Electronic component casing
    2.
    发明授权
    Electronic component casing 有权
    电子元件套管

    公开(公告)号:US09247677B2

    公开(公告)日:2016-01-26

    申请号:US13698843

    申请日:2011-04-20

    IPC分类号: H05K7/20

    摘要: An electronic component casing includes: an inclined portion that projects from an upper surface so as to increase in height gradually from one side; a step portion that descends as a continuation of an upper end of the inclined portion or descends via a plane connected to the upper end; and a planar portion connected to a lower end of the step portion.

    摘要翻译: 电子部件壳体包括:倾斜部分,其从上表面突出以便从一侧逐渐增加高度; 台阶部分,其作为倾斜部分的上端的延续部分下降,或者经由与上端连接的平面下降; 以及连接到台阶部的下端的平面部。

    Electron microscope
    6.
    发明授权
    Electron microscope 失效
    电子显微镜

    公开(公告)号:US5289005A

    公开(公告)日:1994-02-22

    申请号:US891510

    申请日:1992-05-29

    IPC分类号: H01J37/20

    CPC分类号: H01J37/20 H01J2237/24415

    摘要: An electron microscope capable of performing accurate X-ray analysis. A specimen stage on which a specimen to be investigated is placed, is disposed between the upper and lower magnetic pole pieces of the objective lens. The specimen is irradiated with the electron beam to detect X-rays emitted from the specimen. The specimen stage consists of a light element, such as beryllium, that produces a very small amount of X-rays when irradiated with the electron beam. A metal film of a heavy element, such as gold, is deposited on the upper surface of the specimen stage. This metal film produces a large amount of X-rays when irradiated with the electron beam. The X-rays emitted from the lower magnetic pole piece are absorbed by the metal film. Consequently, the X-ray detector of the microscope detects only the X-rays produced from the specimen.

    摘要翻译: 能够进行精确X射线分析的电子显微镜。 放置试样的样品台设置在物镜的上下磁极片之间。 用电子束照射样品以检测从样品发射的X射线。 样品台由诸如铍的轻元素组成,当用电子束照射时产生非常少量的X射线。 重金属的金属膜,例如金,沉积在样品台的上表面上。 当用电子束照射时,该金属膜产生大量的X射线。 从下磁极片发射的X射线被金属膜吸收。 因此,显微镜的X射线检测器仅检测从样品产生的X射线。

    TEM sample equipped with an identifying function, focused ion beam device for processing TEM sample, and transmission electron microscope
    7.
    发明授权
    TEM sample equipped with an identifying function, focused ion beam device for processing TEM sample, and transmission electron microscope 有权
    具有识别功能的TEM样品,用于处理TEM样品的聚焦离子束装置和透射电子显微镜

    公开(公告)号:US07095024B2

    公开(公告)日:2006-08-22

    申请号:US10828001

    申请日:2004-04-20

    IPC分类号: H01J37/26 H01J37/304

    摘要: The problem of the present invention is to provide a TEM sample equipped with an identifying function for easily specifying a detailed TEM sample and to provide a system for handling the management of information relating to the TEM sample using the TEM when making observations that is constructed with the FIB device manufacturing the sample. The TEM sample of the present invention is written with a mark encoding information specifying the sample at a specified location of a peripheral part. Information relating to the sample filed taking sample specifying information as an index is supplied to a TEM as associated matter. The sample working FIB device and observation TEM device of the present invention are provided with a function enabling writing of information relating to the sample and images to the file during operation which is then read out and utilized on a display.

    摘要翻译: 本发明的问题是提供一种具有识别功能的TEM样品,用于容易地指定详细的TEM样品,并提供一个系统,用于当进行观察时使用TEM处理与TEM样品有关的信息的管理, FIB设备制造样品。 本发明的TEM样品用指定样品在周边部分的指定位置处的标记编码信息进行写入。 以采样指定信息为索引的样本提供的信息作为关联事项提供给TEM。 本发明的样品工作FIB装置和观察TEM装置具有能够在操作期间将关于样品和图像的信息写入文件的功能,然后在显示器上读出并利用该功能。

    Specimen-holding device for electron microscope
    9.
    发明授权
    Specimen-holding device for electron microscope 失效
    电子显微镜样品保持装置

    公开(公告)号:US5406087A

    公开(公告)日:1995-04-11

    申请号:US183149

    申请日:1994-01-18

    摘要: There is disclosed a simple specimen-holding device for use with an electron microscope. The device comprises a pair of films which transmit the electron beam. The films are reinforced with a network of reinforcing members and placed on a specimen stage. A specimen to be investigated is held in a thin space formed between the films, together with moisture. The fringes of the films are compressed together to hermetically isolate the space between the films from the specimen chamber of the microscope which is evacuated. The electron beam passes through the thin space sandwiched between the films. This permits the specimen to be observed in an almost unmodified state with little damage to the specimen.

    摘要翻译: 公开了一种用于电子显微镜的简单的标本保持装置。 该装置包括一对透射电子束的膜。 薄膜用加强件网络加固并放置在样品台上。 要研究的样品保持在薄膜之间形成的薄薄空间以及水分。 膜的条纹被压缩在一起,以将隔离空间的膜与被抽出的显微镜的样品室隔开。 电子束通过夹在膜之间的薄空间。 这允许在几乎未改变的状态下观察样品,对样品几乎没有损伤。

    Specimen-driving apparatus for electron microscope which tilts and
translates while preventing contact damage
    10.
    发明授权
    Specimen-driving apparatus for electron microscope which tilts and translates while preventing contact damage 失效
    用于电子显微镜的样品驱动装置,其在防止接触损伤的同时倾斜和平移

    公开(公告)号:US5264705A

    公开(公告)日:1993-11-23

    申请号:US862528

    申请日:1992-04-02

    IPC分类号: G01Q30/02 G01Q30/20 H01J37/20

    CPC分类号: H01J37/20

    摘要: A specimen-driving apparatus used with an electron microscope. The apparatus can translate or tilt the specimen holder while preventing it from being damaged if a human operator performs any erroneous operation. The device has X, Y, Z translation directive devices, and a tilt directive device for permitting the operator to enter instructions for translating and tilting the specimen holder. A contact detector senses that the holder is in contact with the upper magnetic pole piece. A tilt condition decision portion determines whether the holder has tilted into the positive or negative domain. A Z domain decision portion determines whether the Z coordinate of the holder lies in the positive or negative domain. When the contact of the holder with the pole piece is detected, reverse movement of the holder along the Z-axis is inhibited. Also, reverse tilting movement of the holder is inhibited. When the holder comes out of contact with the pole piece, these reverse movements are permitted.

    摘要翻译: 用电子显微镜使用的试样驱动装置。 如果操作人员执行任何错误的操作,该装置可以平移或倾斜试样架,同时防止其受损。 该装置具有X,Y,Z平移指示装置和倾斜指令装置,用于允许操作者输入用于平移和倾斜试样架的指令。 接触检测器感测到保持器与上磁极片接触。 倾斜条件决定部分确定保持器是否已经倾斜到正或负域。 Z域决定部分确定持有者的Z坐标是否位于正或负域。 当保持器与极片的接触被检测到时,保持器沿Z轴的反向运动被抑制。 此外,保持器的反向倾斜运动被抑制。 当支架与极片脱离接触时,允许这些反向运动。