Hall cell with offset voltage control
    91.
    发明授权
    Hall cell with offset voltage control 失效
    霍尔电池带偏置电压控制

    公开(公告)号:US3825777A

    公开(公告)日:1974-07-23

    申请号:US33247573

    申请日:1973-02-14

    Applicant: IBM

    Inventor: BRAUN R

    CPC classification number: H01L27/22 H01L43/065 H03K17/90

    Abstract: Offset voltage control means are provided for a semiconductor type Hall cell. The control means includes one or more auxiliary electrodes disposed at preselected spatial positions of the cell between the latter''s current and sense electrodes. The auxiliary electrode(s) when connected to a predetermined electrical supply provide an auxiliary electrical field which controls the offset voltage at the sense electrodes.

    Abstract translation: 为半导体型霍尔单元提供偏移电压控制装置。 控制装置包括一个或多个辅助电极,其设置在电池的电流和感测电极之间的预选的空间位置。 辅助电极当连接到预定电源时提供辅助电场,其控制感测电极处的偏移电压。

    Hall element
    92.
    发明授权
    Hall element 失效
    霍尔元素

    公开(公告)号:US3823354A

    公开(公告)日:1974-07-09

    申请号:US36489273

    申请日:1973-05-29

    Applicant: PHILIPS CORP

    Inventor: JANSSEN J

    CPC classification number: H01L27/22 H01L43/065

    Abstract: The invention relates to a semiconductor device having a Hall element. In order to reduce the offset voltage between the connection contacts for deriving the Hall signals and in order to increase the stability, the Hall element shows a number of subHall elements which are arranged parallel to each other. The Hall bodies of the sub-Hall elements, viewed on the surface of the semiconductor body, are situated beside each other in the semiconductor body and show different directions of current. The semiconductor body may be constituted by an epitaxial layer of ntype silicon on a substrate of p-type silicon. The Hall element may be manufactured by using methods which are generally known in manufacturing integrated circuits.

    SENSOR DEFECT DIAGNOSTIC CIRCUIT
    97.
    发明申请

    公开(公告)号:US20190107578A1

    公开(公告)日:2019-04-11

    申请号:US16154960

    申请日:2018-10-09

    Abstract: A sensor device comprises a sensor connected to a first signal and responsive to an external field to produce a sensor signal, a test device connected to a second signal and electrically connected in series with the sensor by an electrical test connection providing a test signal, and a monitor circuit electrically connected to the first, second and test signals. The monitor circuit comprises a processing circuit and a determination circuit. The processing circuit is responsive to the test signal and a predetermined processing value to form a processing output signal. The determination circuit is responsive to the processing output signal to determine a diagnostic signal. A sensor circuit responsive to the sensor signal provides a sensor device signal responsive to the external field.

    HALL EFFECT SENSOR WITH ENHANCED SENSITIVITY AND METHOD FOR PRODUCING THE SAME

    公开(公告)号:US20190097126A1

    公开(公告)日:2019-03-28

    申请号:US16200079

    申请日:2018-11-26

    CPC classification number: H01L43/065 H01L27/22 H01L43/04 H01L43/14

    Abstract: Methods of forming a high sensitivity Hall effect sensor having a thin Hall plate and the resulting devices are provided. Embodiments include providing a SOI substrate having a sequentially formed Si substrate and BOX and Si layers; forming a first STI structure in a first portion of the Si layer above the BOX layer, the first STI structure having a cross-shaped pattern; forming a second STI structure in a frame-shaped pattern in a second portion of the Si layer; the second STI structure formed outside and adjacent to the first STI structure; removing a portion of the Si layer between the first and second STI structures down to the BOX layer; removing the first STI structure, a cross-shaped Si layer remaining; and implanting N+ dopant ions into each end of the cross-shaped Si layer to form N+ implantation regions.

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