公开(公告)号：US4617248A

公开(公告)日：1986-10-14

申请号：US736149

申请日：1985-05-20

Applicant: Kenkichi Tanioka ,  Keiichi Shidara ,  Takao Kuriyama ,  Yukio Takasaki ,  Tadaaki Hirai ,  Yasuhiko Nonaka ,  Eisuke Inoue

Inventor： Kenkichi Tanioka ,  Keiichi Shidara ,  Takao Kuriyama ,  Yukio Takasaki ,  Tadaaki Hirai ,  Yasuhiko Nonaka ,  Eisuke Inoue

IPC: H01J31/26 ,  H01J1/78 ,  H01J29/45 ,  H01L31/0248 ,  H01L31/08 ,  G03G5/08 ,  G03G5/09

CPC classification number: H01J29/456

Abstract: A structure of a photoconductive film related to a target of an image pickup tube of the photo conductivity type is disclosed. This photoconductive film is formed from mainly Se and Te is added in a central part thereof. Further, As, which is considered to form a deep trap level which captures electrons in Se and GaF.sub.3, etc. which form negative space charges by capturing electrons in Se are added in the region adjacent to the region where Te exists. In addition, a thickness of film in the region where GaF.sub.3, etc. exists is selected to be thinner (not smaller than 20 .ANG. and not larger than 90 .ANG.) than a value which has been adopted so far.

Abstract translation: 公开了与光电导型的图像拾取管的靶相关的光电导膜的结构。 该感光膜主要由Se形成，Te的中心部分添加Te。 此外，被认为形成通过在Se中捕获电子而形成负空间电荷的Se和GaF 3等中的电子形成深阱陷阱的As被添加在与Te存在的区域相邻的区域中。 此外，存在GaF 3等的区域中的膜的厚度比迄今采用的值更薄（不小于20，不大于90）。

公开(公告)号：US4839511A

公开(公告)日：1989-06-13

申请号：US149707

申请日：1988-01-29

Applicant: James C. Thompson ,  Uzi J. Even ,  Chi-Woo Kim

Inventor： James C. Thompson ,  Uzi J. Even ,  Chi-Woo Kim

IPC: H01J1/34 ,  H01J1/78 ,  H01J9/12 ,  H01J29/36

CPC classification number: H01J29/36 ,  H01J1/34 ,  H01J1/78 ,  H01J9/12 ,  H01J9/233 ,  H01J2201/3425

Abstract: A photoconductive member is provided with increased sensitivity to radiation incident thereupon and with increased photo-yield in response thereto by means of a multi-layered, sandwich-type construction based upon the provision of successive layers of sensitizing material over corresponding successive layers of conducting material. The photoconductive member comprises at least two composite layers formed one above the other on an insulating substrate, each composite layer comprising a first layer of material capable of conducting charge and a second layer of material comprising polar molecules disposed upon the charge-conducting material layer in such a manner that successive layers of polar molecules are adsorbed and retained in an oriented fashion on successive layers of the charge-conducting material. In combination, the alternating layers of charge-conducting material and polar molecules increase photo-yield in response to a given quantum of incident radiation and also increase the range of wavelength of incident radiation to which the photoconductive member is responsive. The sandwich-type construction permits photoconductor sensitivity to be increased as a function of the number of layers of conducting material and polar molecules used to form the photoconductive surface. The multi-layered construction also exhibits reduced sensitivity to the degrading effects of impurities, is adapted to convenient fabrication, and exhibits extended lifetime.

Abstract translation: 光电导元件被提供对其入射的辐射的增加的灵敏度，并且通过基于在相应的连续的导电材料层上提供连续的敏化材料层的多层夹层结构，响应于此而增加的光产率 。 光电导元件包括至少两层复合层，绝缘基板上形成一层复合层，每个复合层包括能够导电的第一层材料和第二层材料，该第二层材料包含位于导电材料层上的极性分子 这样一种方式使连续的极性分子层被吸附并以取向形式保持在导电材料的连续层上。 组合地，电荷传导材料和极性分子的交替层响应于给定的入射辐射量而增加光产率，并且还增加光电导元件响应的入射辐射的波长范围。 夹层结构允许光电导体灵敏度随着用于形成光导表面的导电材料和极性分子的层数的增加而增加。 多层结构对于杂质的降解效果也表现出降低的敏感性，适于方便的制造，并且具有延长的使用寿命。

公开(公告)号：US4816183A

公开(公告)日：1989-03-28

申请号：US898918

申请日：1986-08-21

Applicant: Clayton W. Bates, Jr.

Inventor： Clayton W. Bates, Jr.

