公开(公告)号：EP3760993B1

公开(公告)日：2024-08-14

申请号：EP19757225.8

申请日：2019-01-30

IPC: G01J4/04 ,  G01N21/19 ,  G02B27/28 ,  G02F1/01 ,  G05D25/00 ,  G01J3/447 ,  G01N21/21 ,  G01J3/02

CPC classification number: G01N21/21 ,  G01N21/19 ,  G02B27/28 ,  G05D25/00 ,  G02F1/01 ,  G01N21/211 ,  G01J3/447 ,  G01J3/0286

公开(公告)号：EP4405647A1

公开(公告)日：2024-07-31

申请号：EP22786315.6

申请日：2022-09-13

Applicant: Koninklijke Philips N.V.

Inventor： JIANG, Zhixing

IPC: G01J3/02 ,  G01J3/427 ,  G01N21/3504 ,  G01N21/31 ,  A61B5/083

CPC classification number: G01N21/3504 ,  G01J3/427 ,  G01J2003/433420130101 ,  G01J3/0286 ,  A61B5/0836 ,  G01N21/3151 ,  G01N2201/022120130101 ,  A61B5/082 ,  A61B5/0075

公开(公告)号：EP4399498A1

公开(公告)日：2024-07-17

申请号：EP22778160.6

申请日：2022-09-07

Applicant: SI-Ware Systems

Inventor： SHENOUDA, Botros George Iskander ,  ZEINAH, Tarek Mohamed ,  MORTADA, Bassem ,  SABRY, Yasser M. ,  SAADANY, Bassam ,  ABUELNAGA, Hussien ,  GAD SEIF, Mina ,  SADEK RADWAN, Mohamed ,  AL-HARON, Mohamed H. ,  MEDHAT, Mostafa ,  EL-ARABAWY, Mohamed

IPC: G01J3/02 ,  G01J3/45 ,  G01N21/47 ,  G01N21/35

CPC classification number: G01J3/0202 ,  G01J3/0272 ,  G01J3/0286 ,  G01J3/0291 ,  G01J3/0297 ,  G01J3/45 ,  G01N2021/359520130101 ,  G01N21/4738 ,  G01N2201/022120130101 ,  G01N21/274 ,  G01N21/276 ,  G01N21/278 ,  G01N21/3563

公开(公告)号：EP3936841B1

公开(公告)日：2024-06-05

申请号：EP20305786.4

申请日：2020-07-08

IPC: G01J3/28 ,  G01J3/02 ,  H04N1/195 ,  G01J3/14 ,  G01J3/18 ,  G01J3/04

CPC classification number: G01J3/2823 ,  G01J3/0208 ,  G01J3/0221 ,  G01J3/2803 ,  G01J3/0286 ,  G01J3/04 ,  G01J3/14 ,  G01J3/18

公开(公告)号：EP3351912A1

公开(公告)日：2018-07-25

申请号：EP18159898.8

申请日：2015-02-03

Applicant: Hamamatsu Photonics K.K.

Inventor： Yokino, Takafumi ,  Shibayama, Katsumi

IPC: G01J3/02 ,  G01J3/18 ,  G01J3/36 ,  G01J3/04

CPC classification number: G01J3/0256 ,  G01J3/021 ,  G01J3/0286 ,  G01J3/0289 ,  G01J3/0291 ,  G01J3/04 ,  G01J3/18 ,  G01J3/36

Abstract: A spectrometer comprises a light detection element provided with a light passing part (21) and a light detection part (22); a support (30) fixed to the light detection element such that a space (S) is formed between the light passing part and the support; a first reflection part (11) provided in the support and configured to reflect light passing through the light passing part in the space; a dispersive part (42) provided in the light detection element and configured to disperse and reflect the light reflected by the first reflection part in the space; and a second reflection part (41) provided in the support and configured to reflect the light dispersed and reflected by the dispersive part to the light detection part in the space.

公开(公告)号：EP3343202A1

公开(公告)日：2018-07-04

申请号：EP16838770.2

申请日：2016-08-08

Applicant: Panasonic Intellectual Property Management Co., Ltd.

