公开(公告)号：EP3114443A2

公开(公告)日：2017-01-11

申请号：EP15717427.7

申请日：2015-03-06

Applicant: Laser- und Medizin-Technologie GmbH Berlin

Inventor： HELFMANN, Jürgen ,  CAPPIUS, Hans-Joachim

IPC: G01J3/02

CPC classification number: G01N21/4785 ,  A61B5/14535 ,  A61B5/14546 ,  A61B5/1455 ,  G01J3/0218 ,  G01J3/0262 ,  G01J3/0286 ,  G01J3/0291 ,  G01J3/0294 ,  G01J3/0297 ,  G01J3/42 ,  G01J2003/104 ,  G01N21/33 ,  G01N21/3554 ,  G01N21/49 ,  G01N2021/3144 ,  G01N2021/4709 ,  G01N2021/4733 ,  G01N2201/1211

Abstract: The invention relates to an optical sensor device which measures in a spatially resolving manner. In order to devise such a sensor device with which a contacting measurement of the article to be measured can be carried out and which can be mass-produced, the sensor device is designed such that a transfer of the calibration onto individual sensor devices is possible with high accuracy. According to certain embodiments of the design of the sensor device and of the evaluation methods, interferences with the measurement of the amount of the target substance are minimized.

Abstract translation: 公开了一种以空间分辨方式测量的光学传感器装置。 为了设计这样的传感器装置，通过该传感器装置可以进行待测量物品的接触测量并且可以进行大量生产，传感器装置被设计成使得校准转移到各个传感器装置上是可能的， 高准确率。 根据传感器装置的设计和评估方法的某些实施例，与靶物质量的测量的干扰被最小化

公开(公告)号：EP2893310A4

公开(公告)日：2016-12-28

申请号：EP13835832

申请日：2013-09-10

Applicant: BLUELIGHT ANALYTICS INC

Inventor： LABRIE DANIEL ,  KOSTYLEV IVAN ,  FELIX CHRIS

IPC: G01J3/12 ,  A61C13/15 ,  G01J1/02 ,  G01J1/04 ,  G01J1/42 ,  G01J3/02 ,  G01M11/02 ,  G01N21/55 ,  G02B5/02

CPC classification number: G01J1/0474 ,  A61C19/003 ,  G01J1/0204 ,  G01J1/0219 ,  G01J1/0271 ,  G01J1/0425 ,  G01J1/0488 ,  G01J3/0205 ,  G01J3/0218 ,  G01J3/0254 ,  G01J3/0256 ,  G01J3/0264 ,  G01J2001/0481 ,  G01J2001/4247 ,  G01M11/0235 ,  G01N21/55 ,  G02B5/02 ,  G02B5/021 ,  G02B5/0284

Abstract: The invention features devices and methods for collecting and measuring light from external light sources. In general, the devices of the invention feature a light diffusing element, e.g., as a component of a light collector, connected by a light conducting conduit, e.g., a fiber optic cable, to a light measuring device, e.g., a spectrometer. This light diffusing element allows, e.g., for substantially uniform light diffusion across its surface and thus accurate measurements, while permitting the total footprint of the device to remain relatively small and portable. This light diffusing element also allows flexibility in scaling of the device to permit use in a wide range of applications.

Abstract translation: 本发明的特征在于用于收集和测量来自外部光源的光的装置和方法。 通常，本发明的器件具有光漫射元件，例如作为光收集器的部件，通过诸如光纤电缆的光导管连接到诸如光谱仪的光测量装置。 该光漫射元件允许例如通过其表面实现基本上均匀的光漫射，从而允许设备的总占地面积保持相对小且便于携带。 该光散射元件还允许设备的缩放的灵活性，以允许在广泛的应用中使用。

公开(公告)号：EP3101412A1

公开(公告)日：2016-12-07

申请号：EP15170743.7

申请日：2015-06-04

Applicant: rascope AG

Inventor： Schneider, Urs

IPC: G01N21/64 ,  G01N21/65 ,  G01N21/94

CPC classification number: G01N21/65 ,  G01J3/0218 ,  G01J3/0272 ,  G01J3/06 ,  G01J3/44 ,  G01N21/6408 ,  G01N21/6456 ,  G01N21/6486 ,  G01N21/94 ,  G01N2021/1734 ,  G01N2021/1738 ,  G01N2021/8845

