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公开(公告)号:US12114578B2
公开(公告)日:2024-10-08
申请号:US17675876
申请日:2022-02-18
Applicant: Samsung Electronics Co., Ltd.
Inventor: Roman Chepulskyy , Dmytro Apalkov
Abstract: A magnetoresistive tunnel-junction (MTJ) memory element includes a magnetic reference layer (RL), a magnetic free layer (FL), a tunneling barrier layer, which extends between the magnetic RL and the magnetic FL, and a diffusion-blocking layer (DBL), which extends on the magnetic FL. The includes at least one material selected from a group consisting of bismuth (Bi), antimony (Sb), osmium (Os), rhenium (Re), tin (Sn), rhodium (Rh), indium (In), and cadmium (Cd). An oxide capping layer is also provided on the DBL. The oxide layer may include at least one of strontium (Sr), scandium (Sc), beryllium (Be), calcium (Ca), yttrium (Y), zirconium (Zr), and hafnium (Hf).
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公开(公告)号:US11348627B2
公开(公告)日:2022-05-31
申请号:US17127732
申请日:2020-12-18
Applicant: Samsung Electronics Co., Ltd.
Inventor: Dmytro Apalkov , Sungchul Lee , Roman Chepulskyy
Abstract: A system including a racetrack memory layer is described. The racetrack memory layer includes a plurality of bit locations and a plurality of domain wall traps. The bit locations are interleaved with the domain wall traps. Each of the bit locations has a first domain wall speed. Each of the domain wall traps has a second domain wall speed. The first domain wall speed is greater than the second domain wall speed. The first domain wall speed and the second domain wall speed are due to at least one of a Dzyaloshinskii-Moriya interaction variation in the racetrack memory layer, a synthetic antiferromagnetic effect variation in the racetrack memory layer, and a separation distance for the plurality of domain wall traps corresponding to an intrinsic travel distance. The separation distance is less than one hundred nanometers.
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公开(公告)号:US10585630B2
公开(公告)日:2020-03-10
申请号:US15845985
申请日:2017-12-18
Applicant: Samsung Electronics Co., Ltd.
Inventor: Titash Rakshit , Borna J. Obradovic , Ryan M. Hatcher , Vladimir Nikitin , Dmytro Apalkov
IPC: H01L21/822 , H01L27/22 , G06F3/06 , H01L27/11578 , H01L21/3105 , G11C11/16 , G11C11/18 , H01L43/08
Abstract: A memory device and method for providing the memory device are described. The memory device includes word lines, a first plurality of bit lines, a second plurality of bit lines and selectorless memory cells. Each selectorless memory cell is coupled with a word line, a first bit line of the first plurality of bit lines and a second bit line of the second plurality of bit lines. The selectorless memory cell includes first and second magnetic junctions. The first and second magnetic junctions are each programmable using a spin-orbit interaction torque. The word line is coupled between the first and second magnetic junctions. The first and second bit lines are coupled with the first and second magnetic junctions, respectively. The selectorless memory cell is selected for a write operation based on voltages in the word line, the first bit line and the second bit line.
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4.
公开(公告)号:US20190319182A1
公开(公告)日:2019-10-17
申请号:US16453854
申请日:2019-06-26
Applicant: Samsung Electronics Co., Ltd.
Inventor: Zheng Duan , Dmytro Apalkov , Vladimir Nikitin
Abstract: A magnetic junction, a memory using the magnetic junction and method for providing the magnetic junction are described. The magnetic junction includes first and second reference layers, a main barrier layer, a free layer, an engineered secondary barrier layer and a second reference layer. The free layer is switchable between stable magnetic states when a write current is passed through the magnetic junction. The main barrier layer is between the first reference layer and the free layer. The secondary barrier layer is between the free layer and the second reference layer. The engineered secondary barrier layer has a resistance and a plurality of regions having a reduced resistance less than the resistance. The free and reference layers each has a perpendicular magnetic anisotropy energy and an out-of-plane demagnetization energy less than the perpendicular magnetic anisotropy energy.
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公开(公告)号:US10177197B2
公开(公告)日:2019-01-08
申请号:US15043349
申请日:2016-02-12
Applicant: Samsung Electronics Co., LTD.
Inventor: Dmytro Apalkov , Shuxia Wang , Jang-Eun Lee
Abstract: A magnetic junction usable in a magnetic device is described. The magnetic junction has a free layer, a reference layer, and a nonmagnetic spacer layer between reference and free layers. The free layer is switchable between stable magnetic states when a write current is passed through the magnetic junction. The free layer has a length in a first direction, a width in a second direction perpendicular to the first direction, an exchange stiffness and an aspect ratio equal to the length divided by the width. The aspect ratio is greater than one. The exchange stiffness is not less than 2×10−6 erg/cm.
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公开(公告)号:US10170690B2
公开(公告)日:2019-01-01
申请号:US15080572
申请日:2016-03-24
Applicant: Samsung Electronics Co., Ltd.
