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    SINGLE-ENDED SRAM WITH CROSS-POINT DATA-AWARE WRITE OPERATION
    3.
    发明申请
    SINGLE-ENDED SRAM WITH CROSS-POINT DATA-AWARE WRITE OPERATION 有权
    具有跨点数据写入操作的单端SRAM

    公开(公告)号：US20130194861A1

    公开(公告)日：2013-08-01

    申请号：US13562330

    申请日：2012-07-31

    申请人： Shyh-Jye Jou ,  Jhih-Yu Lin ,  Ching-Te Chuang ,  Ming-Hsien Tu ,  Yi-Wei Chiu

    发明人： Shyh-Jye Jou ,  Jhih-Yu Lin ,  Ching-Te Chuang ,  Ming-Hsien Tu ,  Yi-Wei Chiu

    IPC分类号： G11C11/00

    CPC分类号： G11C11/412

    摘要： A single-ended SRAM including at least one memory cell and a third switch is provided. The memory cell includes a data-latching unit, a first switch, a second switch and a data-transferring unit. The data-latching unit is configured for latching the received input data and provides a storage data and the inverse data of the storage data. The first switch transfers a reference data to the data-latching unit according to a first word-line signal. The second switch transfers the reference data to the data-latching unit according to a second word-line signal. The data-transferring unit decides whether or not to transfer the reference data to the bit-line according to the storage data and a control signal. The third switch receives the reference data and the control signal and transfers the reference data to the first switch, the second switch and the data-transferring unit according to the control signal.

    摘要翻译： 提供包括至少一个存储单元和第三开关的单端SRAM。 存储单元包括数据锁存单元，第一开关，第二开关和数据传送单元。 数据锁存单元被配置为锁存接收到的输入数据，并提供存储数据和存储数据的逆数据。 第一开关根据第一字线信号将参考数据传送到数据锁存单元。 第二开关根据第二字线信号将参考数据传送到数据锁存单元。 数据传送单元根据存储数据和控制信号决定是否将参考数据传送到位线。 第三开关接收参考数据和控制信号，并根据控制信号将参考数据传送到第一开关，第二开关和数据传送单元。

    Method for preventing an output device from being damaged
    4.
    发明授权
    Method for preventing an output device from being damaged 失效
    防止输出装置损坏的方法

    公开(公告)号：US07856108B2

    公开(公告)日：2010-12-21

    申请号：US11295665

    申请日：2005-12-07

    申请人： Yi-Wei Chiu ,  Cheng-I Chien

    发明人： Yi-Wei Chiu ,  Cheng-I Chien

    IPC分类号： H03G7/00 ,  H03G3/00 ,  H04R29/00

    CPC分类号： H03G7/007 ,  H04R3/007 ,  H04R2430/01

    摘要： The present invention relates to a method for preventing an output device from being damaged, which comprises the steps of: dividing the output value of an output device into a plurality of areas, defining a ratio value to every area, receiving a desired output value, determining the current area where the desired output value device is located, and calculating the desired output value with the ratio value to obtain an actual output volume and output the actual output volume.

    摘要翻译： 本发明涉及一种防止输出设备损坏的方法，包括以下步骤：将输出设备的输出值分成多个区域，定义每个区域的比值，接收所需的输出值， 确定所需输出值装置所在的当前区域，并用比值计算所需的输出值以获得实际的输出量并输出实际的输出量。

    Multi-processor system and performance adjustment method thereof
    5.
    发明申请
    Multi-processor system and performance adjustment method thereof 有权
    多处理器系统及其性能调整方法

    公开(公告)号：US20080172565A1

    公开(公告)日：2008-07-17

    申请号：US12003692

    申请日：2007-12-31

    申请人： Shao-Kang Chu ,  Yi-Wei Chiu

    发明人： Shao-Kang Chu ,  Yi-Wei Chiu

    IPC分类号： G06F1/26

    CPC分类号： G06F1/3203 ,  G06F1/26 ,  G06F1/3287 ,  G06F1/3293 ,  G06F9/5083 ,  G06F9/5094 ,  Y02D10/122 ,  Y02D10/171 ,  Y02D10/22

    摘要： A multi-processor system and a performance adjustment method thereof are disclosed. The multi-processor system includes a first processing unit and a second processing unit, the performance adjustment method includes: first, detecting the load of each processing unit to obtain corresponding detected data; then, determining whether one of the processing units has the most load; finally, if the first processing unit has the most load, increasing the power supply to the first processing unit.

