公开(公告)号：US20100167497A1

公开(公告)日：2010-07-01

申请号：US12422723

申请日：2009-04-13

Applicant: Ming Fang ,  Fuchao Wang

Inventor： Ming Fang ,  Fuchao Wang

IPC: H01L21/311

CPC classification number: B81C1/00047 ,  B01L3/502707 ,  B01L7/00 ,  B41J2/14129 ,  B41J2/14137 ,  B41J2202/13 ,  B81B2201/058 ,  B81B2207/015 ,  G01L9/0042 ,  G01L9/0098 ,  G01P15/0802 ,  G01P2015/0828

Abstract: A method includes growing a first oxide region concurrently with a second oxide region in a substrate and forming an inlet path to the first oxide region, the inlet path exposing a first surface of the first oxide region. The method also includes removing the first oxide region to form a chamber, forming a first MOS transistor adjacent the second oxide region, and forming a second MOS transistor separated from the first MOS transistor by the second oxide region.

Abstract translation: 一种方法包括与衬底中的第二氧化物区域同时生长第一氧化物区域并形成到第一氧化物区域的入口路径，入口路径暴露第一氧化物区域的第一表面。 该方法还包括去除第一氧化物区域以形成室，形成与第二氧化物区域相邻的第一MOS晶体管，以及通过第二氧化物区域形成与第一MOS晶体管分离的第二MOS晶体管。

公开(公告)号：US07514714B2

公开(公告)日：2009-04-07

申请号：US11355937

申请日：2006-02-16

Applicant: Ming Fang ,  Fuchao Wang

Inventor： Ming Fang ,  Fuchao Wang

IPC: H01L27/108 ,  H01L29/04 ,  H01L29/12 ,  H01L29/76 ,  H01L31/036 ,  H01L31/112

CPC classification number: H01L29/78624 ,  H01L29/086 ,  H01L29/42368 ,  H01L29/7824

Abstract: A thin film power transistor includes a plurality of first doped regions over a substrate and a second doped region forming a body. At least a portion of the body is disposed between the plurality of first doped regions. The thin film power transistor also includes a gate over the substrate. The thin film power transistor further includes a dielectric layer, at least a portion of which is disposed between (i) the gate and (ii) the first and second doped regions. In addition, the thin film power transistor includes a plurality of contacts contacting the plurality of first doped regions, where the plurality of first doped regions forms a source and a drain of the thin film power transistor. The first doped regions could represent n-type regions (such as N− regions), and the second doped region could represent a p-type region (such as a P− region). The first doped regions could also represent p-type regions, and the second doped region could represent an n-type region.

Abstract translation: 薄膜功率晶体管包括在衬底上的多个第一掺杂区域和形成主体的第二掺杂区域。 身体的至少一部分设置在多个第一掺杂区域之间。 薄膜功率晶体管还包括在衬底上的栅极。 薄膜功率晶体管还包括介电层，其至少一部分设置在（i）栅极和（ii）第一和第二掺杂区域之间。 此外，薄膜功率晶体管包括接触多个第一掺杂区域的多个触点，其中多个第一掺杂区域形成薄膜功率晶体管的源极和漏极。 第一掺杂区域可以表示n型区域（例如N区域），并且第二掺杂区域可以表示p型区域（例如P-区域）。 第一掺杂区域也可以表示p型区域，第二掺杂区域可以表示n型区域。

公开(公告)号：US07465660B2

公开(公告)日：2008-12-16

申请号：US10424800

申请日：2003-04-28

Applicant: Fuchao Wang ,  Ming Fang

Inventor： Fuchao Wang ,  Ming Fang

IPC: H01L21/44

CPC classification number: H01L21/28061 ,  H01L29/4933

Abstract: A silicide having variable internal metal concentration tuned to surface conditions at the interface between the silicide and adjoining layers is employed within an integrated circuit. Higher silicon/metal (silicon-rich) ratios are employed near the interfaces to adjoining layers to reduce lattice mismatch with underlying polysilicon or overlying oxide, thereby reducing stress and the likelihood of delamination. A lower silicon/metal ratio is employed within an internal region of the silicide, reducing resistivity. The variable silicon/metal ratio is achieved by controlling reactant gas concentrations or flow rates during deposition of the silicide. Thinner silicides with less likelihood of delamination or metal oxidation may thus be formed.