Inventor: Dmytro Apalkov , Donkoun Lee , Mohamad Krounbi
Abstract: A magnetic memory device and a method to make the device is disclosed. The magnetic memory device comprises a free magnetic layer that includes a hard magnetic material layer, a soft magnetic material layer and a coupling layer that is between the hard magnetic material layer and the soft magnetic material layer. The coupling layer comprises a magnetic material that has oxidized edges. In one embodiment, the magnetic material of the coupling layer comprises a Heusler alloy or a silicon-based magnetic material. A predetermined amount of the coupling layer is oxidized to controllably reduce the switching current Jc0 of the free magnetic layer to be about half of the switching current if the coupling layer comprised substantially all magnetic material and no oxide.
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公开(公告)号:US10170518B2
公开(公告)日:2019-01-01
申请号:US15659613
申请日:2017-07-25
Applicant: Samsung Electronics Co., LTD.
Inventor: Vladimir Nikitin , Dmytro Apalkov , Sebastian Schafer
Abstract: Magnetic junctions usable in a magnetic device and a method for providing the magnetic junctions are described. A patterned seed layer is provided. The patterned seed layer includes magnetic seed islands interspersed with an insulating matrix. At least a portion of the magnetoresistive stack is provided after the patterned seed layer. The magnetoresistive stack includes at least one magnetic segregating layer. The magnetic segregating layer(s) include at least one magnetic material and at least one insulator. The method anneals the at least the portion of the magnetoresistive stack such that the at least one magnetic segregating layer segregates. The constituents of the magnetic segregating layer segregate such that portions of magnetic material(s) align with the magnetic seed islands(s) and such that portions of the insulator(s) align with the insulating matrix.
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公开(公告)号:US20180102476A1
公开(公告)日:2018-04-12
申请号:US15367033
申请日:2016-12-01
Applicant: Samsung Electronics Co., LTD.
Inventor: Roman Chepulskyy , Dmytro Apalkov
CPC classification number: H01L43/10 , G11C11/161 , G11C11/165 , H01L27/226 , H01L43/08 , H01L43/12
Abstract: A magnetic junction and method for providing the magnetic junction are described. The magnetic junction resides on a substrate and is usable in a magnetic device. The magnetic junction includes free and pinned layers separated by a nonmagnetic spacer layer. The free layer is switchable between stable magnetic states when a write current is passed through the magnetic junction. The free layer has a free layer perpendicular magnetic anisotropy energy greater than a free layer out-of-plane demagnetization energy. The free layer also includes a diluted magnetic layer having an out-of-plane demagnetization energy and a perpendicular magnetic anisotropy greater than the out-of-plane demagnetization energy. The diluted magnetic layer includes at least one magnetic material and at least one nonmagnetic material. The diluted magnetic layer has an exchange stiffness that is at least eighty percent of an exchange stiffness for the magnetic material(s).
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9.
公开(公告)号:US09929339B2
公开(公告)日:2018-03-27
申请号:US14981228
申请日:2015-12-28
Applicant: Samsung Electronics Co., LTD.
Inventor: Alexey Vasilyevitch Khvalkovskiy , Dmytro Apalkov
Abstract: A magnetic junction usable in a magnetic device is described. The magnetic junction includes a first reference layer, first and second spacer layers, a free layer and a self-initializing (SI) substructure. The first spacer layer is between the free and first reference layers. The free layer is switchable between stable magnetic states when a write current having at least a critical magnitude is passed through the magnetic junction. The second spacer layer is between the SI substructure and the free layer. The SI substructure is selected from first, second and third substructures. The first and second substructures include an SI reference layer having a magnetic moment switchable between the first and second directions when a current having a magnitude of not more than one-half of the critical magnitude is passed through the magnetic junction. The third substructure includes a temperature dependent reference layer.
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10.
公开(公告)号:US09792971B2
公开(公告)日:2017-10-17
申请号:US14730379
申请日:2015-06-04
Applicant: Samsung Electronics Co., LTD.
Inventor: Matthew J. Carey , Dmytro Apalkov , Keith Chan
CPC classification number: G11C11/161 , G11C11/1675 , H01L43/08 , H01L43/12
Abstract: A magnetic junction usable in magnetic devices is described. The magnetic junction includes a reference layer, a free layer, a nonmagnetic spacer layer between the reference and free layers, and a rare earth-transition metal (RE-TM) layer in the reference and/or free layers. The free layer is switchable between stable magnetic states when a write current is passed through the magnetic junction. If the RE-TM layer is in the free layer then the RE-TM layer is between hard and soft magnetic layers in the free layer. In this aspect, the RE-TM layer has a standby magnetic moment greater than a write magnetic moment. If the RE-TM layer is in the reference layer, then the magnetic junction includes a second RE-TM layer. In this aspect, a first saturation magnetization quantity of the RE-TM layer matches a second saturation magnetization quantity of the second RE-TM layer over an operating temperature range.
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