IPC: H01J1/78 ,  H01J29/45 ,  H01L31/0216 ,  H01B1/06 ,  H01C13/00

CPC classification number: H01L31/02162 ,  H01J1/78 ,  H01J29/45 ,  H01L31/0216

Abstract: A composite photosensitive material of enhanced sensitivity to, and absorption of, incident radiation, wherein an array of particles of an electrically conducting material is embedded in and dispersed through a semiconducting matrix transparent to the wavelengths of interest, the particles having sizes of from about 1 to about 100 nanometers and having volume fractions of at least about 10 percent. The composite material is usable in photosensitive device applications such as detectors, photocells, photodiodes, and vidicons. Sensitivity to infrared radiation is particularly high where the matrix has a dielectric constant of at least about 10. The preferred particle material for enhanced infrared sensitivity is silver or gold, and the preferred matrix is silicon of CuInSe.sub.2.

Abstract translation: 一种对入射辐射具有增强的敏感性和吸收性的复合感光材料，其中导电材料的颗粒阵列嵌入并通过对感兴趣的波长透明的半导体基质分散，所述颗粒的尺寸为约1 至约100纳米，体积分数为至少约10％。 该复合材料可用于光敏器件应用中，例如检测器，光电管，光电二极管和栅极。 当基质具有至少约10的介电常数时，对红外辐射的敏感度特别高。用于提高红外灵敏度的优选颗粒材料是银或金，优选的基质是CuInSe 2的硅。

公开(公告)号：US20200090826A1

公开(公告)日：2020-03-19

申请号：US16690103

申请日：2019-11-20

Applicant: David L. Adler

Inventor： David L. Adler

IPC: G21K1/00 ,  G01N23/04 ,  H01L23/498 ,  H01L27/02 ,  H01J1/78

Abstract: An apparatus is disclosed for the examination and inspection of integrated devices such as integrated circuits. X-rays are transmitted through the integrated device, and are incident on a photoemissive structure that absorbs x-rays and emits electrons. The electrons emitted by the photoemissive structure are shaped by an electron optical system to form a magnified image of the emitted electrons on a detector. This magnified image is then recorded and processed. For some embodiments of the invention, the photoemissive structure is deposited directly onto the integrated device. In some embodiments, the incidence angle of the x-rays is varied to allow internal three-dimensional structures of the integrated device to be determined. In some embodiments, the recorded image is compared with a reference data to enable inspection for manufacturing quality control.

公开(公告)号：US10559445B2

公开(公告)日：2020-02-11

申请号：US15538693

申请日：2015-12-15

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Tatsuo Sasaki

IPC: H01J1/34 ,  H01J1/78 ,  H01J29/38 ,  H01J31/49 ,  H01J31/50 ,  H01J40/06 ,  H01J40/16 ,  H01L31/0272 ,  H01L31/0392

Abstract: The present invention improves sensitivity of the ultraviolet band of a photoelectric surface. A photoelectric surface includes a window material that transmits ultraviolet rays, a conductive film that is formed on the window material and has conductivity, an intermediate film 4 that is formed on the conductive film and is formed of MgF2, and a photoelectric conversion film that is formed on the intermediate film 4 and is formed of CsTe. Since the photoelectric surface includes the intermediate film 4 formed of MgF2, the sensitivity of the ultraviolet band is improved.

公开(公告)号：US20160163492A1

公开(公告)日：2016-06-09

申请号：US14908893

申请日：2013-07-31

Applicant: CERN - EUROPEAN ORGANIZATION FOR NUCLEAR RESEARCH

Inventor： Philippe Breuil ,  Vladimir Peskov ,  Paolo Martinengo

IPC: H01J1/34 ,  H01J1/78 ,  G08B17/12 ,  G01J1/42

CPC classification number: H01J1/34 ,  G01J1/429 ,  G08B17/12 ,  H01J1/78 ,  H01J29/38 ,  H01J31/49 ,  H01J40/16

Abstract: An electron filtering layer placed on a photocathode of a UV light detector allows to selectively filter out electrons generated from a photoconversion of long wavelengths. The filter may be tuned by selecting the material and the thickness of the electron filtering layer. By means of the filtering layer, background noise due to visible parts of the spectrum may be efficiently suppressed. Applications of the invention include a solar-blind flame and/or smoke detector.

