公开(公告)号：US20140253160A1

公开(公告)日：2014-09-11

申请号：US14352043

申请日：2011-10-19

Applicant: Matthias Brunner

Inventor： Matthias Brunner

IPC: G01R1/02

CPC classification number: G01R1/02 ,  G01R31/01 ,  G09G3/006

Abstract: An apparatus for testing of a plurality of electronic devices on a flexible substrate is described. The apparatus includes at least two rollers (110) configured for guiding the flexible substrate (10) into a testing area along transport direction, at least one prober (122) configured for electrically contacting one or more of the electronic devices, at least one probing support (124) configured for supporting a portion of the flexible substrate during electrical contact with the at least one prober, and a test device for functional testing of one or more of the electronic devices.

Abstract translation: 描述了一种用于在柔性基板上测试多个电子装置的装置。 该设备包括至少两个辊子（110），其构造成用于将柔性基板（10）沿传送方向引导到测试区域中，至少一个探测器（122）被配置用于电接触一个或多个电子设备，至少一个探测 支撑件（124），其被配置为在与所述至少一个探测器电接触期间支撑所述柔性基板的一部分;以及测试装置，用于一个或多个所述电子设备的功能测试。

公开(公告)号：US08222911B2

公开(公告)日：2012-07-17

申请号：US12296055

申请日：2007-04-04

Applicant: Bernhard Gunter Mueller ,  Ralf Schmid ,  Matthias Brunner

Inventor： Bernhard Gunter Mueller ,  Ralf Schmid ,  Matthias Brunner

IPC: G01R31/305

CPC classification number: G02F1/1309 ,  G02F2001/136254

Abstract: The present invention relates to a device for testing an optoelectronic module, comprising a first source for generating an electromagnetic beam or particle beam, a second source for illuminating the optoelectronic module; and a detector. In addition, a method for testing an optoelectronic module is provided comprising illuminating the optoelectronic module, directing an electromagnetic beam or particle beam and detecting defects in the optoelectronic module. The illumination additional to the electromagnetic beam or particle beam makes defects visible which otherwise would not be detected.

Abstract translation: 本发明涉及一种用于测试光电子模块的装置，包括用于产生电磁束或粒子束的第一源，用于照亮光电子模块的第二源; 和检测器。 此外，提供了一种用于测试光电子模块的方法，包括照亮光电子模块，引导电磁束或粒子束并检测光电子模块中的缺陷。 附加到电磁波束或粒子束的照明使缺陷可见，否则将不会被检测到。

公开(公告)号：US08220825B2

公开(公告)日：2012-07-17

申请号：US12438912

申请日：2007-08-22

Applicant: Frank Bonarens ,  Dietmar Breidert ,  Matthias Brunner ,  Benjamin De Buysscher ,  Johannes Diehl ,  Mathias Grube ,  Waldemar Medla

Inventor： Frank Bonarens ,  Dietmar Breidert ,  Matthias Brunner ,  Benjamin De Buysscher ,  Johannes Diehl ,  Mathias Grube ,  Waldemar Medla

IPC: B60R21/20

CPC classification number: B60R21/213 ,  B60R21/232 ,  F16B37/043 ,  Y10T29/49963

Abstract: A method is provided for fastening an airbag to a motor vehicle, that includes, but is not limited to the steps of fastening an airbag, which can be filled with a gas and which has a fastening tab, to a fastening device which comprises a plate and a clip device fastened to the plate and the plate comprises a first plate section with a first opening having a screw thread and a second plate section, and the clip device is fastened on the first plate section, and the airbag is fastened to the fastening device by bending the second plate section in such a manner that the first plate section and the second plate section at least partially enclose the fastening tab on both sides. A fastening device is also provided for an airbag, an airbag, and a motor vehicle.