Abstract: The invention relates to an apparatus for analyzing a surface area of an object, comprising: a laser device (10) configured to emit monochromatic incident light (101) of a first wavelength (λ 1 ) as well as optionally a monochromatic incident light (102) of a second wavelength (λ 2 ) that differs from the first wavelength (λ 1 ), a first deflection means (20) configured to deflect said incident light (101, 102) onto a point (P ij (x i , y j )) of a surface area (A) of an object that is to be analyzed so that scattered light (104) is generated at said point (P ij (x i , y j )), wherein said deflection means (20) is further configured to deflect said incident light (101, 102) such that said surface area (A) is scanned in a pointwise fashion by said incident light (101, 102), a first sensor means (40) configured to detect said scattered light (104) and to provide from said detected scattered light (104) a scatter data set (S ij (λ k )) for the respective point (P ij (x i , y j )), wherein the respective scatter data set (S ij (λ k )) comprises intensities of the detected scattered light (104) for different wave numbers, and a processing unit (50) for processing and/or analyzing said data sets. Further, the invention relates to a method for analyzing a surface area of an object.

Abstract translation: 本发明涉及到用于分析的物体的表面区域，包括：配置成发射第一波长的单色入射光（101）（»1）以及任选的单色入射光的激光装置（10）（102 ）的第二波长的（“2）的确不同于第一波长（»1），被配置为到一个点（P IJ偏转所述入射光（101，102）第一偏转装置（20）（XI，YI）） 的物体的表面面积（A）的所做的是要被分析为没有散射光（104）在所述点（P IJ（XI，YI））产生的，worin所述偏转装置（20）进一步被配置为偏转所述 入射光（101，102）求在于所述表面面积（A）在由所述入射光（101，102），被配置为检测所述散射光（104）和以提供第一传感器装置（40）逐点的方式被扫描 从散射光（104），用于所述respectivement点散射的数据集（S IJ（“k））的（P IJ（XI，YI））所述检测到的磨片 纯粹的respectivement散射数据集（S IJ（“K））包括用于不同波数所检测到的散射光（104）的强度，以及用于处理和/或分析的处理单元（50），所述数据集。 此外，本发明涉及一种用于分析对象的表面区域的方法。

公开(公告)号：EP2280256B1

公开(公告)日：2016-11-16

申请号：EP10182358.1

申请日：2004-09-08

Applicant: The General Hospital Corporation

Inventor： Yun, Seok Hyun, Ph. D. ,  Bouma, Brett Eugene, Ph. D. ,  Tearney, Guillermo J., MD, Ph. D. ,  Boer, Johannes Fitzgerald de, Ph. D.

IPC: G01J3/18 ,  H01S3/10 ,  G01B9/02

CPC classification number: H01S5/5045 ,  A61B5/0059 ,  A61B5/0066 ,  A61B5/7257 ,  G01B9/02002 ,  G01B9/02004 ,  G01B9/02043 ,  G01B9/02075 ,  G01B9/02081 ,  G01B9/02083 ,  G01B9/02084 ,  G01B9/0209 ,  G01B9/02091 ,  G01B2290/45 ,  G01B2290/70 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0218 ,  G01J3/0264 ,  G01J3/453 ,  G01J9/0215 ,  G01N21/4795 ,  G02B6/3604 ,  G02B26/12 ,  G02B27/48 ,  G02F1/093 ,  G02F1/11 ,  H01S3/0071 ,  H01S3/0078 ,  H01S3/08009 ,  H01S3/08063 ,  H01S3/105 ,  H01S3/1068 ,  H01S5/0071 ,  H01S5/0078 ,  H01S5/1025 ,  H01S5/14 ,  H01S5/141 ,  H01S5/146

Abstract: An apparatus and method are provided. In particular, at least one first electro-magnetic radiation may be provided to a sample and at least one second electro-magnetic radiation can be provided to a non-reflective reference. A frequency of the first and/or second radiations varies over time. An interference is detected between at least one third radiation associated with the first radiation and at least one fourth radiation associated with the second radiation. Alternatively, the first electro-magnetic radiation and/or second electro-magnetic radiation have a spectrum which changes over time. The spectrum may contain multiple frequencies at a particular time. In addition, it is possible to detect the interference signal between the third radiation and the fourth radiation in a first polarization state. Further, it may be preferable to detect a further interference signal between the third and fourth radiations in a second polarization state which is different from the first polarization state. The first and/or second electro-magnetic radiations may have a spectrum whose mean frequency changes substantially continuously over time at a tuning speed that is greater than 100 Tera Hertz per millisecond.

