Memory cell programming that cancels threshold voltage drift

    公开(公告)号:US11887665B2

    公开(公告)日:2024-01-30

    申请号:US17720542

    申请日:2022-04-14

    发明人: Hari Giduturi

    IPC分类号: G11C11/00 G11C13/00

    摘要: The present disclosure includes apparatuses, methods, and systems for memory cell programming that cancels threshold voltage drift. An embodiment includes a memory having a plurality of memory cells, and circuitry configured to program a memory cell of the plurality of memory cells to one of two possible data states by applying a first voltage pulse to the memory cell, wherein the first voltage pulse has a first polarity and a first magnitude, and applying a second voltage pulse to the memory cell, wherein the second voltage pulse has a second polarity that is opposite the first polarity and a second magnitude that can be greater than the first magnitude.

    NEGATIVE DIFFERENTIAL RESISTANCE CIRCUIT ELEMENT
    9.
    发明申请
    NEGATIVE DIFFERENTIAL RESISTANCE CIRCUIT ELEMENT 有权
    负电阻电阻电路元件

    公开(公告)号:US20160351622A1

    公开(公告)日:2016-12-01

    申请号:US15114010

    申请日:2014-01-31

    IPC分类号: H01L27/24 G11C13/00 H01L45/00

    摘要: A circuit component that exhibits a region of negative differential resistance includes: a first layer of material; and a second layer of material in contact with the first layer of material, the contact forming a first self-heating interface. The first self-heating interface is structured such that an electrical current flowing from the first layer of material to the second layer of material encounters an electrical impedance occurring at the first interface that is greater than any electrical impedance occurring in the first and second layers of material, wherein heating occurring at the first interface is dominated by Joule heating caused by the electrical impedance occurring at the first interface, and wherein the electrical impedance occurring at the first interface decreases with increasing temperature to induce a region of negative differential resistance.

    摘要翻译: 具有负差分电阻的区域的电路部件包括:第一层材料; 以及与所述第一材料层接触的第二材料层,所述接触件形成第一自加热界面。 第一自加热界面被构造成使得从第一材料层流向第二层材料的电流遇到在第一界面处发生的电阻抗大于在第一和第二层中发生的任何电阻抗 材料,其中在第一界面处发生的加热由由在第一界面处发生的电阻抗引起的焦耳加热主导,并且其中在第一界面处发生的电阻抗随温度升高而降低,以引起负差分电阻的区域。

    RESISTIVE CROSSPOINT MEMORY ARRAY SENSING
    10.
    发明申请
    RESISTIVE CROSSPOINT MEMORY ARRAY SENSING 有权
    电阻式记忆阵列感测

    公开(公告)号:US20160267970A1

    公开(公告)日:2016-09-15

    申请号:US15031106

    申请日:2013-10-29

    IPC分类号: G11C13/00

    摘要: A method includes applying a voltage bump across a combined memory device comprising a volatile selector switch and a nonvolatile switch, in which the voltage bump changes a state of the volatile selector switch from a high resistance to a low resistance but does not change a state of the nonvolatile switch. A read voltage that is lower than the voltage bump across the combined memory device to read a state of the nonvolatile switch.

    摘要翻译: 一种方法包括在包括易失性选择器开关和非易失性开关的组合存储器件中施加电压突起,其中电压凸起将易失性选择器开关的状态从高电阻改变为低电阻,但不改变 非易失性开关。 读取电压低于组合存储器件上的电压突起,以读取非易失性开关的状态。