Abstract translation: 提供一种用于将气囊紧固到机动车辆的方法，其包括但不限于将可以填充有气体并且具有紧固突片的气囊紧固到紧固装置的步骤，所述紧固装置包括板 以及固定在所述板上的夹子装置，所述板包括具有第一开口的第一板部分，所述第一开口具有螺纹和第二板部分，所述夹紧装置紧固在所述第一板部分上，并且所述气囊被紧固到所述紧固件 该装置通过使第二板部分弯曲成使得第一板部分和第二板部分至少部分地围绕两侧的紧固片。 还设置有用于气囊，气囊和机动车辆的紧固装置。

公开(公告)号：US08009299B2

公开(公告)日：2011-08-30

申请号：US11813334

申请日：2006-01-05

Applicant: Matthias Brunner ,  Ralf Schmid ,  Bernhard Mueller ,  Axel Wenzel

Inventor： Matthias Brunner ,  Ralf Schmid ,  Bernhard Mueller ,  Axel Wenzel

IPC: G01B11/14

CPC classification number: G09G3/006 ,  G01R31/305 ,  G01R31/308 ,  G01R35/005 ,  H01J2237/2826

Abstract: The invention relates to a method of calibration of the beam position of a corpuscular beam. A calibration body with structures is used, wherein the structures have a structure period PS in the plain section and within each structure there is a position L intended for the measurement. For the calibration, at least one detection signal each at structures in the plain section of the calibration body is generated, wherein the corpuscular beam is deflected with deflectors on beam target positions L1 with the beam target period P1, which is larger than half of the structure period PS, whereby a basic calibration is used for the control of the deflectors, and wherein the beam target deflections deviate either in the beam target period P1 from the structure period PS and/or in the beam target position L1 from the position L.

Abstract translation: 本发明涉及一种校准红细胞束的束位置的方法。 使用具有结构的校准体，其中结构在平坦部分中具有结构周期PS，并且在每个结构内具有用于测量的位置L. 对于校准，生成校准体的平坦部分中的结构处的至少一个检测信号，其中，粒子束在束目标位置L1上被偏转器偏转，其中光束目标周期P1大于 结构周期PS，由此使用基准校准来控制偏转器，并且其中光束目标偏转在光束目标周期P1中与结构周期PS和/或从位置L的光束目标位置L1偏离。

公开(公告)号：US07973546B2

公开(公告)日：2011-07-05

申请号：US12826635

申请日：2010-06-29

Applicant: Fayez E. Abboud ,  Sriram Krishnaswami ,  Benjamin M. Johnston ,  Hung T. Nguyen ,  Matthias Brunner ,  Ralf Schmid ,  John M. White ,  Shinichi Kurita ,  James C. Hunter

Inventor： Fayez E. Abboud ,  Sriram Krishnaswami ,  Benjamin M. Johnston ,  Hung T. Nguyen ,  Matthias Brunner ,  Ralf Schmid ,  John M. White ,  Shinichi Kurita ,  James C. Hunter

IPC: G01R31/302 ,  G01R31/305

CPC classification number: H01L21/67748 ,  H01J2237/2811 ,  H01J2237/2817 ,  H01L21/67201 ,  H01L21/67236

Abstract: A method for testing a plurality of electronic devices formed on a large area substrate is described. In one embodiment, the method includes transferring a substrate on an end effector relative to a testing platform having a plurality of testing columns coupled thereto, the substrate having a plurality of electronic devices located thereon, and moving the substrate in a single directional axis relative to an optical axis of each of the plurality of testing columns, the single directional axis being substantially orthogonal to the optical axis to define a test area on the substrate, wherein the test area is configured to cover an entire length or an entire width of the substrate such that the testing columns are capable of testing the entire substrate as the substrate is moved through the test area.