    摘要翻译： 公开了一种多处理器系统及其性能调整方法。 多处理器系统包括第一处理单元和第二处理单元，所述性能调整方法包括：首先检测每个处理单元的负载以获得相应的检测数据; 然后，确定处理单元之一是否具有最大的负载; 最后，如果第一处理单元的负载最大，则增加对第一处理单元的供电。

    Single-ended SRAM with cross-point data-aware write operation
    6.
    发明授权
    Single-ended SRAM with cross-point data-aware write operation 有权
    具有跨点数据感知写操作的单端SRAM

    公开(公告)号：US08693237B2

    公开(公告)日：2014-04-08

    申请号：US13562330

    申请日：2012-07-31

    申请人： Shyh-Jye Jou ,  Jhih-Yu Lin ,  Ching-Te Chuang ,  Ming-Hsien Tu ,  Yi-Wei Chiu

    发明人： Shyh-Jye Jou ,  Jhih-Yu Lin ,  Ching-Te Chuang ,  Ming-Hsien Tu ,  Yi-Wei Chiu

    IPC分类号： G11C11/00

    CPC分类号： G11C11/412

    摘要： A single-ended SRAM including at least one memory cell and a third switch is provided. The memory cell includes a data-latching unit, a first switch, a second switch and a data-transferring unit. The data-latching unit is configured for latching the received input data and provides a storage data and the inverse data of the storage data. The first switch transfers a reference data to the data-latching unit according to a first word-line signal. The second switch transfers the reference data to the data-latching unit according to a second word-line signal. The data-transferring unit decides whether or not to transfer the reference data to the bit-line according to the storage data and a control signal. The third switch receives the reference data and the control signal and transfers the reference data to the first switch, the second switch and the data-transferring unit according to the control signal.

    摘要翻译： 提供包括至少一个存储单元和第三开关的单端SRAM。 存储单元包括数据锁存单元，第一开关，第二开关和数据传送单元。 数据锁存单元被配置为锁存接收到的输入数据，并提供存储数据和存储数据的逆数据。 第一开关根据第一字线信号将参考数据传送到数据锁存单元。 第二开关根据第二字线信号将参考数据传送到数据锁存单元。 数据传送单元根据存储数据和控制信号决定是否将参考数据传送到位线。 第三开关接收参考数据和控制信号，并根据控制信号将参考数据传送到第一开关，第二开关和数据传送单元。

    Method for preventing an output device from being damaged
    7.
    发明申请
    Method for preventing an output device from being damaged 失效
    防止输出装置损坏的方法

    公开(公告)号：US20070036362A1

    公开(公告)日：2007-02-15

    申请号：US11295665

    申请日：2005-12-07

    申请人： Yi-Wei Chiu ,  Cheng-I Chien

    发明人： Yi-Wei Chiu ,  Cheng-I Chien

    IPC分类号： H03G11/00

    CPC分类号： H03G7/007 ,  H04R3/007 ,  H04R2430/01

    摘要： The present invention relates to a method for preventing an output device from being damaged, which comprises the steps of: dividing the output value of an output device into a plurality of areas, defining a ratio value to every area, receiving a desired output value, determining the current area where the desired output value device is located, and calculating the desired output value with the ratio value to obtain an actual output volume and output the actual output volume.

    摘要翻译： 本发明涉及一种防止输出设备损坏的方法，包括以下步骤：将输出设备的输出值分成多个区域，定义每个区域的比值，接收所需的输出值， 确定所需输出值装置所在的当前区域，并用比值计算所需的输出值以获得实际的输出量并输出实际的输出量。

    Feature dimension measurement
    8.
    发明授权
    Feature dimension measurement 有权
    特征尺寸测量

    公开(公告)号：US08049213B2

    公开(公告)日：2011-11-01

    申请号：US11958942

    申请日：2007-12-18

    申请人： Ching-Chung Su ,  Yi-Wei Chiu ,  Tzu Chan Weng ,  Yih Song Chiu ,  Pin Chia Su ,  Chih-Cherng Jeng ,  Kuo-Hsiu Wei

    发明人： Ching-Chung Su ,  Yi-Wei Chiu ,  Tzu Chan Weng ,  Yih Song Chiu ,  Pin Chia Su ,  Chih-Cherng Jeng ,  Kuo-Hsiu Wei

    IPC分类号： H01L21/66 ,  H01L23/544

    CPC分类号： H01L22/14 ,  H01L22/12 ,  H01L22/20

    摘要： A method of measuring dimensional characteristics includes providing a substrate and forming a reflective layer over the substrate. A dielectric layer is then formed over the reflective layer. The dielectric layer includes a grating pattern and a resistivity test line inset in a transparent region. Radiation is then directed onto the dielectric layer so that some of the radiation is transmitted through the transparent region to the reflective layer. A radiation pattern is then detected from the radiation reflected and scattered by the metal grating pattern. The radiation pattern is analyzed to determine a first dimensional information. Then the resistance of the resistivity test line is measured, and that resistance is analyzed to determine a second dimensional information. The first and second dimensional informations are then compared.

