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1.发明授权Standard light source having restriction portion for diffuse reflection and measurement method 有权具有用于漫反射和测量方法的限制部分的标准光源公开(公告)号：US09377352B2
公开(公告)日：2016-06-28
申请号：US14161690
申请日：2014-01-23
Applicant: Otsuka Electronics Co., Ltd.
Inventor： Kazuaki Ohkubo
CPC classification number: G01J1/08 , G01J1/42 , G01J2001/061 , G01J2001/4252
Abstract: A novel standard light source with a more simplified construction, which is suitable for measurement of total luminous flux of a light source different in luminous intensity distribution characteristics from a conventional standard light source, and a measurement method with the use of that standard light source are provided. A standard light source includes a light emitting portion, a power feed portion electrically connected to the light emitting portion, and a restriction portion provided between the light emitting portion and the power feed portion, for restricting propagation of light radiated from the light emitting portion toward the power feed portion. A surface of the restriction portion on which light from the light emitting portion is incident is constructed for diffuse reflection.
Abstract translation: 具有更简化结构的新型标准光源，其适合于测量与常规标准光源不同的发光强度分布特性的光源的总光通量，以及使用该标准光源的测量方法 提供。 标准光源包括发光部分，电连接到发光部分的供电部分和设置在发光部分和供电部分之间的限制部分，用于限制从发光部分辐射的光的传播朝向 供电部。 限制部分的来自发光部分的光入射的表面被构造用于漫反射。
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公开(公告)号：US20190137336A1
公开(公告)日：2019-05-09
申请号：US16237942
申请日：2019-01-02
Applicant: SPECTRAFY INC.
Inventor： VIKTAR TATSIANKOU , RICHARD BEAL
CPC classification number: G01J3/36 , G01J1/0403 , G01J1/0411 , G01J1/0433 , G01J1/0474 , G01J1/0492 , G01J1/06 , G01J3/0202 , G01J3/0205 , G01J3/0208 , G01J3/0262 , G01J2001/0481 , G01J2001/061 , G01J2001/4266 , G01J2003/1213 , G01J2003/2806 , G01N21/31 , G01N21/538 , G01N2201/0616 , G01N2201/065
Abstract: Solar spectral irradiance (SSI) measurements are important for solar collector/photovoltaic panel efficiency and solar energy resource assessment as well as being important for scientific meteorological/climate observations and material testing research. To date such measurements have exploited modified diffraction grating based scientific instruments which are bulky, expensive, and with low mechanical integrity for generalized deployment. A compact and cost-effective tool for accurately determining the global solar spectra as well as the global horizontal or tilted irradiances as part of on-site solar resource assessments and module performance characterization studies would be beneficial. An instrument with no moving parts for mechanical and environment stability in open field, non-controlled deployments could exploit software to resolve the global, direct and diffuse solar spectra from its measurements within the 280-4000 nm spectral range, in addition to major atmospheric processes, such as air mass, Rayleigh scattering, aerosol extinction, ozone and water vapour absorptions.
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公开(公告)号：US20180313693A1
公开(公告)日：2018-11-01
申请号：US15769601
申请日：2016-10-20
Applicant: SPECTRAFY INC.
Inventor： VIKTAR TATSIANKOU , RICHARD BEAL
CPC classification number: G01J3/36 , G01J1/0403 , G01J1/0411 , G01J1/0474 , G01J1/0492 , G01J1/06 , G01J3/0202 , G01J3/0205 , G01J3/0208 , G01J3/0262 , G01J2001/061 , G01J2001/4266 , G01J2003/1213 , G01N21/31 , G01N21/538 , G01N2201/0616 , G01N2201/065
Abstract: Solar spectral irradiance (SSI) measurements are important for solar collector/photovoltaic panel efficiency and solar energy resource assessment as well as being important for scientific meteorological/climate observations and material testing research. To date such measurements have exploited modified diffraction grating based scientific instruments which are bulky, expensive, and with low mechanical integrity for generalized deployment. A compact and cost-effective tool for accurately determining the global solar spectra as well as the global horizontal or tilted irradiances as part of on-site solar resource assessments and module performance characterization studies would be beneficial. An instrument with no moving parts for mechanical and environment stability in open field, non-controlled deployments could exploit software to resolve the global, direct and diffuse solar spectra from its measurements within the 280-4000 nm spectral range, in addition to major atmospheric processes, such as air mass, Rayleigh scattering, aerosol extinction, ozone and water vapour absorptions.
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公开(公告)号：US20160266228A1
公开(公告)日：2016-09-15
申请号：US14643386
申请日：2015-03-10
Applicant: THE BOEING COMPANY
Inventor： Mark Joseph Clemen, JR.