Inventor： YANAGI, Kazuhiro ,  HIRATA, Keiji

IPC: G01N21/27

CPC classification number: G01N21/3518 ,  G01J3/0286 ,  G01J3/0291 ,  G01J3/06 ,  G01J3/10 ,  G01J3/42 ,  G01J3/4338 ,  G01N21/27 ,  G01N33/0062 ,  G01N2201/0634 ,  G01N2201/0636

Abstract: There is provided a substance detecting device emits first invisible light to the inside and the outside of a detection region of a substance, changes an emitting direction of the first invisible light inside and outside the detection region, receives third invisible light which is passing light of the first invisible light through the reference cell in which a detection target substance is stored, outside of the detection region, and adjusts a temperature of the first invisible light and controls the wavelength of the first invisible light based on the wavelength characteristics of the third invisible light.

公开(公告)号：EP3304014A1

公开(公告)日：2018-04-11

申请号：EP16804077.2

申请日：2016-05-26

Applicant: Rebellion Photonics, Inc.

Inventor： KESTER, Robert, Timothy ,  HAGEN, Nathan, Adrian

IPC: G01J3/02 ,  G01J3/28 ,  G01J3/32 ,  G02B13/14 ,  G06K9/46

CPC classification number: G01N33/0044 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0286 ,  G01J3/2803 ,  G01J3/2823 ,  G01J3/32 ,  G01J3/36 ,  G01J3/42 ,  G01J5/0014 ,  G01J5/0806 ,  G01J5/0809 ,  G01J5/0896 ,  G01J5/522 ,  G01J5/602 ,  G01J2003/1247 ,  G01J2003/2826 ,  G01J2003/2869 ,  G01J2005/0077 ,  G01J2005/604 ,  G01N21/3504 ,  G01N2021/3531 ,  H04N5/2254 ,  H04N5/33 ,  H04N17/002

Abstract: Various embodiments disclosed herein describe an infrared (IR) imaging system for detecting a gas. The imaging system can include an optical filter that selectively passes light having a wavelength in a range of 1585 nm to 1595 nm while attenuating light at wavelengths above 1600 nm and below 1580 nm. The system can include an optical detector array sensitive to light having a wavelength of 1590 that is positioned rear of the optical filter.

公开(公告)号：EP3290880A1

公开(公告)日：2018-03-07

申请号：EP16786366.1

申请日：2016-04-19

Applicant: Hamamatsu Photonics K.K.

Inventor： HIROSE Masaki ,  SHIBAYAMA Katsumi ,  KASAHARA Takashi ,  KAWAI Toshimitsu ,  YASHIRO Takehiko ,  MINENO Mitsushi ,  SUZUKI Shigeru

IPC: G01J3/26 ,  G02B5/28 ,  G02B26/00

CPC classification number: G01J3/26 ,  G01J3/0286 ,  G01J3/0291 ,  G01J5/0225 ,  G01J5/024 ,  G01J5/045 ,  G01J5/046 ,  G01J5/06 ,  G01J5/0862 ,  G01J5/10 ,  G01J2005/068 ,  G02B5/284 ,  G02B7/008 ,  G02B26/001

Abstract: A light detection device 1A includes a Fabry-Perot interference filter 10, a light detector 3, a spacer 4 that has a placement surface on which a portion outside a light transmission region 11 in a bottom surface of the interference filter 10 is placed, and an adhesive member 5 that adheres the interference filter 10 and the spacer 4 to each other. Elastic modulus of the adhesive member 5 is smaller than elastic modulus of the spacer 4. At least a part of a lateral surface of the interference filter 10 is located on the placement surface such that a part of the placement surface of the spacer 4 is disposed outside the lateral surface. The adhesive member 5 is disposed in a corner portion formed by the lateral surface of the interference filter 10 and the part of the placement surface of the spacer 4 and contacts each of the lateral surface and the part of the placement surface.

