Apparatus for processing a substrate providing an efficient arrangement
and atmospheric isolation of chemical treatment section
    1.
    发明授权
    Apparatus for processing a substrate providing an efficient arrangement and atmospheric isolation of chemical treatment section 失效
    用于处理衬底的装置,其提供化学处理部分的有效布置和大气隔离

    公开(公告)号:US6099643A

    公开(公告)日:2000-08-08

    申请号:US993284

    申请日:1997-12-18

    IPC分类号: H01L21/00 B05C13/00

    摘要: An atmospheric conditioning unit for supplying temperature- and humidity-controlled air to a chemical processing part (spin coater) is arranged immediately above a chemical processing part, between this chemical processing part and a heat treatment part (including a hot plate and a cool plate). Namely, the chemical processing part, the atmospheric conditioning unit and the heat treatment part are vertically arranged in a stacked manner. The atmospheric conditioning unit receives external air from an opening. A closed partition is provided to block air flow between the atmospheric conditioning unit and a transport area. The temperature- and humidity-controlled air supplied from the atmospheric conditioning unit to the spin coater forms a downflow in the spin coater, and thereafter rises through an opening and joins with the air flowing from the opening, to be introduced into the atmospheric conditioning unit again and reused.

    摘要翻译: 用于向化学处理部件(旋转涂布机)供给温度和湿度控制的空气的大气调节单元布置在化学处理部件的正上方,该化学处理部件和热处理部件(包括热板和冷却板 )。 也就是说,化学处理部分,大气调节单元和热处理部分以堆叠的方式垂直布置。 大气调节装置从开口接收外部空气。 提供一个封闭的隔板以阻挡大气调节单元和运输区域之间的空气流动。 从大气调节单元向旋转涂布机供应的温度和湿度控制的空气在旋转涂布机中形成向下流动,然后通过开口上升并与从开口流出的空气接合,以引入大气调节单元 再次重复使用。

    Substrate processing apparatus
    2.
    发明授权
    Substrate processing apparatus 失效
    基板加工装置

    公开(公告)号:US5963753A

    公开(公告)日:1999-10-05

    申请号:US9100

    申请日:1998-01-20

    摘要: A substrate processing apparatus comprises a first substrate transfer unit having a first transfer path and a second substrate transfer unit having a second transfer path. A spin coating unit and a spin developing unit are arranged along the first transfer path, and a substrate cassette is arranged along the second transfer path. A substrate transport robot of the second substrate transfer unit selectively introduces a substrate received from a substrate transport robot of the first substrate transfer unit in one of external exposure apparatuses arranged on both end portions of the second transfer path, and discharges the substrate from the exposure apparatus for transfering the same to the substrate transport robot of the first substrate transfer unit. Thereby the substrate processing apparatus can avoid or relieve reduction of operational efficiency even if its throughput is different from that of an exposure apparatus.

    摘要翻译: 基板处理装置包括具有第一传送路径的第一基板传送单元和具有第二传送路径的第二基板传送单元。 旋转涂布单元和旋转显影单元沿着第一传送路径布置,并且沿着第二传送路径布置基板盒。 第二基板转印单元的基板输送机器人选择性地将从第一基板转印单元的基板输送机器人接收的基板引导到布置在第二输送路径的两端部的外部曝光装置中的一个,并从曝光中排出基板 用于将其传送到第一基板传送单元的基板输送机器人的装置。 因此,即使其处理量与曝光装置的吞吐量不同,也可以避免或减轻操作效率的降低。

    SUBSTRATE PROCESSING APPARATUS INCLUDING A SUBSTRATE REVERSING REGION
    3.
    发明申请
    SUBSTRATE PROCESSING APPARATUS INCLUDING A SUBSTRATE REVERSING REGION 审中-公开
    基板加工装置,包括反向区域的基板

    公开(公告)号:US20080196658A1

    公开(公告)日:2008-08-21

    申请号:US12031674

    申请日:2008-02-14

    IPC分类号: B05C11/00 B08B13/00

    摘要: A substrate processing apparatus that is arranged adjacent to an exposure device includes a processing section including a first processing unit and a second processing unit. The first processing unit includes a development region, a first cleaning region, and a first transport region. The development region and the first cleaning region are arranged opposite to each other with the first transport region interposed therebetween. The second processing unit includes a reversing region, a second cleaning region, and a second transport region. The reversing region and the second cleaning region are arranged opposite to each other with the second transport region interposed therebetween. The second processing unit is arranged between the first processing unit and the exposure device. The substrate processing apparatus also includes a transfer section coupled to the processing section and an interface configured to receive and transfer the substrate between the processing section and the exposure device.

