Abstract:
A process for non-destructive testing includes applying a photo-curable dye to a surface of an article, selectively curing an array of dots of the photo-curable dye on the surface, removing the photo-curable dye that has not been selectively cured, mechanically testing the article, and direct strain imaging the article during the mechanical testing based on the array of dots.
Abstract:
A method for analyzing stress in an object according to spectrum data is provided. The spectrum data is obtained from an interference fringe pattern of the object that results from performing photoelasticity. The method includes: analyzing the spectrum data to obtain three sets of intensity data related respectively to different wavelengths of light used in photoelasticity; calculating wrapped phases according to the three sets of intensity data, respectively; calculating preliminary stress values according to the wrapped phases, respectively; determining a system of stress equations according to a relation among the preliminary stress values; and calculating an estimated stress value using the system of stress equations.
Abstract:
A method and apparatus for improving contrast in prism coupling measurements of waveguide mode spectra, wherein the measured waveguide sample has a surface region of rapidly decreasing index, characterized with normalized slope λ n ⅆ n ⅆ z > 0.0004 . An opaque light-blocking element is placed in the portion of the light beam closest to the plane of the contact between prism and measured sample, on the input side, output side or both sides of the prism. The light blocking element prevents light from the light source to reach a portion of the length of the prism-sample coupling interface along the optical path, prevents light reflected from a portion of the aforementioned length to reach the detector, or both when input and output light-blocking elements are used.
Abstract:
A sensor system for a laminated structure may include a sensor assembly disposed between a first layer and a second layer of the laminated structure. The sensor assembly may include a first anchor member and a second anchor member spaced at a predetermined distance from one another. A sensor chamber is formed between the first and second anchor members. The sensor assembly may also include a sensing line extending through the anchor members and the sensor chamber. The sensing line may include a configuration within the sensor chamber for sensing one of stress forces within the laminated structure, temperature or temperature changes within the laminated structure. A first transport tube may extend from the first anchor member opposite the sensor chamber and a second transport tube may extend from the second anchor member opposite the sensor chamber. The sensing line extends through the first and second transport tubes.
Abstract:
Inspection of microelectronic devices is described using near infrared light. In one example, a dielectric material layer on a substrate is illuminated with a near infrared light beam. The substrate has at least one contact land, the dielectric material layer overlies at least a portion of the contact land, and the substrate has at least one via defined in the dielectric material layer, the via exposing at least a portion of the contact land. Reflected near infrared light is reflected from the substrate at a camera. The position of the via is determined relative to the contact land from the reflected light beam using an image processing device.
Abstract:
Methods of capturing improved-contrast mode spectra of a double ion-exchanged (DIOX) glass sample using prism coupling of index np. The DIOX glass sample has a refractive index profile with a first region adjacent the surface that satisfies 0.0005 ≤ λ n ⅆ n ⅆ x ≤ 0.0009 , where λ is a wavelength of measuring light. The prism-sample interface includes an interfacing liquid of index nf that differs from np by no more than 0.03, and that can exceed np. The mode spectra have a contrast that is higher than that obtained by conventional prism coupling by using gradient illumination or partially blocked illumination that reduces the amount of background reflected light from the coupling prism. The improved-contrast mode spectra can be processed using conventional means to determine at least one stress characteristic of the DIOX glass sample.
Abstract:
A printing system is used printing an image on a web of media that is photoelastic and at least partially transparent. A web advance system advances the web of media supplied from an input roll in an in-track direction along a web transport path. At least one printing station is disposed along the web transport path for printing on the web of media. One or more photoelastic measurement devices disposed along the web transport path for characterizing stress in the web of media, and a controller that controls at least one aspect of the printing system responsive to signals received from the one or more photoelastic measurement devices.
Abstract:
A witness material for monitoring an environmental history of an object may include a material containing a dye of a type that fluoresces in response to actinic radiation in one or both of a shift in color and a change in intensity when subjected to a predetermined stress above a predetermined level; and the material forming a coating on one or more of an outer container for the object, an inner container for the object, a tape that is applied to an outer container for the object, a tape that is applied to an inner container for the object, a shrink wrap enclosing the object, an outer surface of the object, and an inner surface of the object.
Abstract:
Inspection of microelectronic devices is described using near infrared light. In one example, a dielectric material layer on a substrate is illuminated with a near infrared light beam. The substrate has at least one contact land, the dielectric material layer overlies at least a portion of the contact land, and the substrate has at least one via defined in the dielectric material layer, the via exposing at least a portion of the contact land. Reflected near infrared light is reflected from the substrate at a camera. The position of the via is determined relative to the contact land from the reflected light beam using an image processing device.
Abstract:
A strain gauge or other device may include a deformable medium and discrete plasmon supporting structures arranged to create one or more plasmon resonances that change with deformation of the medium and provide the device with an optical characteristic that indicates the deformation of the medium.