Abstract translation: 光检测装置1A具备：法布里珀罗干涉滤光片10，光检测器3，具有放置干涉滤光片10的底面的光透射区域11的外侧的载置面的隔离物4， 将干涉滤波器10和间隔物4粘接的粘接部件5。 粘接部件5的弹性模量比间隔件4的弹性模量小。干涉滤光片10的侧面的至少一部分位于载置面上，以使间隔件4的载置面的一部分配置 在外表面之外。 粘接构件5配置在由干涉滤波器10的侧面和间隔物4的载置面的一部分形成的角部，并与该载置面的侧面和一部分接触。

公开(公告)号：EP3246677A3

公开(公告)日：2018-02-07

申请号：EP17171896.8

申请日：2017-05-19

Applicant: H & P Trading GmbH

Inventor： Hochwarter, Erwin ,  Hochwarter, Michael ,  Hochwarter, Markus ,  Größwang, Heinz

IPC: G01J3/50 ,  G01J3/52 ,  G01N21/47 ,  G01J3/02 ,  G06K9/00

CPC classification number: G01J3/501 ,  G01J3/0202 ,  G01J3/0264 ,  G01J3/0272 ,  G01J3/0286 ,  G01J3/0291 ,  G01J3/0297 ,  G01J3/50 ,  G01J3/504 ,  G01J3/524 ,  G01N21/474 ,  G01N21/4785 ,  G01N2021/4711 ,  G06K2009/0059

Abstract: Die Erfindung betrifft ein Verfahren zur Ermittlung zumindest einer Prüfeigenschaft eines Prüfgegenstands und eine Messvorrichtung, welche geeignet ist, ein Messfeld (3) unter einer Vielzahl an Anstrahlungskombinationen aus Einstrahlungswinkel (α) und/oder Wellenlängenbereich (A) mit elektromagnetischer Strahlung (5) anzustrahlen und die Intensität der jeweils von dem Messfeld unter zumindest einem Abstrahlungswinkel (β) remittierten elektromagnetischen Strahlung (5) zu messen. Die Prüfeigenschaft weist zumindest ein definiertes messbares Einzelmerkmal auf, wobei das Einzelmerkmal oder eine definierte Merkmalskombination mehrerer solcher Einzelmerkmale die Herkunft und/oder Identität des Prüfgegenstandes (1) belegt, wobei das Einzelmerkmal oder die Merkmalskombination messbar ist, wenn sie durch die elektromagnetische Strahlung (5) auf eine durch eine Auswahl an Anstrahlungkombinationen definierte Art und Weise optisch angeregt wird. Das Einzelmerkmal oder die Merkmalskombination wird mit der Messvorrichtung (4) in dieser Art und Weise angeregt und gemessen.

Abstract translation: 本发明涉及一种用于确定至少一个Prüfeigenschaft一个测试对象和一个测量装置，其能够测量区域（3）的用电磁辐射的多个照射角度（α）和/或波长范围（A）的Anstrahlungskombinationen中照亮的（5）和 以在至少一个发射角（β）减少的电磁辐射（5）下测量每个测量场的强度。 所述Prüfeigenschaft具有至少一个定义的可测量的单独的特征，其中，所述单独的特征或几个这样的个人特征的定义的特性组合是测试对象（1），其中，所述的单独特征或特征的组合是可测量的，如果它（通过电磁辐射5的起点和/或身份 ）以选择的辐射组合所限定的方式被光学激励。 以这种方式用测量装置（4）激励和测量单个特征或特征组合。

公开(公告)号：EP3241002A4

公开(公告)日：2018-01-10

申请号：EP15875303

申请日：2015-12-18

Applicant: TEKNOLOGIAN TUTKIMUSKESKUS VTT OY

Inventor： VARPULA AAPO ,  HOLMLUND CHRISTER ,  RISSANEN ANNA

IPC: G01J3/26 ,  B81B7/00 ,  G02B5/08 ,  G02B5/28 ,  G02B26/00

CPC classification number: G01J3/26 ,  B81B7/00 ,  G01J3/0286 ,  G01J3/0297 ,  G02B5/0825 ,  G02B5/284 ,  G02B27/142

Abstract: A mirror plate (100) for a Fabry-Perot interferometer (300) comprises: - a substrate (50), which comprises silicon (Si), - a semi-transparent reflective coating (110) implemented on the substrate (50), - a de-coupling structure (DC1) formed on the substrate (50), - a first sensor electrode (G1a) formed on top of the de-coupling structure (DC1), and - a second sensor electrode (G1b), wherein the de-coupling structure (DC1) comprises an electrically insulating layer (60a), and a first stabilizing electrode (G0a), which is located between the first sensor electrode (G1a) and the substrate (50).