    摘要翻译： 测量尺寸特性的方法包括提供衬底并在衬底上形成反射层。 然后在反射层上形成电介质层。 电介质层包括在透明区域内插入的光栅图案和电阻率测试线。 然后将辐射引导到电介质层上，使得一些辐射透过透明区域到达反射层。 然后从由金属光栅图案反射和散射的辐射中检测出辐射图。 分析辐射图以确定第一维信息。 然后测量电阻率测试线的电阻，并分析该电阻以确定第二维信息。 然后比较第一和第二维信息。

    Multi-processor system and performance adjustment method thereof
    9.
    发明授权
    Multi-processor system and performance adjustment method thereof 有权
    多处理器系统及其性能调整方法

    公开(公告)号：US08010817B2

    公开(公告)日：2011-08-30

    申请号：US12003692

    申请日：2007-12-31

    申请人： Shao-Kang Chu ,  Yi-Wei Chiu

    发明人： Shao-Kang Chu ,  Yi-Wei Chiu

    IPC分类号： G06F1/00

    CPC分类号： G06F1/3203 ,  G06F1/26 ,  G06F1/3287 ,  G06F1/3293 ,  G06F9/5083 ,  G06F9/5094 ,  Y02D10/122 ,  Y02D10/171 ,  Y02D10/22

    摘要： A multi-processor system and a performance adjustment method thereof are disclosed. The multi-processor system includes a first processing unit and a second processing unit, the performance adjustment method includes: first, detecting the load of each processing unit to obtain corresponding detected data; then, determining whether one of the processing units has the most load; finally, if the first processing unit has the most load, increasing the power supply to the first processing unit.

    摘要翻译： 公开了一种多处理器系统及其性能调整方法。 多处理器系统包括第一处理单元和第二处理单元，所述性能调整方法包括：首先检测每个处理单元的负载以获得相应的检测数据; 然后，确定处理单元之一是否具有最大的负载; 最后，如果第一处理单元的负载最大，则增加对第一处理单元的供电。

    Feature Dimension Measurement
    10.
    发明申请
    Feature Dimension Measurement 有权
    特征尺寸测量

    公开(公告)号：US20090152545A1

    公开(公告)日：2009-06-18

    申请号：US11958942

    申请日：2007-12-18

    申请人： Ching-Chung Su ,  Yi-Wei Chiu ,  Tzu-Chan Weng ,  Yih Song Chiu ,  Pin Chia Su ,  Chih-Cherng Jeng ,  Kuo-Hsiu Wei

    发明人： Ching-Chung Su ,  Yi-Wei Chiu ,  Tzu-Chan Weng ,  Yih Song Chiu ,  Pin Chia Su ,  Chih-Cherng Jeng ,  Kuo-Hsiu Wei

    IPC分类号： H01L23/58 ,  H01L21/66

    CPC分类号： H01L22/14 ,  H01L22/12 ,  H01L22/20

    摘要： A method of measuring dimensional characteristics includes providing a substrate and forming a reflective layer over the substrate. A dielectric layer is then formed over the reflective layer. The dielectric layer includes a grating pattern and a resistivity test line inset in a transparent region. Radiation is then directed onto the dielectric layer so that some of the radiation is transmitted through the transparent region to the reflective layer. A radiation pattern is then detected from the radiation reflected and scattered by the metal grating pattern. The radiation pattern is analyzed to determine a first dimensional information. Then the resistance of the resistivity test line is measured, and that resistance is analyzed to determine a second dimensional information. The first and second dimensional informations are then compared.

    摘要翻译： 测量尺寸特性的方法包括提供衬底并在衬底上形成反射层。 然后在反射层上形成电介质层。 电介质层包括在透明区域内插入的光栅图案和电阻率测试线。 然后将辐射引导到电介质层上，使得一些辐射透过透明区域到达反射层。 然后从由金属光栅图案反射和散射的辐射中检测出辐射图。 分析辐射图以确定第一维信息。 然后测量电阻率测试线的电阻，并分析该电阻以确定第二维信息。 然后比较第一和第二维信息。