CPC classification number: G01S3/782 , G01J1/0266 , G01J1/0414 , G01J1/06 , G01J1/4228 , G01J1/4257 , G01J2001/061 , G01S3/784 , G02B5/003 , G02B26/0816
Abstract: A light detection system may include a light detecting assembly including a plurality of light detectors. Each light detector may include a substrate, a mirror coupled to the substrate, and a light-receiving tube coupled to the substrate. The light-receiving tube may include a sensor positioned at a first end, a light-transmissive opening at a second end that is opposite from the first end, and a plurality of partitions that are configured to block transmission of light energy. A central light path extends through the light-receiving tube. The system may also include a control unit in communication with the light detecting assembly. The control unit is configured to determine one or more of a direction of light emitted from a light source, a position of the light source, or an intensity of light emitted from the light source based on one or more light detection signals received from the light detecting assembly.
Abstract translation: 光检测系统可以包括包括多个光检测器的光检测组件。 每个光检测器可以包括衬底，耦合到衬底的反射镜和耦合到衬底的光接收管。 光接收管可以包括位于第一端处的传感器，在与第一端相对的第二端处的透光开口，以及被配置为阻挡光能的传输的多个隔板。 中央光路延伸穿过光接收管。 该系统还可以包括与光检测组件通信的控制单元。 控制单元被配置为基于从光接收到的一个或多个光检测信号来确定从光源发射的光的方向，光源的位置或从光源发射的光的强度中的一个或多个 检测组件。
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公开(公告)号：US20140224970A1
公开(公告)日：2014-08-14
申请号：US14161690
申请日：2014-01-23
Applicant: OTSUKA ELECTRONICS CO., LTD.
Inventor： Kazuaki OHKUBO
CPC classification number: G01J1/08 , G01J1/42 , G01J2001/061 , G01J2001/4252
Abstract: A novel standard light source with a more simplified construction, which is suitable for measurement of total luminous flux of a light source different in luminous intensity distribution characteristics from a conventional standard light source, and a measurement method with the use of that standard light source are provided. A standard light source includes a light emitting portion, a power feed portion electrically connected to the light emitting portion, and a restriction portion provided between the light emitting portion and the power feed portion, for restricting propagation of light radiated from the light emitting portion toward the power feed portion. A surface of the restriction portion on which light from the light emitting portion is incident is constructed for diffuse reflection.
Abstract translation: 具有更简化结构的新型标准光源，其适合于测量与常规标准光源不同的发光强度分布特性的光源的总光通量，以及使用该标准光源的测量方法 提供。 标准光源包括发光部分，电连接到发光部分的供电部分和设置在发光部分和供电部分之间的限制部分，用于限制从发光部分辐射的光的传播朝向 供电部。 限制部分的来自发光部分的光入射的表面被构造用于漫反射。
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Patent Agency Ranking
6.发明申请公开(公告)号：US20130284906A1
公开(公告)日：2013-10-31
申请号：US13923565
申请日：2013-06-21
Applicant: Heptagon Micro Optics Pte. Ltd.
Inventor： Hartmut Rudmann , Markus Rossi
IPC: H01L31/16
CPC classification number: H01L31/16 , B29D11/00298 , B29D11/00307 , G01J1/0209 , G01J1/0233 , G01J1/0271 , G01J1/0411 , G01J1/06 , G01J1/42 , G01J5/00 , G01J5/022 , G01J5/0235 , G01J5/024 , G01J5/0265 , G01J5/045 , G01J5/0806 , G01J5/20 , G01J2001/061 , G02B3/0031 , G02B3/0056 , G02B13/0085 , H01L25/167 , H01L27/14618 , H01L27/14625 , H01L27/14627 , H01L27/14687 , H01L31/02325 , H01L31/167 , H01L2924/0002 , Y10T29/49002 , H01L2924/00
Abstract: Manufacturing opto-electronic modules (1) includes providing a substrate wafer (PW) on which detecting members (D) are arranged; providing a spacer wafer (SW); providing an optics wafer (OW), the optics wafer comprising transparent portions (t) transparent for light generally detectable by the detecting members and at least one blocking portion (b) for substantially attenuating or blocking incident light generally detectable by the detecting members; and preparing a wafer stack (2) in which the spacer wafer (SW) is arranged between the substrate wafer (PW) and the optics wafer (OW) such that the detecting members (D) are arranged between the substrate wafer and the optics wafer. Emission members (E) for emitting light generally detectable by the detecting members (D) can be arranged on the substrate wafer (PW). Single modules (1) can be obtained by separating the wafer stack (2) into separate modules.
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公开(公告)号：US07592583B2
公开(公告)日：2009-09-22
申请号：US12027866
申请日：2008-02-07
Applicant: Erik Page , Keith Graeber , Konstantinos Papamichael , Michael Siminovitch
Inventor： Erik Page , Keith Graeber , Konstantinos Papamichael , Michael Siminovitch
CPC classification number: G01J1/06 , G01J1/02 , G01J1/0242 , G01J1/04 , G01J1/0474 , G01J2001/061
Abstract: A photosensor with customizable angular-response characteristics is presented. This photosensor includes a light-modifier located between the photosensor and a target area to be monitored by the photosensor, wherein the light-modifier provides a customizable angular response for light received at the photosensor from the target area.
