中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

16 records (took 0.023 seconds)

    METHODS FOR IN-PLANE STRAIN MEASUREMENT OF A SUBSTRATE
    4.
    发明申请
    METHODS FOR IN-PLANE STRAIN MEASUREMENT OF A SUBSTRATE 审中-公开
    基板的面内应变测量方法

    公开(公告)号：US20160363492A1

    公开(公告)日：2016-12-15

    申请号：US15154959

    申请日：2016-05-14

    Applicant: ARIZONA BOARD OF REGENTS ON BEHALF OF ARIZONA STATE UNIVERSITY

    Inventor： Hongbin Yu ,  Hanqing Jiang ,  Hanshuang Liang ,  Teng Ma

    IPC: G01L1/24

    CPC classification number: G01L1/241 ,  G01L1/00 ,  G01L1/24 ,  H01L22/12 ,  Y10T428/24446

    Abstract: Methods for measuring and/or mapping in-plane strain of a surface of a substrate. A grating is formed on at least a portion of the surface of the substrate. A laser is then used focused onto the grating to determine the strain on the surface by determining the variation of the grating wavelength due to the strain on the surface. The strain information is essentially carried by the grating, in terms of grating wavelength, because it varies according to the volume change of the underlying substrates. By scanning the surface grating with the small laser size, a high resolution strain map of the surface can be produced. The induced strain is related to the grating wavelength variation, which leads to the diffraction angle variation that is captured by the strain sensing measurements.

    Abstract translation: 用于测量和/或映射衬底表面的面内应变的方法。 在基板表面的至少一部分上形成光栅。 然后将激光器聚焦到光栅上，以通过确定由于表面上的应变引起的光栅波长的变化来确定表面上的应变。 根据光栅波长，应变信息基本上由光栅承载，因为它根据下面的基底的体积变化而变化。 通过以小的激光尺寸扫描表面光栅，可以产生表面的高分辨率应变图。 感应应变与光栅波长变化有关，这导致了应变感测测量所捕获的衍射角变化。

    Methods for in-plane strain measurement of a substrate
    8.
    发明授权
    Methods for in-plane strain measurement of a substrate 有权

    公开(公告)号：US10139295B2

    公开(公告)日：2018-11-27

    申请号：US15154959

    申请日：2016-05-14

    Applicant: ARIZONA BOARD OF REGENTS ON BEHALF OF ARIZONA STATE UNIVERSITY

    Inventor： Hongbin Yu ,  Hanqing Jiang ,  Hanshuang Liang ,  Teng Ma

    IPC: G01L1/24 ,  G01L1/00 ,  H01L21/66

    Abstract: Methods for measuring and/or mapping in-plane strain of a surface of a substrate. A grating is formed on at least a portion of the surface of the substrate. A laser is then used focused onto the grating to determine the strain on the surface by determining the variation of the grating wavelength due to the strain on the surface. The strain information is essentially carried by the grating, in terms of grating wavelength, because it varies according to the volume change of the underlying substrates. By scanning the surface grating with the small laser size, a high resolution strain map of the surface can be produced. The induced strain is related to the grating wavelength variation, which leads to the diffraction angle variation that is captured by the strain sensing measurements.

    Three-dimensional soft electrode for lithium metal batteries
    10.
    发明授权
    Three-dimensional soft electrode for lithium metal batteries 有权

    公开(公告)号：US11342563B2

    公开(公告)日：2022-05-24

    申请号：US16614067

    申请日：2018-04-13

    Applicant: ARIZONA BOARD OF REGENTS ON BEHALF OF ARIZONA STATE UNIVERSITY

    Inventor： Hanqing Jiang ,  Wei Zeng ,  Xu Wang

    IPC: H01M4/80 ,  H01M4/134 ,  H01M4/1395 ,  H01M4/38 ,  H01M4/66 ,  H01M4/02

    Abstract: An electrode includes a soft substrate, a metal layer in direct contact with the soft substrate, and a lithium layer formed directly on the metal layer, wherein the metal layer comprises wrinkles. The wrinkles are of a substantially uniform height, and the height is in a range of 100 nm to 20 μm. The wrinkles are typically separated by a substantially uniform distance, and the distance is in a range of 100 nm to 1000 μm. The wrinkles may be one dimensional or two dimensional. Fabricating an electrode includes forming a metal layer on a soft substrate, and forming a lithium layer on the metal layer. Forming the lithium layer on the metal layer yields uniform wrinkles in the metal layer. A battery may include the electrode as described.

Patent Agency Ranking