Abstract translation: 描述了用于测试形成在大面积基板上的多个电子设备的方法。 在一个实施例中，所述方法包括相对于具有耦合到其上的多个测试柱的测试平台在端部执行器上传送衬底，所述衬底具有位于其上的多个电子器件，并且相对于 所述多个测试列中的每一个的光轴，所述单方向轴基本上垂直于所述光轴，以在所述衬底上限定测试区域，其中所述测试区域被配置为覆盖所述衬底的整个长度或整个宽度 使得当衬底移动通过测试区域时，测试柱能够测试整个衬底。

公开(公告)号：US07602199B2

公开(公告)日：2009-10-13

申请号：US11746515

申请日：2007-05-09

Applicant: Benjamin M. Johnston ,  Sriram Krishnaswami ,  Hung T. Nguyen ,  Matthias Brunner ,  Yong Liu

Inventor： Benjamin M. Johnston ,  Sriram Krishnaswami ,  Hung T. Nguyen ,  Matthias Brunner ,  Yong Liu

IPC: G01R31/02 ,  G01R31/00 ,  G01R31/26 ,  G01R31/28 ,  G02F1/133

CPC classification number: G01R31/2808 ,  G09G3/006

Abstract: An apparatus and method for testing large area substrates is described. The large area substrates include patterns of displays and contact points electrically coupled to the displays. The apparatus includes a prober assembly that is movable relative to the large area substrate and may be configured to test various patterns of displays and contact points. The prober assembly is also configured to test fractional sections of the large area substrate. The apparatus also includes a test chamber configured to store at least two prober assemblies within an interior volume.

Abstract translation: 描述了用于测试大面积基板的装置和方法。 大面积基板包括电连接到显示器的显示器和接触点的图案。 该装置包括可相对于大面积基板移动的探测器组件，并且可以被配置为测试各种显示和接触点的图案。 探测器组件还被配置成测试大面积衬底的分数段。 该装置还包括被配置为在内部容积内存储至少两个探测器组件的测试室。

公开(公告)号：US07256606B2

公开(公告)日：2007-08-14

申请号：US10977510

申请日：2004-10-29

Applicant: Axel Wenzel ,  Ralf Schmid ,  Matthias Brunner

Inventor： Axel Wenzel ,  Ralf Schmid ,  Matthias Brunner

IPC: G01R31/00 ,  G01R31/307

CPC classification number: G01N23/2251 ,  G02F2001/136254

Abstract: The present invention provides a method of electron beam testing of liquid crystal displays comprising non-uniform electrodes having a conductive portion and a dielectric portion. In accordance with methods of the present invention, the diameter of the electron beam is increased so that the beam is less focused, i.e., enlarged or “blurred,” over a non-uniform electrode area. The diameter of the beam is increased so that the beam generates secondary electrons from the conductive portion of the non-uniform electrode area. The configured test beam may be circular, elliptical, or other suitable shapes.

Abstract translation: 本发明提供了包括具有导电部分和电介质部分的不均匀电极的液晶显示器的电子束测试方法。 根据本发明的方法，电子束的直径增加，使得光束在非均匀电极区域上聚焦较少，即扩大或“模糊”。 光束的直径增加，使得光束从非均匀电极区域的导电部分产生二次电子。 配置的测试光束可以是圆形，椭圆形或其他合适的形状。

公开(公告)号：US20060022694A1

公开(公告)日：2006-02-02

申请号：US10901936

申请日：2004-07-29

Applicant: Matthias Brunner ,  Shinichi Kurita ,  Wendell Blonigan ,  Edgar Kehrberg

Inventor： Matthias Brunner ,  Shinichi Kurita ,  Wendell Blonigan ,  Edgar Kehrberg

IPC: G01R31/26

CPC classification number: H01J37/185 ,  G01R31/2886 ,  H01J2237/204

Abstract: A method and system for testing one or more large substrates are provided. In one or more embodiments, the system includes a testing chamber having a substrate table disposed therein. The substrate table is adapted to move a substrate within the testing chamber in various directions. More particularly, the substrate table includes a first stage movable in a first direction, and a second stage movable in a second direction, wherein each of the stages moves in an X-direction, Y-direction or both X and Y directions. The system further includes a load lock chamber at least partially disposed below the testing chamber, and a transfer chamber coupled to the load lock chamber and the testing chamber. In one or more embodiments, the transfer chamber includes a robot disposed therein which is adapted to transfer substrates between the load lock chamber and the testing chamber.

