IMAGE SENSOR AND MANUFACTURING METHOD THEREOF

    公开(公告)号:US20240243159A1

    公开(公告)日:2024-07-18

    申请号:US18535731

    申请日:2023-12-11

    CPC classification number: H01L27/14649 H01L27/14636 H01L27/14683

    Abstract: The present disclosure relates to an image sensor including a silicon substrate having a first conductivity type, and a read out integrated circuit (ROIC) and a photodetector disposed on the silicon substrate. The ROIC and the photodetector are spaced apart from each other in a first direction parallel to a top surface of the silicon substrate. The photodetector includes a first germanium pattern having the first conductivity type and a semiconductor pattern having a second conductivity type different from the first conductivity type, which are laminated in a direction perpendicular to the top surface of the silicon substrate. The first germanium pattern contacts the silicon substrate.

    GERMANIUM-ON-INSULATOR SUBSTRATE AND METHOD FOR FORMING THE SAME
    9.
    发明申请
    GERMANIUM-ON-INSULATOR SUBSTRATE AND METHOD FOR FORMING THE SAME 审中-公开
    绝缘体绝缘体基板及其形成方法

    公开(公告)号:US20160260805A1

    公开(公告)日:2016-09-08

    申请号:US15056660

    申请日:2016-02-29

    Abstract: Provided is a germanium-on-insulator substrate. The germanium-on-insulator substrate includes a bulk silicon substrate, an oxide film which is disposed on the bulk silicon substrate and has a first region exposing a portion of the bulk silicon substrate, a silicon layer which covers a portion of the top surface of the oxide film and does not cover the first region, a germanium layer which contacts the bulk silicon substrate exposed through the first region and is disposed on the oxide film, and an insulating layer which covers the oxide film and the silicon layer and exposes the top surface of the germanium layer.

    Abstract translation: 提供绝缘体上的锗基板。 绝缘体上的衬底包括体硅衬底,氧化膜,其设置在体硅衬底上并且具有暴露本体硅衬底的一部分的第一区域;覆盖顶部表面的一部分的硅层; 氧化膜并且不覆盖第一区域,接触通过第一区域暴露的体硅衬底并设置在氧化物膜上的锗层,以及覆盖氧化物膜和硅层并暴露顶部的绝缘层 锗层的表面。

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