摘要:
Methods, computer program products, and systems are disclosed associated with calculating a routability metric for a second IC design using inputs from the compilation to a first IC design. The first and second IC designs are alternative implementation options for a user circuit design, such as FPGA and structured ASIC options. Information about user design demands on routing resources of one IC design are considered along with information about the projected supply of routing resources in another IC design, to produce a routing metric. The routing metric may be mapped to a degree of difficulty indicator, and either may be used to condition a compile of the user circuit to the second IC design or be used in other ways.
摘要:
A method of designing at IC is described. In one embodiment, the method includes providing an option to select a mask layer set from a plurality of mask layer sets, the plurality of mask layer sets including a first mask layer set and a second mask layer set, where the second mask layer set is an alternative mask layer option to the first mask layer set. In one embodiment, the method further includes receiving a selection from a user choosing a mask layer set from the plurality of mask layer sets. In one embodiment, the receiving occurs after design of the IC and prior to fabrication of the IC. Also, in one embodiment, the plurality of mask layer sets are predetermined mask layer sets. In one embodiment, the first mask layer set is a standard threshold voltage (SVT) mask layer set and the second mask layer set is a high threshold voltage (HVT) mask layer set. In one embodiment, core devices of the SVT mask layer set are SVT devices and some periphery devices of the SVT mask layer set are HVT devices. In one embodiment, hybrid cell (H-cell) devices of the HVT mask layer set are HVT devices and some periphery devices of the HVT mask layer set are HVT devices.
摘要:
A circuit includes a receiver channel and a built-in self-test circuit. The receiver channel has a serializer and a deserializer. The built-in self-test circuit generates test signals that are transmitted in parallel to the serializer during a test of the receiver channel. The serializer converts the test signals into serial test signals. The deserializer converts the serial test signals into parallel test signals that are transmitted to the built-in self-test circuit.
摘要:
A delay circuit that includes a first delay cell oriented in a first orientation and a second delay cell oriented in a second orientation is described. In one embodiment, the first orientation is perpendicular to the second orientation. More specifically, in one embodiment, the first orientation is vertical and the second orientation is horizontal.
摘要:
Techniques for combining volatile and non-volatile programmable logic into one integrated circuit (IC) are provided. An IC is segregated into two portions. A first block of programmable logic is configured by bits stored in on-chip non-volatile memory. A second block of programmable logic is configured by bits stored in off-chip memory. The function of IO banks on the IC is multiplexed between the two logic blocks of the IC. The programmable logic in the first block can be configured and fully functional in a fraction of the time that the programmable logic in the second block can be configured. The programmable logic in the first block can configure fast enough and have enough independence to assist in the configuration of the second block. The non-volatile memory can also provide security features to a user design, such as encryption.
摘要:
Circuits and a method for tuning an integrated circuit (IC) are disclosed. The IC includes multiple programmable fuses coupled to a control block. The programmable fuses used may be one-time programmable (OTP) fuses. The control block reads settings or data stored in the programmable fuses. A tuning circuit coupled to the control block receives the delay transmitted by the control block. The tuning circuit allows tuning of the IC without changes to the fabrication mask. The tuning circuit may include delay chains to provide additional delay to the IC when needed and the delay in the tuning circuit is configured based on the delay value stored in the programmable fuses and transmitted by the control block.
摘要:
A method for determining clock uncertainties is provided. The method includes identifying clock transfer types between registers from an integrated circuit design and identifying contributors to the clock uncertainties for each of the clock transfers. The jitter associated with each identified contributor is calculated for both set-up time and hold time. This calculated jitter is incorporated into a slack calculation to determine whether timing constraints are met for a circuit design.
摘要:
Signal transmission circuitry on an integrated circuit ameliorates the effects of possible inequality in rise and fall times of buffer circuits along the transmission circuitry by providing at least one of the buffer circuits as an inverting buffer circuit and at least one other of the buffer circuits as a non-inverting buffer circuit. The invention may be of particular interest for use in clock signal distribution networks on integrated circuits such as programmable logic devices.
摘要:
Circuits for a multiplier with a built-in accumulator and a method of performing multiplication with accumulation are disclosed. An embodiment of the disclosed circuits includes a logic circuit coupled to receive two inputs. The logic circuit is capable of generating a plurality of value bits from the inputs received. In one embodiment, the logic circuit includes a Booth recoder circuit that generates a plurality of partial products. A block of adders is coupled to logic circuit to receive and sum up the value bits. An adder adds the summation result from the block of adders to a previous accumulated value to generate intermediate sum and carry values. An accumulator, coupled to the adder, receives and stores the intermediate values.
摘要:
A test platform is configured to test a mult-die package having at a first die and a second die. The test platform includes a first lead that is connected to the VCC input on the first die. The test platform also includes a second lead that is connected to VCCIO input on the second die. The VCC input on the second die is connected to ground. The I/O pin of the second die can then be tri-stated using a control circuit disposed between the pre-driver and the driver of the I/O buffer.