Abstract translation: 在集成电路内采用具有调整到硅化物和相邻层之间的界面处的表面状态的可变内部金属浓度的硅化物。 在靠近相邻层的界面附近使用更高的硅/金属（富硅）比例，以减少与下面的多晶硅或上覆氧化物的晶格失配，从而减少应力和分层的可能性。 在硅化物的内部区域内采用较低的硅/金属比，降低了电阻率。 可变硅/金属比例通过在硅化物沉积期间控制反应气体浓度或流速来实现。 因此可能形成较少的分层可能性或金属氧化的较薄的硅化物。

公开(公告)号：US07457674B2

公开(公告)日：2008-11-25

申请号：US11210485

申请日：2005-08-24

Applicant: Chao Yuan ,  Claus Neubauer ,  Zehra Cataltepe ,  Wesley McCorkle ,  Hans-Gerd Brummel ,  Ming Fang

Inventor： Chao Yuan ,  Claus Neubauer ,  Zehra Cataltepe ,  Wesley McCorkle ,  Hans-Gerd Brummel ,  Ming Fang

IPC: G05B13/02

CPC classification number: G05B17/02 ,  G05B23/0243

Abstract: A system for updating a plurality of monitoring models is provided. The system includes a model association module that, for each of a plurality of monitored systems determines, an association between a particular monitored system and at least one of a plurality of estimation models. Each estimation model is based upon one of a plurality of distinct sets of estimation properties, and each set uniquely corresponds to a particular estimation model. The system also includes an updating module that updates at least one of the estimation properties and propagates the updated estimation properties to each estimation model that corresponds to a distinct set containing at least one estimation property that is updated. The system further includes a model modification module that modifies each estimation model that corresponds to a distinct set containing at least one estimation property that is updated.

Abstract translation: 提供了一种用于更新多个监视模型的系统。 该系统包括模型关联模块，对于多个被监视系统中的每一个确定特定监视系统与多个估计模型中的至少一个之间的关联。 每个估计模型基于多个不同的估计属性集合之一，并且每个估计模型唯一地对应于特定估计模型。 该系统还包括更新模块，其更新估计属性中的至少一个并且将更新的估计属性传播到对应于包含至少一个被更新的估计属性的不同集合的每个估计模型。 该系统还包括模型修改模块，其修改对应于包含至少一个被更新的估计属性的不同集合的每个估计模型。

公开(公告)号：US20080152812A1

公开(公告)日：2008-06-26

申请号：US11644432

申请日：2006-12-22

Applicant: Ming Fang ,  Steve Keating ,  Vani Thirumala ,  Lin Sha ,  Bruce Beattie

Inventor： Ming Fang ,  Steve Keating ,  Vani Thirumala ,  Lin Sha ,  Bruce Beattie

IPC: B05D3/00 ,  B08B7/00 ,  C11D7/00

CPC classification number: C11D3/0073 ,  C11D3/3427 ,  C11D3/43 ,  C11D11/0029

Abstract: Methods and associated structures of forming a microelectronic device are described. Those methods may comprise forming a thin metal-organic layer on a copper structure, wherein the thin metal-organic layer substantially prevents corrosion of the copper structure, and wherein the thin metal-organic layer comprises an organo-copper compound comprising an alkyl group and a thiol group. In addition, methods of applying a high pH cleaning process using a surfactant to improve surface wetting in a low foaming solution is described.

