摘要:
An internal voltage generator when activated, generates an internal voltage to be supplied to an internal circuit. Operating the internal voltage generator consumes a predetermined amount of the power. In response to a control signal from the exterior, an entry circuit inactivates the internal voltage generator. When the internal voltage generator is inactivated, the internal voltage is not generated, thereby reducing the power consumption. By the control signal from the exterior, therefore, a chip can easily enter a low power consumption mode. The internal voltage generator is exemplified by a booster for generating the boost voltage of a word line connected with memory cells, a substrate voltage generator for generating a substrate voltage, or a precharging voltage generator for generating the precharging voltage of bit lines to be connected with the memory cells.
摘要:
The memory system comprises: a semiconductor memory that includes an internal circuit, which operates according to a first power supply voltage, and a memory input/output circuit, which is coupled to the internal circuit and operates according to a second power supply voltage; a first control unit that includes a control input/output circuit, which is coupled to the memory input/output circuit and operates according to the second power supply voltage; a voltage generating unit that generates the second power supply voltage and changes the second power supply voltage according to a voltage adjustment signal; a clock generating unit that generates the clock signal and changes the frequency of the clock signal according to a clock adjustment signal; and a second control unit that generates the voltage adjustment signal and the clock adjustment signal according to an access state of the semiconductor memory by the first control unit.
摘要:
An internal voltage generator when activated, generates an internal voltage to be supplied to an internal circuit. Operating the internal voltage generator consumes a predetermined amount of the power. In response to a control signal from the exterior, an entry circuit inactivates the internal voltage generator. When the internal voltage generator is inactivated, the internal voltage is not generated, thereby reducing the power consumption. By the control signal from the exterior, therefore, a chip can easily enter a low power consumption mode. The internal voltage generator is exemplified by a booster for generating the boost voltage of a word line connected with memory cells, a substrate voltage generator for generating a substrate voltage, or a precharging voltage generator for generating the precharging voltage of bit lines to be connected with the memory cells.
摘要:
A word control circuit activates word lines corresponding to a start row address and a next row address overlapping in the continuous mode. Accordingly, even in the case where the start address indicates an end memory cell connected to a word line, the switching operation of the word lines can be thus accessed in a sequential manner. That is, a controller accessing a semiconductor memory device can access the memory without data interruption. This can prevent the data transfer rate from lowering. Furthermore, it is made unnecessary to form a signal and control circuit for informing a controller of the fact that a word line is being switched so that the construction of a semiconductor memory device and a control circuit of the controller can be simplified. This results in reduction of the system cost.
摘要:
A word control circuit activates word lines corresponding to a start row address and a next row address overlappingly in the continuous mode. Accordingly, even in the case where the start address indicates an end memory cell connected to a word line, the switching operation of the word line becomes unnecessary. Memory cells connected to different word lines can be thus accessed in a sequential manner. That is, a controller accessing a semiconductor memory device can access the memory without data interruption. This can prevent the data transfer rate from lowering. Furthermore, it is made unnecessary to form a signal and a control circuit for informing a controller of the fact that a word line is being switched so that the construction of a semiconductor memory device and a control circuit of the controller can be simplified. This results in reduction of the system cost.
摘要:
A memory device is provided which has: a memory cell to store data; a word line to select the memory cell; a bit line connectable to the selected memory cell; a precharge power supply to supply a precharge voltage to the bit line; a precharge circuit to connect or disconnect the precharge power supply to or from the bit line; and a current limiting element to control the magnitude of a current flowing between the precharge power supply and the bit line at least by two steps according to an operation status.
摘要:
When a test command is received n times, any one of a plurality of tests is started. After the first test is started, any one of the tests is started or terminated every time the test command is received a predetermined number of times which is less than the n times. The number of times of the test command supplied to start or terminate the second and subsequent tests can be less than that of the first test. Accordingly, the time of the second and subsequent tests can be shortened. Since the first test is started only when the test command is received n times, the test is not started accidentally due to noise or the like in normal operation. Namely, the test time can be shortened without decreasing the operation reliability of an integrated circuit. Particularly, when a plurality of tests is executed successively, great benefit can be obtained.
摘要:
The present invention provides a semiconductor memory device of a twin-storage type having an operation control method and a circuit structure that achieve a higher process rate, a less power consumption, and a smaller chip area. This semiconductor memory device includes bit lines in pairs, a sense amplifier connected to each pair of the bit lines, a first memory cell connected to one bit line of each pair of the bit lines, a second memory cell that is connected to the other bit line of each pair of the bit lines and stores the inverted data of the data stored in the first memory cell. This semiconductor memory device is characterized by not having means to pre-charge the bit lines to a predetermined potential. The semiconductor memory device of the present invention is also characterized by including a control circuit that controls the sense amplifier to start a pull-down operation after starting a pull-up operation.
摘要:
A refresh control circuit generates a refresh request in a predetermined cycle. A first burst control circuit outputs a predetermined number of strobe signals in accordance with an access command. A burst access operation is executed by an access command. A data input/output circuit successively inputs data to be transferred to a memory cell array or successively outputs data supplied from the memory cell array, in synchronization with the strobe signals. An arbiter determines which of a refresh operation or a burst access operation is to be executed first, when the refresh request and the access command conflict with each other. Therefore, the refresh operation and burst access operation can be sequentially executed without being overlapped. As a result, read data can be outputted at a high speed, and write data can be inputted at a high speed. That is, the data transfer rate can be improved.
摘要:
A method for controlling a semiconductor memory in which mode register can be set in burst mode. To set an operation mode in burst mode, the semiconductor memory is changed first from the burst mode, through power-down mode, to standby mode of non-burst mode. Then the semiconductor memory is changed to mode register set mode to set the mode register when commands are input in the same predetermined sequence that is used in the non-burst mode.