ULTRA PIPELINED ACCELERATOR FOR MACHINE LEARNING INFERENCE

    公开(公告)号:US20210124588A1

    公开(公告)日:2021-04-29

    申请号:US16838971

    申请日:2020-04-02

    摘要: A method of pipelining inference of a neural network, which includes an i-th layer (i being an integer greater than zero), an (i+1)-th layer, and an (i+2)-th layer, includes processing a first set of i-th values of the i-th layer to generate (i+1)-th values for the (i+1)-th layer, determining a quantity of the (i+1)-th values as being sufficient for processing, and in response to the determining, processing the (i+1)-th values to generate an output value for the (i+2)-th layer while concurrently processing a second set of i-th values of the i-th layer.

    NANOSHEET FIELD EFFECT TRANSISTOR CELL ARCHITECTURE

    公开(公告)号:US20200152801A1

    公开(公告)日:2020-05-14

    申请号:US16390859

    申请日:2019-04-22

    摘要: A semiconductor device includes first and second GAA FETs spaced apart by an inter-channel spacing. Each of the GAA FETs includes a horizontal nanosheet conductive channel structure, a gate material completely surrounding the horizontal nanosheet conductive channel structure, source and drain regions at opposite ends of the horizontal nanosheet conductive channel structure, source and drain contacts on the source and drain regions. A width of the horizontal nanosheet conductive channel structure of the first GAA FET or the second GAA FET is smaller than a maximum allowed width. The semiconductor device also includes a gate contact on the gate material in the inter-channel spacing between the first and second GAA FETs. The gate contact is spaced apart by a distance from each of the source and drain regions of the first and second GAA FETs in a range from a minimum design rule spacing to a maximum distance.

    Vertical optical via and method of fabrication

    公开(公告)号:US10585254B2

    公开(公告)日:2020-03-10

    申请号:US15965154

    申请日:2018-04-27

    摘要: A method for providing a vertical optical via for a semiconductor substrate is described. The semiconductor substrate has a front surface and a back side. A hard mask having an aperture therein is formed on the front surface. Part of the semiconductor substrate exposed by the aperture is removed to form a via hole. The via hole has a width not exceeding one hundred micrometers and a bottom. Cladding layer(s) and core layer(s) are provided in the via hole. The core layer(s) have at least a second index of refraction greater than that of the core layer(s). A portion of the semiconductor substrate including the back side is removed to expose a bottom portion of the core layer(s) and a bottom surface of the semiconductor substrate. The vertical optical via includes the cladding and core layers. The vertical optical via extends from the front surface to the bottom surface.