On-SOI integrated circuit comprising a subjacent protection transistor
    112.
    发明授权
    On-SOI integrated circuit comprising a subjacent protection transistor 有权
    SOI-SOI集成电路,包括一个下层保护晶体管

    公开(公告)号:US09337302B2

    公开(公告)日:2016-05-10

    申请号:US13933379

    申请日:2013-07-02

    CPC classification number: H01L29/66477 H01L27/0296 H01L27/0688 H01L27/1207

    Abstract: An integrated circuit features a FET, an UTBOX layer plumb with the FET, an underlayer ground plane with first doping plumb with the FET's gate and channel, first and second underlayer semiconducting elements, both plumb with the drain or source, electrodes in contact respectively with the ground plane and with the first element, one having first doping and being connected to a first voltage, the other having the first doping and connected to a second bias voltage different from the first, a semiconducting well having the second doping and plumb with the first ground plane and both elements, a first trench isolating the first FET from other components of the integrated circuit and extending through the layer into the well, and second and third trenches isolating the FET from the electrodes, and extending to a depth less than a plane/well interface.

    Abstract translation: 集成电路具有FET,具有FET的UTBOX层铅垂,具有FET的栅极和沟道的第一掺杂铅垂的下层接地层,第一和第二下层半导体元件,两者均与漏极或源极接触,电极分别接触 接地平面和第一元件,一个具有第一掺杂并且连接到第一电压,另一个具有第一掺杂并且连接到不同于第一掺杂的第二偏置电压,具有第二掺杂和铅垂的半导体阱与 第一接地平面和两个元件,第一沟槽将第一FET与集成电路的其它部件隔离并延伸穿过该阱进入阱,第二和第三沟槽将FET与电极隔离,并延伸至小于 平面/井界面。

    PROGRAMMING OF ANTIFUSE CELLS
    117.
    发明申请
    PROGRAMMING OF ANTIFUSE CELLS 有权
    抗体细胞的编程

    公开(公告)号:US20160078963A1

    公开(公告)日:2016-03-17

    申请号:US14844442

    申请日:2015-09-03

    CPC classification number: G11C17/18 G11C5/145 G11C17/16 G11C17/165

    Abstract: For programming an antifuse memory, the power consumption of the memory is assessed during programming mode. The power consumption is compared with a threshold. When the threshold is exceeded, indicative of successful programming of the antifuse memory cell, the programming mode is terminated.

    Abstract translation: 为了编程反熔丝存储器,在编程模式下评估存储器的功耗。 将功耗与阈值进行比较。 当超过阈值时,指示反熔丝存储器单元的成功编程,编程模式被终止。

    METHOD OF MANUFACTURING A PHOTONIC INTEGRATED CIRCUIT OPTICALLY COUPLED TO A LASER OF III-V MATERIAL
    119.
    发明申请
    METHOD OF MANUFACTURING A PHOTONIC INTEGRATED CIRCUIT OPTICALLY COUPLED TO A LASER OF III-V MATERIAL 有权
    光电耦合到III-V材料激光的光电集成电路的制造方法

    公开(公告)号:US20160047986A1

    公开(公告)日:2016-02-18

    申请号:US14804629

    申请日:2015-07-21

    Abstract: A method of manufacturing an integrated circuit including photonic components on a silicon layer and a laser made of a III-V group material includes providing the silicon layer positioned on a first insulating layer that is positioned on a support. First trenches are etched through the silicon layer and stop on the first insulating layer, and the first trenches are covered with a silicon nitride layer. Second trenches are etched through a portion of the silicon layer, and the first and second trenches are filled with silicon oxide, which are planarized. The method further includes removing the support and the first insulating layer, and bonding a wafer including a III-V group heterostructure on the rear surface of the silicon layer.

    Abstract translation: 制造包括硅层上的光子分量和由III-V族材料制成的激光的集成电路的方法包括提供位于位于支撑体上的第一绝缘层上的硅层。 第一沟槽被蚀刻穿过硅层并在第一绝缘层上停止,并且第一沟槽被氮化硅层覆盖。 第二沟槽被蚀刻通过硅层的一部分,并且第一和第二沟槽用平坦化的氧化硅填充。 该方法还包括去除支撑体和第一绝缘层,以及在硅层的后表面上接合包括III-V族异质结构的晶片。

    SCR simulation model
    120.
    发明授权
    SCR simulation model 有权
    SCR仿真模型

    公开(公告)号:US09235667B2

    公开(公告)日:2016-01-12

    申请号:US13852162

    申请日:2013-03-28

    CPC classification number: G06F17/5036

    Abstract: A model for simulating the electrical behavior of a thyristor includes a model of an NPN bipolar transistor whose emitter forms the cathode of the thyristor and the base forms a low-side control terminal of the thyristor, and a model of a PNP bipolar transistor whose emitter forms the anode of the thyristor and the base forms a high-side control terminal of the thyristor, the collector of the PNP transistor being connected to the low-side control terminal and the collector of the NPN transistor being connected to the high-side control terminal. The transistor models are present a small signal behavior over the entire range of anode currents of the thyristor, whereby the transistor models exhibit a gain drop when the anode current exits the small signal range.

    Abstract translation: 用于模拟晶闸管的电气行为的模型包括其发射极形成晶闸管的阴极并且基极形成晶闸管的低侧控制端的NPN双极晶体管的模型,以及PNP双极晶体管的模型,其发射极 形成晶闸管的阳极,基极形成晶闸管的高边控制端子,PNP晶体管的集电极连接到低侧控制端子,NPN晶体管的集电极连接到高侧控制 终奌站。 晶体管模型在晶闸管的整个阳极电流范围内呈现小的信号行为,由此当阳极电流退出小信号范围时,晶体管模型呈现增益下降。

Patent Agency Ranking