CMOS image sensors having transparent transistors and methods of manufacturing the same
    92.
    发明申请
    CMOS image sensors having transparent transistors and methods of manufacturing the same 审中-公开
    具有透明晶体管的CMOS图像传感器及其制造方法

    公开(公告)号:US20090101948A1

    公开(公告)日:2009-04-23

    申请号:US12078404

    申请日:2008-03-31

    IPC分类号: H01L31/00

    摘要: CMOS image sensors having transparent transistors and methods of manufacturing the same are provided. The CMOS image sensors include a photodiode and at least one transistor formed on the photodiode. The image sensor may include a plurality of transistors wherein at least one of the plurality of transistors is a transparent transistor.

    摘要翻译: 提供具有透明晶体管的CMOS图像传感器及其制造方法。 CMOS图像传感器包括光电二极管和形成在光电二极管上的至少一个晶体管。 图像传感器可以包括多个晶体管,其中多个晶体管中的至少一个是透明晶体管。

    Razor
    93.
    外观设计
    Razor 有权

    公开(公告)号:USD585157S1

    公开(公告)日:2009-01-20

    申请号:US29324943

    申请日:2008-09-24

    申请人: Young-soo Park

    设计人: Young-soo Park

    Oxide semiconductors and thin film transistors comprising the same
    94.
    发明申请
    Oxide semiconductors and thin film transistors comprising the same 有权
    氧化物半导体和包括其的薄膜晶体管

    公开(公告)号:US20080315200A1

    公开(公告)日:2008-12-25

    申请号:US12213327

    申请日:2008-06-18

    IPC分类号: H01L29/10

    CPC分类号: H01L29/7869

    摘要: Oxide semiconductors and thin film transistors (TFTs) including the same are provided. An oxide semiconductor includes Zn atoms and at least one of Hf and Cr atoms added thereto. A thin film transistor (TFT) includes a channel including an oxide semiconductor including Zn atoms and at least one of Hf and Cr atoms added thereto.

    摘要翻译: 提供包括其的氧化物半导体和薄膜晶体管(TFT)。 氧化物半导体包括Zn原子和添加了Hf原子和Cr原子中的至少一种。 薄膜晶体管(TFT)包括包括包含Zn原子和添加有Hf原子和Cr原子中的至少一种的氧化物半导体的沟道。

    Thin film transistor, method of manufacturing the same, and flat panel display having the same
    97.
    发明申请
    Thin film transistor, method of manufacturing the same, and flat panel display having the same 有权
    薄膜晶体管,其制造方法和具有该薄膜晶体管的平板显示器

    公开(公告)号:US20080258141A1

    公开(公告)日:2008-10-23

    申请号:US12007085

    申请日:2008-01-07

    IPC分类号: H01L21/44 H01L29/12

    摘要: A thin film transistor (TFT), a method of manufacturing the TFT, and a flat panel display comprising the TFT are provided. The TFT includes a gate, a gate insulating layer that contacts the gate, a channel layer that contacts the gate insulating layer and faces the gate with the gate insulating layer therebetween, a source that contacts an end of the channel layer; and a drain that contacts an other end of the channel layer, wherein the channel layer is an amorphous oxide semiconductor layer, and each of the source and the drain is a conductive oxide layer comprising an oxide semiconductor layer having a conductive impurity in the oxide semiconductor layer. A low resistance metal layer can further be included on the source and drain. A driving circuit of a unit pixel of a flat panel display includes the TFT.

    摘要翻译: 提供薄膜晶体管(TFT),制造TFT的方法以及包括TFT的平板显示器。 TFT包括栅极,与栅极接触的栅极绝缘层,与栅极绝缘层接触且与栅极绝缘层面对栅极的沟道层,接触沟道层的端部的源极; 以及与沟道层的另一端接触的漏极,其中,所述沟道层为非晶氧化物半导体层,所述源极和漏极中的每一个为包含氧化物半导体中具有导电杂质的氧化物半导体层的导电氧化物层 层。 源极和漏极可以进一步包含低电阻金属层。 平板显示器的单位像素的驱动电路包括TFT。

    ZnO diode and method of forming the same
    98.
    发明申请
    ZnO diode and method of forming the same 审中-公开
    ZnO二极管及其形成方法

    公开(公告)号:US20080142796A1

    公开(公告)日:2008-06-19

    申请号:US11980454

    申请日:2007-10-31

    IPC分类号: H01L29/10 H01L21/16

    摘要: A zinc oxide (ZnO) group and method of forming the same are provided. The ZnO group diode may include a first electrode and a second electrode that are separated from each other, and an active layer formed of MxIn1-xZnO (wherein “M” is a Group III metal) between the first electrode and the second electrode. The first electrode may have a work function lower than the active layer. The second electrode may have a work function higher than the active layer.

    摘要翻译: 提供氧化锌(ZnO)基团及其形成方法。 ZnO族二极管可以包括彼此分离的第一电极和第二电极,以及由M 1 x In 1 x x ZnO形成的有源层(其中“ M“是第III族金属)。 第一电极可具有低于有源层的功函数。 第二电极可具有比有源层高的功函数。

    Semiconductor device and method of manufacturing the same
    100.
    发明申请
    Semiconductor device and method of manufacturing the same 有权
    半导体装置及其制造方法

    公开(公告)号:US20070252147A1

    公开(公告)日:2007-11-01

    申请号:US11785269

    申请日:2007-04-17

    IPC分类号: H01L29/04

    CPC分类号: H01L29/7869

    摘要: A semiconductor device may include a composite represented by Formula 1 below as an active layer. x(Ga2O3)·y(In2O3)·z(ZnO)  Formula 1wherein, about 0.75≦x/z≦about 3.15, and about 0.55≦y/z≦about 1.70. Switching characteristics of displays and driving characteristics of driving transistors may be improved by adjusting the amounts of a gallium (Ga) oxide and an indium (In) oxide mixed with a zinc (Zn) oxide and improving optical sensitivity.

    摘要翻译: 半导体器件可以包括由下面的式1表示的复合物作为有源层。 <?in-line-formula description =“In-line Formulas”end =“lead”?> x(Ga 2 2 O 3 3)y(In < z(ZnO)式1 <?in-line-formula description =“In-line Formulas”end =“tail”?>其中,约0.75 <= x / z <=约3.15,约0.55≤y/z≤约1.70。 可以通过调节与锌(Zn)氧化物混合的镓(Ga)氧化物和铟(In))的量来提高驱动晶体管的开关特性并提高光学灵敏度。