Abstract:
A level-shifter circuit receives one or more input signals in an input level domain and includes provides at an output node an output signal in an output level domain shifted with respect to the input level domain. The circuit includes output circuitry including a first drive node and a second drive node that receive first and second logical signals so that the output signal has a first output level or a second output level in the output level domain as a function of at least one of the first and second logical signals. The circuit includes first and second shift capacitors coupled to the first and second drive nodes as well as capacitor refresh circuitry.
Abstract:
In a non-volatile memory device, a memory sector is provided. The memory sector includes a plurality of tiles arranged horizontally. Each tile includes a plurality of memory cells arranged in horizontal word lines and vertical bit lines. A pre-decoder is configured to receive a set of encoded address signals to produce pre-decoding signals. A central row decoder is arranged in line with the plurality of tiles, receives the pre-decoding signals and produces level-shifted pull-up and pull-down driving signals for driving the word lines. First buffer circuits are arranged on a first side of each tile. Each of the first buffer circuits is coupled to a respective word line, receives a level-shifted pull-up driving signal and a level-shifted pull-down driving signal, and selectively pulls up or pulls down the respective word line as a function of the values of the received signals.
Abstract:
Unclonable function circuitry includes a plurality of pairs of phase-change memory cells in a virgin state, and sensing circuitry coupled to the plurality of pairs of phase-change memory cells in the virgin state. The sensing circuitry identifies a subset of the plurality of pairs of phase-change memory cells in the virgin state based on a reliability mask. Signs of differences of effective resistance values of the identified subset of the plurality of pairs of phase-change memory cells in the virgin state are sensed by the sensing circuitry. The sensing circuitry generates a string of bits based on the sensed signs of differences in the effective resistance values of the identified subset of the plurality of pairs of phase-change memory cells in the virgin state. Processing circuitry coupled to the unclonable function circuitry, in operation, executes one or more operations using the generated string of bits.
Abstract:
A decoding system for a phase change non-volatile memory device having a memory array may include a column decoder that selects at least one column of the memory array during programming operations. The decoding system includes a selection circuit that includes selection switches on a number of hierarchical decoding levels for defining a conductive path between at least one column and a driving stage. A biasing circuit may supply biasing signals to the selection switches for defining the first conductive path and bringing the selected column to a programming voltage value. The programming selection circuit may have protection elements between columns and the selection switches. The selection switches and the protection elements may include metal oxide semiconductor (MOS) transistors having an upper threshold voltage level lower than the programming voltage.
Abstract:
A phase change non-volatile memory device has a memory array with a plurality of memory cells arranged in rows and columns, a column decoder and a row decoder designed to select columns, and, respectively, rows of the memory array during operations of programming of corresponding memory cells. A control logic, coupled to the column decoder and the row decoder, is designed to execute a sequential programming command, to control the column decoder and row decoder to select one column of the memory array and execute sequential programming operations on a desired block of memory cells belonging to contiguous selected rows of the selected column.
Abstract:
A voltage regulator has an input terminal for receiving a supply voltage and an output terminal for providing a regulated voltage and a regulated current. Furthermore, the voltage regulator includes a regulator for generating the regulated voltage and the regulated current according to a regulation of the supply voltage. The regulator includes a plurality of regulation branches arranged between the input terminal and the output terminal, each one for providing an output voltage used for obtaining the regulated voltage and for providing an output current contributing to define the regulated current. The regulation branches are partitioned into a plurality of subsets each one including components adapted to operate within a corresponding maximum voltage different from the maximum voltage of the other subsets. In addition, the regulator includes a selector for selectively enabling the regulation branches according to an indicator of the supply voltage.
Abstract:
A memory device may include memory cells. The method may include receiving a request of reading a selected data word associated with a selected code word stored with an error correction code, and reading a first code word representing a first version of the selected code word by comparing a state of each selected memory cell with a first reference. The method may include verifying the first code word, setting the selected code word according to the first code word in response to a positive verification, reading at least one second code word representing a second version of the selected code word, verifying the second code word, and setting the selected code word according to the second code word in response to a negative verification of the first code word and to a positive verification of the second code word.
Abstract:
A driving stage for a phase change non-volatile memory device may have an output driving unit which supplies an output driving current during an operation of programming of at least one memory cell. A driving-control unit receives an input current and generates at output a first control signal that controls supply of the output driving current by the output driving unit in such a way that a value of this current has a desired relation with the input current. A level-shifter element, set between the output of the driving-control unit and a control input of the output driving unit, determines a level shift of the voltage of the first control signal so as to supply to the control input of the output driving unit a second control signal, having a voltage value that is increased with respect to, and is a function of, the first control signal.
Abstract:
A LDO regulator circuit comprises an input comparator and driver circuitry including transistors having a current flow path therethrough coupled to an output node of the regulator. First and second driver each comprises: driver transistors having the current flow paths therethrough coupled to the output node, capacitive boost circuitry that applies to the drive transistors a voltage-pumped replica of the comparison signal. Voltage refresh transistor circuitry coupled to the capacitive boost circuitry transfer thereon the voltage-pumped replica. The first and second drivers can be controllably switched between a first mode of operation, during which the current flow path through the driver transistors is conductive or non-conductive based on the voltage-pumped replica of the comparison signal, and a second mode, during which the voltage refresh transistor circuitry is activated to transfer the voltage-pumped replica of the comparison signal, and the current flow path through the driver transistors is non-conductive.
Abstract:
Unclonable function circuitry includes a plurality of pairs of phase-change memory cells in a virgin state, and sensing circuitry coupled to the plurality of pairs of phase-change memory cells in the virgin state. The sensing circuitry identifies a subset of the plurality of pairs of phase-change memory cells in the virgin state based on a reliability mask. Signs of differences of effective resistance values of the identified subset of the plurality of pairs of phase-change memory cells in the virgin state are sensed by the sensing circuitry. The sensing circuitry generates a string of bits based on the sensed signs of differences in the effective resistance values of the identified subset of the plurality of pairs of phase-change memory cells in the virgin state. Processing circuitry coupled to the unclonable function circuitry, in operation, executes one or more operations using the generated string of bits.