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公开(公告)号:US12242755B2
公开(公告)日:2025-03-04
申请号:US18434616
申请日:2024-02-06
Applicant: MICRON TECHNOLOGY, INC.
Inventor: Zhenming Zhou , Murong Lang , Ching-Huang Lu , Nagendra Prasad Ganesh Rao
IPC: G06F3/06
Abstract: A system includes a memory device and a processing device, operatively coupled with the memory device, to perform operations including: receiving a request to perform a read operation on a segment of the memory device; determining whether a temperature offset value of the segment satisfies a threshold criterion associated with a program erase cycle count of the segment; and responsive to determining that the temperature offset value satisfies the threshold criterion, performing a corrective read operation on the segment of the memory device, wherein a sense time parameter of the corrective read operation is modified according to the temperature offset value and the program erase cycle count.
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公开(公告)号:US20250069675A1
公开(公告)日:2025-02-27
申请号:US18774642
申请日:2024-07-16
Applicant: Micron Technology, Inc.
Inventor: Daniel Zhang , Yu-Chung Lien , Peng Zhang , Murong Lang , Zhenming Zhou
Abstract: The disclosure configures a memory sub-system controller to use prior read verify operations to selectively apply enhancements to read window budgets (RWB). The controller receives a request to perform a memory operation on data stored in an individual memory component of a set of memory components. The controller accesses RWB tracking information associated with the individual memory component and determines that the tracking information associated with the individual memory component indicates a need for enhancing a RWB associated with the memory operation. The controller applies one or more enhancement processes to the individual memory component in response to determining that the tracking information associated with the individual memory component indicates the need for enhancing the RWB associated with the memory operation.
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公开(公告)号:US20240331777A1
公开(公告)日:2024-10-03
申请号:US18615051
申请日:2024-03-25
Applicant: Micron Technology, Inc.
Inventor: Li-Te Chang , Charles S. Kwong , Murong Lang , Zhenming Zhou
CPC classification number: G11C16/26 , G06N20/00 , G11C16/0483
Abstract: Various embodiments use a cascade model to determine (e.g., predict or estimate) one or more read level voltage offsets used to read data from one or more memory cells of a memory device, which can be part of a memory sub-system.
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公开(公告)号:US20240329852A1
公开(公告)日:2024-10-03
申请号:US18739982
申请日:2024-06-11
Applicant: Micron Technology, Inc.
Inventor: Li-Te Chang , Murong Lang , Charles See Yeung Kwong , Vamsi Pavan Rayaprolu , Seungjune Jeon , Zhenming Zhou
CPC classification number: G06F3/0616 , G06F3/0653 , G06F3/0679 , G06N20/00
Abstract: A processing device in a memory sub-system determines one or more read margin levels associated with the memory device. A machine learning model is applied to the one or more read margin levels to generate a read margin prediction value associated with the memory device. Based on the margin prediction value, the memory device is assigned to a selected bin of a set of bins. A media scan operation is executed on the memory device in accordance with a scan frequency associated with the selected bin.
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公开(公告)号:US20240321350A1
公开(公告)日:2024-09-26
申请号:US18734724
申请日:2024-06-05
Applicant: Micron Technology, Inc.
Inventor: Li-Te Chang , Murong Lang , Zhenming Zhou
CPC classification number: G11C13/0033 , G11C13/0004 , G11C13/004 , G11C13/0069 , G11C11/5678
Abstract: Systems, methods, and apparatus related to memory devices. In one approach, a cross-point memory array includes memory cells. A media controller reads one or more first memory cells and determines a read status. The read status indicates an error when reading the first memory cells. In response to this error, the controller refreshes the first memory cells. The controller uses the read status to determine zero-to-one failures associated with the first memory cells. If a number of these failures exceeds a threshold, then a refresh is applied to neighboring memory cells of the first memory cells. The physical addresses for the neighboring memory cells are determined by the controller from the physical addresses for the first memory cells.
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116.
公开(公告)号:US20240319881A1
公开(公告)日:2024-09-26
申请号:US18662940
申请日:2024-05-13
Applicant: Micron Technology, Inc.