    摘要翻译: 布置在曝光装置附近的基板处理装置包括具有第一处理单元和第二处理单元的处理部。 第一处理单元包括显影区域,第一清洁区域和第一输送区域。 显影区域和第一清洁区域彼此相对设置,其间插入有第一输送区域。 第二处理单元包括反转区域,第二清洁区域和第二输送区域。 反转区域和第二清洁区域彼此相对布置,其间插入第二输送区域。 第二处理单元布置在第一处理单元和曝光装置之间。 基板处理装置还包括耦合到处理部分的传送部分和被配置为在处理部分和曝光装置之间接收和传送基板的接口。

    Cleaning apparatus having a contact buffer apparatus
    5.
    发明授权
    Cleaning apparatus having a contact buffer apparatus 失效
    具有接触缓冲装置的清洗装置

    公开(公告)号:US4935981A

    公开(公告)日:1990-06-26

    申请号:US294196

    申请日:1989-01-06

    CPC分类号: H01L21/67046 H01L21/6838

    摘要: An improved swing type substrate cleaning apparatus comprises a substrate chuck for holding the substrate while rotating the same, a cleaning brush holding apparatus for holding a cleaning brush while rotating the same, a cleaning brush elevating apparatus for holding the cleaning brush holding apparatus in a manner enabling elevation and swing of the same, and a buffer apparatus for reducing the velocity at which the cleaning brush elevating apparatus lowers the cleaning brush holding apparatus when the cleaning brush is lowered to be in contact with the substrate. Since the velocity with which the cleaning brush is lowered is reduced to be lower than a prescribed value by means of the buffer apparatus, no significant shock is created when the cleaning brush is brought into contact with the substrate.

    摘要翻译: 一种改进的摆动式基板清洁装置,包括用于在旋转基板的同时保持基板的基板卡盘,用于在旋转清洁刷的同时保持清洁刷的清洁刷保持装置,用于以清洁刷保持装置保持的清洁刷升降装置 能够使其升降和摆动;以及缓冲装置,用于降低清洁刷升降装置降低清洁刷保持装置时的速度,当清洁刷降低以与基板接触时。 由于通过缓冲装置将清洁刷降低的速度降低到低于规定值,所以当清洁刷与基板接触时不会产生显着的冲击。

    Method and apparatus for the development of films in a photographic film
processor
    6.
    发明授权
    Method and apparatus for the development of films in a photographic film processor 失效
    用于在摄影胶片处理器中发展胶片的方法和装置

    公开(公告)号:US4312586A

    公开(公告)日:1982-01-26

    申请号:US155089

    申请日:1980-06-02

    申请人: Masami Ohtani

    发明人: Masami Ohtani

    IPC分类号: G03D3/06 G03D3/13

    摘要: This invention is concerned with a method and apparatus for the development of photographic films in a photographic film processor in which the films are developed when the exposed films pass through a developing tank containing developer. The object of said invention is to attain uniform development with a simple method, that is, to make the change of the activity of the developer during the development of the films to be treated very small from the leading end to the trailing end of the film. The said invention makes the influence of the momentarily changing activity of the developer in contact with the films as small as possible by compensating for the decrease of the activity due to the exhaustion of the developer by gradually increasing the immersion time of the films in the developer from the leading end toward the trailing end of the photographic films by gradually changing the relative level of the liquid surface when the films are fed into the developer.

    摘要翻译: 本发明涉及用于在照相胶片处理器中开发照相胶片的方法和装置,其中当曝光的胶片通过含有显影剂的显影槽时,显影胶片。 本发明的目的是通过简单的方法来实现均匀显影,即,使得待处理的膜的显影期间显影剂的活性从薄膜的前端到尾端变化很小 。 所述发明通过逐渐增加膜在显影剂中的浸渍时间来补偿由于显影剂耗尽而导致的活性降低,使得显影剂与膜接触的瞬时变化的影响尽可能小 通过在将膜馈送到显影剂中时逐渐改变液面的相对水平,从照相胶卷的前端到尾端。

    Vehicle air conditioning apparatus
    7.
    发明授权
    Vehicle air conditioning apparatus 失效
    车用空调机

    公开(公告)号:US4250956A

    公开(公告)日:1981-02-17

    申请号:US075482

    申请日:1979-09-14

    申请人: Masami Ohtani

    发明人: Masami Ohtani

    摘要: A temperature control door (27) controls air flow through a duct (12) and is positioned in accordance with the output of a sensor (41), (42). A slider (74) of a potentiometer (72) is connected to the door (27) so that the slider (74) is in a central position when the temperature control door (27) is in a central position. A switch (86) connects the slider (74) to one end of a resistance element (73) of the potentiometer (72) when the temperature control door (27) is on one side of the central position and the apparatus (11) is in a cooling mode and to the other end of the resistance element (73) of the potentiometer (72) when the temperature control door (27) is on the other side of the central position and the apparatus (11) is in a heating mode. The speed of a blower (16) which forces air through the duct (12) is controlled in accordance with the resistance of the potentiometer (72). A switch (87) controls the blower (16) to run a maximum speed when the apparatus (11) is in a maximum cooling mode.

