摘要:
At least one of components of a multiplex system can detect a failure by itself. An output of the multiplex system is determined from outputs of the components and a failure detection notification. Thus, a multiplex system having higher reliability is provided. A multiplex system 1 includes a plurality of components including a component A1 (10a), a component B1 (10b), and a component C1 (10c) that cannot detect a failure by itself and a component A2 (20a) and a component B2 (20b) that can detect a failure by itself. Outputs 11a, 11b, 11c, 21a, and 21b of the components and failure detection notifications 22a and 22b are inputted to an output determination part 30. The output determination part 30 determines an output of the multiplex system 1 from the outputs of the components and the failure detection notifications.
摘要:
A semiconductor inspecting device comprises a probe card for transmitting a signal or power supply to semiconductor wafers having one or more subject chips formed therein, and is constituted such that the first semiconductor wafer faces the first face of the probe card and such that the second semiconductor wafer faces the second face of the probe card on the opposite side of the first face. The probe card includes one or more inspecting chips, which can perform non-contact transmissions with the first subject chip in the first semiconductor wafer and the second subject chip in the second semiconductor wafer.
摘要:
A plurality of semiconductor chips are juxtaposed, each having an electromagnetic induction coil disposed thereon. A signal is transmitted by way of electromagnetic induction between the electromagnetic induction coils disposed on a pair of adjacent semiconductor chips.
摘要:
Disclosed is a semiconductor device composed of a plurality of semiconductor integrated circuits and a plurality of coils. During the production process of the semiconductor device, the plurality of coils are so arranged that the coil surfaces are generally perpendicular to the front surface of a chip of the semiconductor integrated circuits wherein metal films are laminated. A signal is transmitted between a pair of adjacent coils among the plurality of coils.
摘要:
A semiconductor inspection apparatus comprising: a plurality of wafer stages, provided independently for each of a plurality of laminated semiconductor wafers, that directly or indirectly secure the corresponding semiconductor wafers and that possess a mechanism for positioning the corresponding semiconductor wafers; and a probe card, arranged outside or in between the plurality of laminated semiconductor wafers so as to face the semiconductor wafers, that transmits a signal or power to the plurality of semiconductor wafers.
摘要:
A redundant computing system is composed of two systems: a first arithmetic processing unit (A-system) and a second arithmetic processing unit (B-system) having the same functions. A diagnosis control unit performs diagnosis of one system while the other system is performing arithmetic processing operation. The diagnosis control unit controls the input to the first and second arithmetic processing units by way of an input control unit according to the diagnosis operation, and an output control unit controls the output from the first and second arithmetic processing units according to the diagnosis result. After termination of the diagnosis, a value is copied from a storage unit of the system which has not been diagnosed to a storage unit of the system which has been diagnosed, and the redundant computing system resumes the redundant operation.
摘要:
A redundant computing system is composed of two systems: a first arithmetic processing unit (A-system) and a second arithmetic processing unit (B-system) having the same functions. A diagnosis control unit performs diagnosis of one system while the other system is performing arithmetic processing operation. The diagnosis control unit controls the input to the first and second arithmetic processing units by way of an input control unit according to the diagnosis operation, and an output control unit controls the output from the first and second arithmetic processing units according to the diagnosis result. After termination of the diagnosis, a value is copied from a storage unit of the system which has not been diagnosed to a storage unit of the system which has been diagnosed, and the redundant computing system resumes the redundant operation.
摘要:
A semiconductor test apparatus, semiconductor device, and test method are provided that enable the realization of a high-speed delay test. Semiconductor test apparatuses (1a-1c) include: flip-flops (11) each provided with first input terminal SI, second input terminal D, mode terminal SE that accepts a mode signal indicating either a first mode or a second mode, clock terminal CK that accepts a clock signal, and output terminal Q, the flip-flops (11) selecting first input terminal SI when the mode signal indicates the first mode, selecting second input terminal D when the mode signal indicates the second mode, and holding information being received by the input terminal that was selected based on the mode signal in synchronization with the clock signal and supplying as output from output terminal Q; and hold unit 12 that holds a set value and that provides the set value to first input terminal SI.
摘要:
An elementary cell uses single-flux-quanta as two-valued logic propagation signals and is effective for Constructing asynchronous superconducting logic circuits. The elementary cell comprises one OR circuit section and one AND circuit section. Input pulses applied to two input terminals of the elementary cell are split at signal splitting sections in the elementary cell and applied to both inputs of the OR circuit section and both inputs of the AND circuit section. The output of the OR circuit section is defined as the OR output of the elementary cell. A first arrival pulse memory section is provided in the AND circuit section and when one of two input pulses input to the two input terminals of the AND circuit section arrives before the other, this fact is recorded in the first arrival pulse memory section as logical "1". When the other input pulse arrives while logical "1" is recorded in the first arrival pulse memory section, the AND circuit section produces an AND output which is defined as the AND output of the elementary cell. When a reset signal pulse is applied to a reset terminal, the first arrival pulse memory section is reset.
摘要:
A semiconductor device includes a semiconductor wafer in which semiconductor chip forming regions and a scribe region located between the semiconductor chip forming regions are formed, a plurality of semiconductor chip circuit portions provided over the semiconductor wafer, a plurality of first conductive layers, provided in each of the semiconductor chip forming regions, which is electrically connected to each of the circuit portions, and a first connecting portion that electrically connects the first conductive layers to each other across a portion of the scribe region. An external power supply or grounding pad is connected to any one of the first conductive layer and the first connecting portion. The semiconductor device includes a communication portion, connected to the circuit portion, which performs communication with the outside by capacitive coupling or inductive coupling.