Inventor: Zhenming Zhou , Ching-Huang Lu , Murong Lang
IPC: G06F3/06
CPC classification number: G06F3/0611 , G06F3/0629 , G06F3/0679
Abstract: A system includes a memory device and a processing device, operatively coupled with the memory device, to perform operations including: receiving a request to perform a memory access operation on a set of cells associated with a wordline of the memory device; determining that the wordline is disposed on a first deck of the memory deck; responsive to determining that the wordline is disposed on the first deck, determining that the wordline is associated with a first group of wordlines associated with the first deck; and responsive to determining that the wordline is associated with the first group of wordlines associated with the first deck, performing the memory access operation on the set of cells connected to the wordline using a first time sense parameter, wherein the first time sense parameter corresponds to the first group of wordlines associated with the first deck.
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公开(公告)号:US20240311311A1
公开(公告)日:2024-09-19
申请号:US18672640
申请日:2024-05-23
Applicant: Micron Technology, Inc.
Inventor: Li-Te Chang , Murong Lang , Zhenming Zhou
CPC classification number: G06F12/1027 , G06F12/0692 , G11C16/10 , G11C16/26 , G11C16/349 , G06F2212/68 , G11C16/0483
Abstract: A block of a memory device is identified. A threshold voltage offset corresponding to a wordline associated with the block is identified based on a threshold voltage offset table. The threshold voltage offset table corresponds to at least one of: a value of a media state metric associated with the block, a wordline group of the wordline, or a difference between the wordline and a boundary wordline of the block. A read operations is performed on the block using a read level voltage modified by the threshold voltage offset, wherein the read level voltage is associated with the block.
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公开(公告)号:US12050777B2
公开(公告)日:2024-07-30
申请号:US17880213
申请日:2022-08-03
Applicant: Micron Technology, Inc.
Inventor: Li-Te Chang , Murong Lang , Charles See Yeung Kwong , Vamsi Pavan Rayaprolu , Seungjune Jeon , Zhenming Zhou
CPC classification number: G06F3/0616 , G06F3/0653 , G06F3/0679 , G06N20/00
Abstract: A processing device in a memory sub-system determines whether a media endurance metric associated with a memory block of a memory device satisfies one or more conditions. In response to the one or more conditions being satisfied, one or more read margin levels corresponding to a page type associated with the memory device are determined. A machine learning model is applied to the one or more read margin levels to generate a margin prediction value based on the page type and a wordline group associated with the memory device. Based on the margin prediction value, the memory device is assigned to a selected bin of a set of bins. A media scan operation is executed on the memory device in accordance with a scan frequency associated with the selected bin.
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公开(公告)号:US12026394B2
公开(公告)日:2024-07-02
申请号:US17889846
申请日:2022-08-17
Applicant: Micron Technology, Inc.
Inventor: Zhenming Zhou , Ching-Huang Lu , Murong Lang
IPC: G06F3/06
CPC classification number: G06F3/0655 , G06F3/0604 , G06F3/0679
Abstract: A system includes a memory device and a processing device, operatively coupled with the memory device, to perform operations including: receiving a request to perform a memory access operation on a set of cells associated with a wordline of the memory device; determining that a temperature associated with the memory device satisfies a threshold criterion; determining a memory access operation type of the memory access operation; and performing the memory access operation on the set of cells associated with the wordline using a first time sense parameter, wherein the first time sense parameter corresponds to the memory access operation type and the temperature associated with the memory device.
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公开(公告)号:US12014049B2
公开(公告)日:2024-06-18
申请号:US17888171
申请日:2022-08-15
Applicant: Micron Technology, Inc.
Inventor: Yu-Chung Lien , Zhenming Zhou , Murong Lang , Ching-Huang Lu
IPC: G06F3/06
CPC classification number: G06F3/0611 , G06F3/0653 , G06F3/0679
Abstract: Methods, systems, and apparatuses include receiving a command directed to a portion of memory. A cycle number for the portion of memory is determined. A group to which the portion of memory belongs is determined. A sensing time is determined using the cycle number and the group. The command is executed using the sensing time.
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