摘要:
There is provided a probe apparatus with a stage for holding a wafer on which a plurality of chips are regularly arranged such that the chips are arranged substantially in an XY plane, a large number of contactors facing the wafer held on the stage, provided to corresponding to respective pads of the chips such as to be brought into contact collectively with the pads of all the device circuits on the wafer, tester for transmitting/receiving a test signal to/from the device via the contactors, elevator device for elevating the stage in a Z-axis direction, alignment device for moving the stage in an X-axis and/or Y-axis direction, and controller for controlling the alignment device and the elevator device.
摘要:
A system for controlling an ignition device for a a motor vehicle comprises a key operated movable member, a blocking mechanism for automatically blocking the key operated movable member against return movement once the key operated movable member has moved beyond a predetermined position, and means responsive to a predetermined condition of the vehicle for restraining a manual release member of the blocking mechanism from actuation for releasing the blocking mechanism.
摘要:
An apparatus for improving the visibility of objects within the visual field of a vehicle driver and a process therefor are disclosed. The apparatus includes a light caster casting intense visible light toward a reflective object at a frequency no lower than critical fusion frequency, an image pickup device picking up an image of the object and outputting corresponding image data, an image data amplifier, a picture signal generator and a display. The image data are processed to yield a picture signal which yields a clear picture of the object on the display. The apparatus can give the driver of a vehicle a clear picture of the objects within forward visual field of the vehicle at night without dazzling the drivers of vehicles in the opposite lane.
摘要:
It is an object of the present invention to provide a semiconductor inspection apparatus capable of well carrying out position alignment and correctly determining whether the position alignment has been carried out successfully or has ended in a failure without operator interventions even if an inspected image is an image having few characteristics as is the case with a repetitive pattern or the inspected image is an image having a complicated shape.The semiconductor inspection apparatus includes means for imaging a shape on a wafer or on an exposure mask; means for storing an image inspected by the imaging means; means for storing design data of the semiconductor circuit corresponding to a position on the wafer or on the exposure mask which are to be imaged by the imaging means; means for storing a design-data image obtained as a result of converting the design data into an image; means for generating a design-data ROI image by converting an interest drawing region found from a relative crude-density relation of a shape included in the design-data image into an image; and a position alignment section configured to carry out position alignment on the inspected image and the design-data image. The semiconductor inspection apparatus makes use of the design-data ROI image in order to identify a position at which the inspected image and the design-data image match each other or compute the degree of coincidence.
摘要:
In order to provide a computer program, an image processing device, and a pattern matching method that perform pattern matching at a high level of accuracy without relying on edge deformation, contrast fluctuations, etc., in one embodiment, the disclosed pattern matching method and device perform pattern matching over an image using a template produced on the basis of the below mentioned design data. The pattern matching method and device determine the characteristic quantities of the image for an inner region and/or an outer region that are divided by a line that defines the contour of a pattern, and determine positions at which said characteristic quantities satisfy predetermined conditions to be matching positions, matching position candidates, or erroneous matching positions.
摘要:
There is provided a data processing system including a server device for providing Web data having a data portion with a specific identifier, and a data processing apparatus having a receiving unit for receiving the Web data from the server device, an analysis unit for analyzing the Web data to extract the specific identifier from the Web data, and a data processing unit for changing the data portion with the specific identifier based on local data.
摘要:
Provided is a water-proof sound transmitting member that is less likely to be bonded to a housing at a position other than a normal attachment position. The present invention provides a waterproof sound transmitting member (2) having a multilayer structure. This water-proof sound transmitting member (2) includes: a water-proof sound transmitting membrane (11) to be attached to a housing having a hole that allows sound to pass therethrough; a support layer (12) to be attached to the housing together with the waterproof sound transmitting membrane (11), the support layer (12) allowing sound to pass therethrough; and a housing-side adhesive layer (21) for bonding the waterproof sound transmitting membrane (11) to the housing. The entire peripheral portion of the support layer (12) extends outwardly beyond the housing-side adhesive layer (21).
摘要:
Provided is a waterproof sound-transmitting membrane 1 including: a solid resin film 2 having a plurality of through holes 21 formed therein; and a treatment layer 3 having water repellency and formed on at least one of two surfaces of the resin film 2 that are opposite to each other in the thickness direction. The treatment layer 3 has openings 31 at positions corresponding to the through holes 21. The air permeability of the waterproof sound-transmitting membrane 1 is 100 seconds/100 mL or less in terms of Gurley number.
摘要:
In order to provide a computer program, an image processing device, and a pattern matching method that perform pattern matching at a high level of accuracy without relying on edge deformation, contrast fluctuations, etc., in one embodiment, the disclosed pattern matching method and device perform pattern matching over an image using a template produced on the basis of the below mentioned design data. The pattern matching method and device determine the characteristic quantities of the image for an inner region and/or an outer region that are divided by a line that defines the contour of a pattern, and determine positions at which said characteristic quantities satisfy predetermined conditions to be matching positions, matching position candidates, or erroneous matching positions.
摘要:
Disclosed is a pattern matching method whereby a testing point can be searched accurately while simplifying the work of presetting. An image region of a part of a captured image is extracted, and a divided image of the image region is set as a template image. A pattern matching is performed by rotating the template image. Moreover, the pattern matching determines whether a point-symmetric pattern exists inside the image region.