed by the tubular flow regulating cloth when gas is generated from the inflator, wherein the tubular flow regulating cloth has openings at both ends thereof, and has exhaust holes in a peripheral wall thereof.

    Cover and airbag device
    7.
    发明授权
    Cover and airbag device 有权
    盖和安全气囊装置

    公开(公告)号:US08955874B2

    公开(公告)日:2015-02-17

    申请号:US13980163

    申请日:2012-01-17

    摘要: A cover used for an airbag device capable of accurately and easily adjusting a deployment direction of an airbag during a side collision according to a deployment position. The cover includes a protecting portion formed along a rolled airbag, and a plurality of attachment portions formed so as to be attached to a body of a vehicle. The protecting portion includes a slit capable of controlling the deployment direction of the airbag by changing a position through which the tab passes toward the body of the vehicle in a rolling direction of the airbag.

    摘要翻译: 一种用于安全气囊装置的盖子,其能够根据展开位置在侧面碰撞期间准确且容易地调整气囊的展开方向。 所述盖包括沿着滚动的安全气囊形成的保护部分,以及形成为附接到车辆本体的多个附接部分。 保护部包括能够通过改变突片在气囊的滚动方向上朝向车身行进的位置的变化来控制安全气囊的展开方向的狭缝。

    Semiconductor device and fabrication method
    10.
    发明授权
    Semiconductor device and fabrication method 有权
    半导体器件及其制造方法

    公开(公告)号:US08878248B2

    公开(公告)日:2014-11-04

    申请号:US13544023

    申请日:2012-07-09

    摘要: A semiconductor device includes a first semiconductor layer formed on a substrate, the first semiconductor containing an impurity element; a second semiconductor layer formed on the first semiconductor layer; a third semiconductor layer formed on the second semiconductor layer; and a gate electrode, a source electrode and a drain electrode that are formed on the third semiconductor layer. In the semiconductor device, the second semiconductor layer includes an impurity diffusion region in which an impurity element contained in the first semiconductor layer is diffused, the impurity diffusion region being located directly beneath the gate electrode and being in contact with the first semiconductor layer, and the impurity element causes the impurity diffusion region to be a p-type impurity diffusion region.

    摘要翻译: 半导体器件包括形成在衬底上的第一半导体层,第一半导体含有杂质元素; 形成在所述第一半导体层上的第二半导体层; 形成在所述第二半导体层上的第三半导体层; 以及形成在第三半导体层上的栅电极,源电极和漏电极。 在半导体器件中,第二半导体层包括杂质扩散区,其中包含在第一半导体层中的杂质元素扩散,杂质扩散区位于栅电极正下方并与第一半导体层接触, 杂质元素使杂质扩散区域成为p型杂质扩散区域。