公开(公告)号：EP2936092A4

公开(公告)日：2016-11-02

申请号：EP13863946

申请日：2013-12-03

Applicant: EMX INTERNATIONAL LLC

Inventor： LEE GRAYBEAL DANIEL ,  ROGERS ALAN CAREY

IPC: G01J3/42 ,  G01J3/02 ,  G01N21/3504

CPC classification number: G01J3/10 ,  G01J3/0205 ,  G01J3/021 ,  G01J3/0218 ,  G01J3/0245 ,  G01J3/108 ,  G01J3/42 ,  G01N21/3504 ,  G01N21/39 ,  G01N2021/399 ,  G01N2201/06113 ,  G01N2201/0612 ,  G01N2201/0691 ,  G01N2201/0697 ,  G01N2201/08 ,  H01S5/3401

Abstract: An intracavity laser absorption infrared spectroscopy system for detecting trace analytes in vapor samples. The system uses a spectrometer in communications with control electronics, wherein the control electronics contain an analyte database that contains absorption profiles for each analyte the system is used to detect. The system can not only detect the presence of specific analytes, but identify them as well. The spectrometer uses a hollow cavity waveguide that creates a continuous loop inside of the device, thus creating a large path length and eliminating the need to mechanically adjust the path length to achieve a high Q-factor. In a preferred embodiment, the laser source may serve as the detector, thus eliminating the need for a separate detector.

公开(公告)号：EP2959503A4

公开(公告)日：2016-10-26

申请号：EP14753960

申请日：2014-02-21

Applicant: KLA TENCOR CORP

Inventor： BRADY GREGORY ,  SHCHEGROV ANDREI V ,  ROTTER LAWRENCE D ,  SHAUGHNESSY DERRICK ,  SHCEMELININ ANATOLY ,  BEZEL ILYA ,  ARAIN MUZAMMIL ,  VASILIEV ANATOLY ,  ALLEN JAMES ,  SHULEPOV OLEG ,  HILL ANDREW ,  BACHAR OHAD ,  MARKOWITZ MOSHE ,  ISH-SHALOM YARON ,  SELA ILAN ,  MANASSEN AMNON ,  SVIZHER ALEXANDER ,  KHOKHLOV MAXIM ,  ABRAMOV AVI ,  TSIBULEVSKY OLEG ,  KANDEL DANIEL ,  GHINOVKER MARK

IPC: H01L21/66 ,  F21V13/00 ,  F21V13/08 ,  F21V13/12 ,  G02B6/293 ,  G02B6/35

CPC classification number: G01J3/10 ,  F21V13/00 ,  F21V13/08 ,  F21V13/12 ,  G01J3/0218 ,  G01J3/12 ,  G02B6/29332 ,  G02B6/29362 ,  G02B6/29388 ,  G02B6/29395 ,  G02B6/3508 ,  G02B6/353 ,  H01J65/04

Abstract: The disclosure is directed to systems for providing illumination to a measurement head for optical metrology. In some embodiments of the disclosure, illumination beams from a plurality of illumination sources are combined to deliver illumination at one or more selected wavelengths to the measurement head. In some embodiments of the disclosure, intensity and/or spatial coherence of illumination delivered to the measurement head is controlled. In some embodiments of the disclosure, illumination at one or more selected wavelengths is delivered from a broadband illumination source configured for providing illumination at a continuous range of wavelengths.