Abstract translation: 介绍了具有可定制角度响应特性的光电传感器。 该光传感器包括位于光传感器和由光传感器监视的目标区域之间的光修正器，其中光修改器为来自目标区域的光传感器处接收到的光提供可定制的角度响应。
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8.发明授权
公开(公告)号：US5113069A
公开(公告)日：1992-05-12
申请号：US612388
申请日：1990-11-14
CPC classification number: G01S3/782 , G01J1/04 , G01J1/0422 , G01J1/0425 , G01J1/0474 , G01J1/4228 , G01S3/78 , G01J2001/061
Abstract: A radiation detector, including, a photodiode, has improved uniformity of sensitivity over the field of view because the receiving surface is provided by an optical diffusing layer, and the field of view is defined by a baffle arrangement, each internal surface of whichy is reflective. The baffle arrangement also defines a volume and the diffusing layer conforms to a part of the volume adjacent to the apex thereof. The diffusing layer may be provided by material, initially in liquid form, solidified in situ within the baffle arrangement. The receiving surface may be provided within a receiving head of the detector, spaced from the photodiode. Radiation may be transmitted from the receiving surface, whether part of a separate receiving head or not, to the photodiode by an optical fibre. An assembly of four consituent detectors, each having three orthogonally arranged mirrors, may together define a hemispherically shaped volume.
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公开(公告)号：US20190196546A1
公开(公告)日：2019-06-27
申请号：US16231266
申请日：2018-12-21
Inventor： Anping WU
IPC: G06F1/16 , H01L23/552 , H04M1/725 , H01L31/101 , H05K5/02 , A45C11/00
CPC classification number: G06F1/1637 , A45C11/00 , A45C2011/002 , G01J1/0204 , G01J1/0219 , G01J1/0233 , G01J1/0271 , G01J1/0411 , G01J1/06 , G01J1/4204 , G01J1/4228 , G01J5/0215 , G01J5/025 , G01J5/0265 , G01J5/045 , G01J5/0806 , G01J2001/061 , G01S7/4813 , G01S17/026 , G06F1/1656 , H01L23/552 , H01L25/167 , H01L31/101 , H04M1/72563 , H05K5/0217
Abstract: An electronic device is provided, which includes an enclosure, an output component, a display screen and an optical sensor. The output component and the display screen are mounted on the enclosure. The output component includes a packaging shell, an infrared supplementary lighting lamp and a proximity infrared lamp; the packaging shell includes a packaging substrate; the infrared supplementary lighting lamp and the proximity infrared lamp are packaged in the packaging shell and born on the packaging substrate. The display screen is provided with a non-opaque entity region and includes a front surface capable of displaying a picture and a back surface back on to the front surface. The optical sensor is arranged on a side, where the back surface is positioned, of the display screen and corresponds to the non-opaque entity region.
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10.发明授权公开(公告)号：US09966493B2
公开(公告)日：2018-05-08
申请号：US13553290
申请日：2012-07-19
Applicant: Hartmut Rudmann , Markus Rossi
Inventor： Hartmut Rudmann , Markus Rossi
IPC: H01L31/16 , G02B13/00 , H01L27/146 , G02B3/00 , G01J1/02 , G01J5/04 , G01J5/02 , G01J5/08 , G01J5/20 , G01J5/00 , G01J1/42 , H01L31/0232 , H01L25/16 , B29D11/00 , G01J1/06 , H01L31/167 , G01J1/04
CPC classification number: H01L31/16 , B29D11/00298 , B29D11/00307 , G01J1/0209 , G01J1/0233 , G01J1/0271 , G01J1/0411 , G01J1/06 , G01J1/42 , G01J5/00 , G01J5/022 , G01J5/0235 , G01J5/024 , G01J5/0265 , G01J5/045 , G01J5/0806 , G01J5/20 , G01J2001/061 , G02B3/0031 , G02B3/0056 , G02B13/0085 , H01L25/167 , H01L27/14618 , H01L27/14625 , H01L27/14627 , H01L27/14687 , H01L31/02325 , H01L31/167 , H01L2924/0002 , Y10T29/49002 , H01L2924/00
Abstract: Manufacturing opto-electronic modules (1) includes providing a substrate wafer (PW) on which detecting members (D) are arranged; providing a spacer wafer (SW); providing an optics wafer (OW), the optics wafer comprising transparent portions (t) transparent for light generally detectable by the detecting members and at least one blocking portion (b) for substantially attenuating or blocking incident light generally detectable by the detecting members; and preparing a wafer stack (2) in which the spacer wafer (SW) is arranged between the substrate wafer (PW) and the optics wafer (OW) such that the detecting members (D) are arranged between the substrate wafer and the optics wafer. Emission members (E) for emitting light generally detectable by the detecting members (D) can be arranged on the substrate wafer (PW). Single modules (1) can be obtained by separating the wafer stack (2) into separate modules.
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