Abstract translation: 提供了用于测试一个或多个大基板的方法和系统。 在一个或多个实施例中，系统包括具有设置在其中的衬底台的测试室。 衬底台适于在各个方向上移动测试室内的衬底。 更具体地，衬底台包括可在第一方向上移动的第一阶段和沿第二方向移动的第二阶段，其中每个阶段沿X方向，Y方向或X方向和Y方向两者移动。 该系统还包括至少部分地设置在测试室下方的负载锁定室和耦合到负载锁定室和测试室的传送室。 在一个或多个实施例中，传送室包括设置在其中的机器人，其适于在载荷锁定室和测试室之间传送基板。

公开(公告)号：US20050212782A1

公开(公告)日：2005-09-29

申请号：US10518780

申请日：2003-06-18

Applicant: Matthias Brunner

Inventor： Matthias Brunner

IPC: G01R31/316 ,  G02F1/13 ,  G09F9/00 ,  G09G3/00 ,  G09G3/20 ,  G09G3/36 ,  G09G5/00

CPC classification number: G09G3/006 ,  G02F1/1309

Abstract: The invention relates to a drive electronics for driving a display with a matrix 101 of picture elements. The drive circuit 102x and 102y for generating signals for driving the pixels via control lines 103 is provided with signals at the input terminals 110 via contact areas 104. In addition to the contact areas used for the generation of arbitrary pictures, there exist contact areas 105 used within the framework of a testing method. These contact areas for the testing method are also connected with the input terminals 110 of the drive circuit and are used for generating a test pattern.

Abstract translation: 本发明涉及一种驱动电子装置，用于驱动具有像素矩阵101的显示器。 用于通过控制线103产生用于驱动像素的信号的驱动电路102x和102y通过接触区域104在输入端110处被提供有信号。 除了用于生成任意图片的接触区域之外，存在在测试方法的框架内使用的接触区域105。 用于测试方法的这些接触区域也与驱动电路的输入端子110连接，并用于产生测试图案。

公开(公告)号：US5268638A

公开(公告)日：1993-12-07

申请号：US882657

申请日：1992-05-13

Applicant: Matthias Brunner ,  Reinhold Schmitt

Inventor： Matthias Brunner ,  Reinhold Schmitt

IPC: G01R31/02 ,  G01R31/302 ,  G01R31/305 ,  G01R31/308 ,  G02F1/136 ,  G02F1/1362 ,  G02F1/1368 ,  G09F9/35 ,  G09G3/18 ,  G01R31/00

CPC classification number: G01R31/305 ,  G01R31/302 ,  G01R31/308 ,  G02F2001/136254

Abstract: Method for particle beam testing of substrates for liquid crystal displays (LCD). This invention is directed to methods wherein, given a substrate (SUB1) for a liquid crystal display, either potentials or, respectively, currents are set in defined fashion with a particle beam (S1, S2 and S4) and/or potentials are measured by detecting secondary electrons (S5) at different switch statuses of the switch elements (T) of the substrate (SUB1). The geometrical integrity and the electrical functionability of the substrate (SUB1) are thereby tested, even though, for example, a supplementary plane electrode is not present for forming a capacitor. An important advantage of the method is that faulty substrates can be repaired or can be segregated even before further-processing and, thus, costs can be reduced.

Abstract translation: 液晶显示器（LCD）基板的粒子束测试方法。 本发明涉及一种方法，其中给定用于液晶显示器的衬底（SUB1），电势或电流分别以粒子束（S1，S2和S4）定义为电流，和/或电位通过 在衬底（SUB1）的开关元件（T）的不同开关状态下检测二次电子（S5）。 因此，即使例如辅助平面电极不存在用于形成电容器，也可以测试基板（SUB1）的几何完整性和电功能性。 该方法的一个重要优点是，即使在进一步处理之前，有缺陷的基板可以被修复或者可以被分离，因此可以降低成本。