Abstract translation: 放置在UV光检测器的光电阴极上的电子过滤层允许选择性地滤出由长波长的光转换产生的电子。 可以通过选择电子过滤层的材料和厚度来调节过滤器。 通过滤波层，可以有效地抑制由于频谱的可见部分引起的背景噪声。 本发明的应用包括太阳能盲焰和/或烟雾探测器。

公开(公告)号：US20220236199A1

公开(公告)日：2022-07-28

申请号：US17721191

申请日：2022-04-14

Applicant: David L. Adler

Inventor： David L. Adler

IPC: G01N23/04 ,  H01J1/78 ,  H01L27/02 ,  H01L23/498 ,  G21K1/00 ,  G01N23/044

Abstract: A system is disclosed for the examination and inspection of integrated devices such as integrated circuits using 3-D laminography. X-rays are transmitted through the integrated device, and are incident on a photoemissive structure that absorbs x-rays and emits electrons. The electrons emitted by the photoemissive structure are shaped by an electron optical system to form a magnified image of the emitted electrons on a detector. This magnified image is then recorded and processed. In some embodiments, the incidence angle of the x-rays is varied to gather multiple images that allow internal three-dimensional structures of the integrated device to be determined using computed laminography. In some embodiments, the recorded images are compared with reference data to enable inspection for manufacturing quality control.

公开(公告)号：US11307152B2

公开(公告)日：2022-04-19

申请号：US16690103

申请日：2019-11-20

Applicant: David L. Adler

Inventor： David L. Adler

IPC: G01N23/04 ,  H01J1/78 ,  G21K7/00 ,  H01L27/02 ,  H01L23/498 ,  G21K1/00 ,  G01N23/044

Abstract: An apparatus is disclosed for the examination and inspection of integrated devices such as integrated circuits. X-rays are transmitted through the integrated device, and are incident on a photoemissive structure that absorbs x-rays and emits electrons. The electrons emitted by the photoemissive structure are shaped by an electron optical system to form a magnified image of the emitted electrons on a detector. This magnified image is then recorded and processed. For some embodiments of the invention, the photoemissive structure is deposited directly onto the integrated device. In some embodiments, the incidence angle of the x-rays is varied to allow internal three-dimensional structures of the integrated device to be determined. In some embodiments, the recorded image is compared with a reference data to enable inspection for manufacturing quality control.

公开(公告)号：US20080303436A1

公开(公告)日：2008-12-11

申请号：US12154857

申请日：2008-05-27

Applicant: Charles Forbes ,  Alexander Gelbman ,  Christopher Turner ,  Helena Gleskova ,  Sigurd Richard Wagner

Inventor： Charles Forbes ,  Alexander Gelbman ,  Christopher Turner ,  Helena Gleskova ,  Sigurd Richard Wagner

IPC: H01J1/78

CPC classification number: H01L29/78603 ,  G02F1/133305 ,  G02F1/167 ,  G02F2001/136295 ,  G03G15/6585 ,  H01L21/4846 ,  H01L21/76838 ,  H01L27/1288 ,  H01L29/66757 ,  H01L2924/0002 ,  H05K3/048 ,  H05K3/1266 ,  H05K3/184 ,  H05K3/388 ,  H05K2203/0517 ,  H01L2924/00

Abstract: A method for forming an adhesion layer in contact with a first surface of a substrate and a surface of a layer having electrically conductive properties using electrophotographic imaging compound as a mask is provided. The adhesion layer improves the lamination properties of the electrically conductive layer to the substrate. The improved lamination properties to facilitate and increase the reliability and quality of a resulting product having an electronic circuit formed in accordance with the present invention. The method disclosed herein is well suited for use with rigid polymeric substrates and flexible polymeric substrates.

Abstract translation: 提供了一种使用电子照相成像化合物作为掩模来形成与基板的第一表面和具有导电性质的层的表面接触的粘合层的方法。 粘合层改善了导电层与基底的层压性能。 改进的层压性能以便于并提高具有根据本发明形成的电子电路的所得产品的可靠性和质量。 本文公开的方法非常适用于刚性聚合物基材和柔性聚合物基材。

公开(公告)号：US4099198A

公开(公告)日：1978-07-04

申请号：US686374

申请日：1976-05-14

Applicant: Jonathan Ross Howorth ,  Peter James Pool

Inventor： Jonathan Ross Howorth ,  Peter James Pool

IPC: H01J1/78 ,  H01J9/12 ,  H01J29/38 ,  H01L27/14

CPC classification number: H01J29/38 ,  H01J1/78 ,  H01J9/12

Abstract: The input surface of a photocathode consisting of a membrane of p-type silicon is modified to improve it's sensitivity. The p-type concentration is locally increased and the surface is coated with silicon nitride.

Abstract translation: 修改由p型硅膜构成的光电阴极的输入表面以提高其灵敏度。 p型浓度局部增加，表面涂有氮化硅。