Abstract translation: 用于向用于光学测量的测量头提供照明的系统被配置为组合来自多个照明源的照明光束以将一个或多个所选波长的照明传送到测量头。 控制传递到测量头的照明的强度和/或空间相干性。 在一个或多个所选波长的照明从配置成在连续波长范围内提供照明的宽带照明源传送。

公开(公告)号：EP3077792A1

公开(公告)日：2016-10-12

申请号：EP14808968.3

申请日：2014-12-04

Applicant: Implen GmbH

Inventor： SAHIRI, Thomas

IPC: G01N21/01 ,  G01N21/03 ,  G01J3/44 ,  G01J3/02 ,  G01N21/11 ,  G01N21/64

CPC classification number: G01N21/25 ,  G01J3/0218 ,  G01N21/01 ,  G01N21/03 ,  G01N21/0303 ,  G01N21/11 ,  G01N2021/0314 ,  G01N2021/035 ,  G01N2021/6417 ,  G01N2021/6482 ,  G01N2021/6484 ,  G01N2201/062 ,  G01N2201/0633 ,  G01N2201/08

Abstract: The invention relates to a device (1) for the light spectroscopic analysis of a small amount of a liquid sample, comprising a receiving point (3) for receiving small amounts of the liquid sample, and light conductors (5, 6) which guide light of a light source to the sample and guide signal light from the sample in the direction of a detector, and is characterised in that an illumination source (7) is arranged below the receiving point (3), and a region (8) below the receiving point (3) which is permeable for the light of the illumination source (7), is provided such that the illumination light illuminates the receiving point (3).

Abstract translation: 本发明涉及一种用于少量液体样品的光谱分析的装置（1），包括用于接收少量液体样品的接收点（3）和引导光的光导体（5,6） 并且其特征在于，照明源（7）布置在所述接收点（3）的下方，并且所述区域（8）位于所述接收点（3）的下方， 以照明光照射接收点（3）的方式设置对照明光源（7）的光透过的接收点（3）。

公开(公告)号：EP1913350B1

公开(公告)日：2016-04-20

申请号：EP06794294.6

申请日：2006-08-04

Applicant: UNIVERSITE JOSEPH FOURIER ,  INSTITUT NATIONAL POLYTECHNIQUE DE GRENOBLE ,  Université de Technologie de Troyes ,  CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE -CNRS-

Inventor： LE COARER, Etienne ,  BENECH, Pierre ,  KERN, Pierre ,  LERONDEL, Gilles ,  BLAIZE, Sylvain ,  MORAND, Alain

IPC: G01J3/02 ,  G01J3/28 ,  G01J3/45 ,  G01J3/453

CPC classification number: G01J3/4531 ,  G01J3/02 ,  G01J3/0218 ,  G01J3/0259 ,  G01J3/2803 ,  G01J3/4532

公开(公告)号：EP2883625A4

公开(公告)日：2016-04-13

申请号：EP14738241

申请日：2014-02-13

Applicant: CHUJKO GRIGORIJ VLADIMIROVICH

Inventor： SHULGIN VLADIMIR ALEKSEEVICH ,  BABISHOV JELNUR MEGRALIEVICH ,  GOLDFARB VLADIMIR ABRAMOVICH ,  MINAKOV DMITRY ANATOLIEVICH ,  PAHOMOV GENNADIJ VLADIMIROVICH ,  SOKOLOVA OLGA VLADIMIROVNA ,  STRYGIN VLADIMIR DMITRIEVICH ,  CHURIKOV ANATOLIJ ALEKSEEVICH

IPC: B07C5/34

CPC classification number: B07C5/342 ,  G01J3/0218 ,  G01J3/024 ,  G01J3/10 ,  G01N21/85

公开(公告)号：EP2180310B1

公开(公告)日：2016-04-13

申请号：EP08757808.4

申请日：2008-06-20

Applicant: Wuhan Tianhong Instruments Co., Ltd.

Inventor： LI, Hongjie ,  FAN, Xinfeng

IPC: G01N21/31 ,  G01J3/42 ,  G01J3/02 ,  G01N21/03 ,  G01N21/3504 ,  G01N21/05

CPC classification number: G01N21/3504 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0218 ,  G01J3/42 ,  G01N21/031 ,  G01N21/05 ,  G01N2021/3513 ,  G01N2201/08