    摘要翻译: 温度控制门(27)控制通过管道(12)的空气流并且根据传感器(41)的输出(42)定位。 电位器(72)的滑块(74)连接到门(27),使得当温度控制门(27)处于中心位置时,滑块(74)处于中心位置。 当温度控制门(27)位于中心位置的一侧时,开关(86)将滑块(74)连接到电位器(72)的电阻元件(73)的一端,并且设备(11)是 在温度控制门(27)处于中心位置的另一侧并且装置(11)处于加热模式时,处于冷却模式和电位计(72)的电阻元件(73)的另一端 。 根据电位器(72)的阻力来控制迫使空气通过管道(12)的鼓风机(16)的速度。 当设备(11)处于最大冷却模式时,开关(87)控制鼓风机(16)运行最大速度。

    SUBSTRATE PROCESSING APPARATUS WITH INTEGRATED CLEANING UNIT
    8.
    发明申请
    SUBSTRATE PROCESSING APPARATUS WITH INTEGRATED CLEANING UNIT 有权
    具有集成清洁单元的基板处理装置

    公开(公告)号:US20080198341A1

    公开(公告)日:2008-08-21

    申请号:US12031667

    申请日:2008-02-14

    IPC分类号: G03B27/52

    摘要: In a substrate processing apparatus, an indexer block, a resist film processing block, a cleaning/drying processing block, a development processing block, and an interface block are provided side by side in this order. An exposure device is arranged adjacent to the interface block. The exposure device subjects a substrate to exposure processing by means of a liquid immersion method. Substrate platforms are provided in close proximity one above the other between the cleaning/drying processing block and the development processing block for receiving and transferring the substrate therebetween. Reversing units that reverse one surface and the other surface of the substrate are respectively stacked above and below the substrate platforms.

    摘要翻译: 在基板处理装置中,按顺序并排设置分度器块,抗蚀剂膜处理块,清洁/干燥处理块,显影处理块和界面块。 曝光装置设置在接口块附近。 曝光装置通过液浸法对基板进行曝光处理。 在清洁/干燥处理块和用于在其间接收和转移基板的显影处理块之间彼此靠近地提供基板平台。 将基板的一个表面和另一个表面反转的反转单元分别堆叠在基板平台的上方和下方。

    Substrate processing apparatus and substrate processing method
    9.
    发明申请
    Substrate processing apparatus and substrate processing method 审中-公开
    基板加工装置及基板处理方法

    公开(公告)号:US20050204196A1

    公开(公告)日:2005-09-15

    申请号:US11078192

    申请日:2005-03-11

    IPC分类号: H01L21/02 G06F11/00 H01L21/00

    CPC分类号: H01L21/67253 H01L21/67276

    摘要: A moving image representing a maintenance method is reflected on a moving image display section in an operation panel. A worker can grasp the maintenance method by seeing the moving image displayed on the moving image display section. Consequently, maintenance can be performed in a short time and accurately in accordance with the moving image displayed on the moving image display section.

    摘要翻译: 表示维护方法的运动图像被反映在操作面板中的运动图像显示部分上。 工人可以通过看到运动图像显示部分上显示的运动图像来掌握维护方法。 因此,可以根据运动图像显示部分上显示的运动图像在短时间内准确地进行维护。

    Substrate processing apparatus, substrate inspection method and substrate processing system
    10.
    发明授权
    Substrate processing apparatus, substrate inspection method and substrate processing system 有权
    基板加工装置,基板检查方法及基板处理系统

    公开(公告)号:US06790287B2

    公开(公告)日:2004-09-14

    申请号:US09942153

    申请日:2001-08-29

    IPC分类号: C23C1600

    CPC分类号: H01L21/67207 H01L21/67253

    摘要: An inspection unit is provided in a substrate processing apparatus performing resist coating processing and development processing on a substrate. In the inspection unit, a film thickness measuring device, a line width measuring device, an overlay measuring device and a macro defect inspection device are successively stacked and arranged from below. The inspection unit is provided on an intermediate portion of a substrate transport path formed in the substrate processing apparatus. The substrate processed in the substrate processing apparatus is selectively introduced into each inspection part. Therefore, the apparatus can properly inspect the substrate at need while suppressing reduction of the throughput. Thus provided are a substrate processing apparatus and a substrate inspection method capable of properly inspecting a substrate while suppressing reduction of the throughput.

    摘要翻译: 在基板上进行抗蚀剂涂布处理和显影处理的基板处理装置中设置有检查单元。 在检查单元中,从下方依次堆叠并布置膜厚测量装置,线宽测量装置,覆盖测量装置和宏观缺陷检查装置。 检查单元设置在形成在基板处理装置中的基板输送路径的中间部。 将在基板处理装置中处理的基板选择性地导入各检查部。 因此,能够在抑制生产量的降低的同时适当地检查需要的基板。 这样提供了能够在抑制生产量降低的同时适当地检查基板的基板处理装置和基板检查方法。