Abstract translation: 描述形成微电子器件的方法和相关结构。 这些方法可以包括在铜结构上形成薄的金属 - 有机层，其中薄金属 - 有机层基本上防止了铜结构的腐蚀，并且其中薄金属 - 有机层包括含有烷基的有机铜化合物和 硫醇基。 此外，描述了使用表面活性剂施加高pH清洁方法以改善低发泡溶液中的表面润湿性的方法。

公开(公告)号：US07305317B2

公开(公告)日：2007-12-04

申请号：US10932573

申请日：2004-09-02

Applicant: Chao Yuan ,  Zehra Cataltepe ,  Claus Neubauer ,  Ming Fang

Inventor： Chao Yuan ,  Zehra Cataltepe ,  Claus Neubauer ,  Ming Fang

IPC: G01C25/00

CPC classification number: G05B23/0254 ,  G05B23/0235

Abstract: A joint approach of out-of-range detection and fault detection for power plant monitoring. The method initially determines whether a sensor is an independent sensor or a dependent sensor. If the sensor is an independent sensor, then an operating range is established for each independent sensor. A reading from each independent sensor is then compared with the operating range that has been established. If the reading is out-of-range, an alarm may be activated. If the reading is not out-of-range, then this reading is used to determine an expected operating range for each dependent sensor. A reading from each dependent sensor is then compared with the predicted operating range. Again, if the reading from the dependent sensor is out of the expected range, an alarm may be sounded.

Abstract translation: 电站监控的超范围检测和故障检测的联合方法。 该方法最初确定传感器是独立传感器还是依赖传感器。 如果传感器是独立的传感器，则为每个独立的传感器建立一个工作范围。 然后将每个独立传感器的读数与已建立的操作范围进行比较。 如果读数超出范围，则可能会激活报警。 如果读数不超出范围，则该读数用于确定每个相关传感器的预期工作范围。 然后将每个从属传感器的读数与预测的工作范围进行比较。 再次，如果来自从属传感器的读数超出预期范围，则可能会发出警报。

公开(公告)号：US07279720B2

公开(公告)日：2007-10-09

申请号：US10864188

申请日：2004-06-08

Applicant: Ming Fang ,  Valery Dubin ,  Daoqiang Lu

Inventor： Ming Fang ,  Valery Dubin ,  Daoqiang Lu

IPC: H01L33/00

CPC classification number: H01L24/16 ,  G02B6/4204 ,  G02B6/4232 ,  H01L24/11 ,  H01L24/81 ,  H01L2224/1134 ,  H01L2224/1147 ,  H01L2224/13099 ,  H01L2224/13144 ,  H01L2224/16 ,  H01L2224/81193 ,  H01L2224/8121 ,  H01L2224/81815 ,  H01L2924/00013 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01015 ,  H01L2924/01022 ,  H01L2924/01023 ,  H01L2924/01024 ,  H01L2924/01027 ,  H01L2924/01029 ,  H01L2924/01032 ,  H01L2924/01033 ,  H01L2924/01042 ,  H01L2924/01044 ,  H01L2924/01045 ,  H01L2924/01046 ,  H01L2924/01047 ,  H01L2924/01073 ,  H01L2924/01074 ,  H01L2924/01075 ,  H01L2924/01076 ,  H01L2924/01077 ,  H01L2924/01078 ,  H01L2924/01079 ,  H01L2924/014 ,  H01L2924/04941 ,  H01L2924/14 ,  H01L2924/15151 ,  H01L2924/19041 ,  H01L2924/19043 ,  H01L2924/00014 ,  H01L2924/00015 ,  H01L2224/29099

Abstract: The invention provides bumps between a die and a substrate with a height greater than or equal to a height of a waveguide between the die and the substrate. The bumps may be formed on a die prior to that die being singulated from a wafer.

Abstract translation: 本发明提供了一种具有高于或等于管芯和衬底之间的波导高度的管芯和衬底之间的凸起。 在从芯片被切割成晶片之前，可以在模具上形成凸块。

公开(公告)号：US07183905B2

公开(公告)日：2007-02-27

申请号：US10932576

申请日：2004-09-02

Applicant: Claus Neubauer ,  Zehra Cataltepe ,  Chao Yuan ,  Jie Cheng ,  Ming Fang ,  Wesley McCorkle

Inventor： Claus Neubauer ,  Zehra Cataltepe ,  Chao Yuan ,  Jie Cheng ,  Ming Fang ,  Wesley McCorkle

IPC: G08B29/00

CPC classification number: G05B23/0272 ,  Y04S10/522

Abstract: A tool for sensor management and fault visualization in machine condition monitoring. The method and system are able to monitor a plurality of sensors at one time. The sensors may be used in a power plant system monitoring system. The method and system may display a fault status for each sensor in the plurality of sensors in a single display, wherein the fault status for each sensor is displayed over time. The method and system also provide a mechanism that permits a user to examine details of each sensor in the plurality of sensors at any given time. In addition, the method and system are capable of categorizing each fault in the fault status using one or more properties or categorizing criteria. The method and system also permit sensors to be tested such that different operating models may be examined by utilizing different sensors.

Abstract translation: 机器状态监测中的传感器管理和故障可视化工具。 该方法和系统能够一次监视多个传感器。 传感器可用于发电厂系统监控系统。 该方法和系统可以在单个显示器中的多个传感器中的每个传感器显示故障状态，其中每个传感器的故障状态随时间显示。 该方法和系统还提供了允许用户在任何给定时间检查多个传感器中的每个传感器的细节的机构。 此外，该方法和系统能够使用一个或多个属性或分类标准对故障状态中的每个故障进行分类。 该方法和系统还允许测试传感器，使得可以通过利用不同的传感器检查不同的操作模型。

公开(公告)号：US20060047512A1

公开(公告)日：2006-03-02

申请号：US11210485

申请日：2005-08-24

Applicant: Chao Yuan ,  Claus Neubauer ,  Zehra Cataltepe ,  Wesley McCorkle ,  Hans-Gerd Brummel ,  Ming Fang

Inventor： Chao Yuan ,  Claus Neubauer ,  Zehra Cataltepe ,  Wesley McCorkle ,  Hans-Gerd Brummel ,  Ming Fang

IPC: G10L15/06

CPC classification number: G05B17/02 ,  G05B23/0243

Abstract: A system for updating a plurality of monitoring models is provided. The system includes a model association module that, for each of a plurality of monitored systems determines, an association between a particular monitored system and at least one of a plurality of estimation models. Each estimation model is based upon one of a plurality of distinct sets of estimation properties, and each set uniquely corresponds to a particular estimation model. The system also includes an updating module that updates at least one of the estimation properties and propagates the updated estimation properties to each estimation model that corresponds to a distinct set containing at least one estimation property that is updated. The system further includes a model modification module that modifies each estimation model that corresponds to a distinct set containing at least one estimation property that is updated.

Abstract translation: 提供了一种用于更新多个监视模型的系统。 该系统包括模型关联模块，对于多个被监视系统中的每一个确定特定监视系统与多个估计模型中的至少一个之间的关联。 每个估计模型基于多个不同的估计属性集合之一，并且每个估计模型唯一地对应于特定估计模型。 该系统还包括更新模块，其更新估计属性中的至少一个并且将更新的估计属性传播到对应于包含至少一个被更新的估计属性的不同集合的每个估计模型。 该系统还包括模型修改模块，其修改对应于包含至少一个被更新的估计属性的不同集合的每个估计模型。

公开(公告)号：US06980685B2

公开(公告)日：2005-12-27

申请号：US10042887

申请日：2002-01-09

Applicant: Jenn-Kwei Tyan ,  Ming Fang

Inventor： Jenn-Kwei Tyan ,  Ming Fang

IPC: G06T5/00 ,  G06T7/00 ,  G06K9/00 ,  G06K9/34

CPC classification number: G06T7/0006 ,  G06T7/12 ,  G06T7/194 ,  G06T2207/30141 ,  G06T2207/30148

Abstract: A system and method for object inspection includes an object modeler; an iterative object segmentor in signal communication with the object modeler for receiving an input image and model parameters and producing a segmented image; a moment transformer in signal communication with the iterative object segmentor for receiving an input image, model parameters and a segmented image and producing estimates of object translation, rotation and scaling; an edge detector and interpolator in signal communication with the moment transformer for receiving an input image, model parameters and estimates and producing a set of line edges; and an iterative optimizer in signal communication with the edge detector and interpolator for receiving an input image, model parameters, estimates and line edges and producing refined estimates of object translation, rotation and scaling.