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公开(公告)号:US11538532B2
公开(公告)日:2022-12-27
申请号:US17199383
申请日:2021-03-11
Applicant: Silicon Storage Technology, Inc.
Inventor: Xian Liu , Chunming Wang , Nhan Do , Hieu Van Tran
IPC: G06F11/10 , G06F11/07 , G06F11/30 , G06F11/14 , G11C16/26 , G11C11/56 , G11C16/04 , G11C16/24 , H01L23/00 , H01L25/065 , H01L25/18 , H03K19/20
Abstract: Numerous embodiments are disclosed of improved architectures for storing and retrieving system data in a non-volatile memory system. Using these embodiments, system data is much less likely to become corrupted due to charge loss, charge redistribution, disturb effects, and other phenomena that have caused corruption in prior art non-volatile memory systems.
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公开(公告)号:US20220319620A1
公开(公告)日:2022-10-06
申请号:US17841411
申请日:2022-06-15
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van TRAN , Thuan VU , Stephen TRINH , Stanley HONG , Anh LY , Steven LEMKE , Nha NGUYEN , Vipin TIWARI , Nhan DO
Abstract: Testing circuitry and methods are disclosed for use with analog neural memory in deep learning artificial neural networks. In one example, a method is disclosed of testing a plurality of non-volatile memory cells in an array of non-volatile memory cells, wherein the array is arranged in rows and columns, wherein each row is coupled to a word line and each column is coupled to a bit line, and wherein each word line is selectively coupled to a row decoder and each bit line is selectively coupled to a column decoder, the method comprising asserting, by the row decoder, all word lines in the array; asserting, by the column decoder, all bit lines in the array; performing a deep programming operation on the array of non-volatile memory cells; and measuring a total current received from the bit lines.
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公开(公告)号:US20220254414A1
公开(公告)日:2022-08-11
申请号:US17734807
申请日:2022-05-02
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Thuan Vu , Stanley Hong , Anh Ly , Vipin Tiwari , Nhan Do
IPC: G11C16/04 , G06N3/08 , H01L27/11521 , H01L29/788
Abstract: Numerous embodiments are disclosed for a high voltage generation algorithm and system for generating high voltages necessary for a particular programming operation in analog neural memory used in a deep learning artificial neural network. In one example, a method for programming a plurality of non-volatile memory cells in an array of non-volatile memory cells, comprises generating a high voltage, and programming a plurality of non-volatile memory cells in an array using the high voltage when a programming enable signal is asserted and providing a feedback loop to maintain the high voltage while programming the plurality of non-volatile memory cells.
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公开(公告)号:US11355184B2
公开(公告)日:2022-06-07
申请号:US16986812
申请日:2020-08-06
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Thuan Vu , Stephen Trinh , Stanley Hong , Anh Ly , Vipin Tiwari
Abstract: Numerous embodiments of analog neural memory arrays are disclosed. In certain embodiments, each memory cell in the array has an approximately constant source impedance when that cell is being operated. In certain embodiments, power consumption is substantially constant from bit line to bit line within the array when cells are being read. In certain embodiments, weight mapping is performed adaptively for optimal performance in power and noise.
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公开(公告)号:US20220147794A1
公开(公告)日:2022-05-12
申请号:US17580862
申请日:2022-01-21
Inventor: FARNOOD MERRIKH BAYAT , XINJIE GUO , DMITRI STRUKOV , NHAN DO , HIEU VAN TRAN , VIPIN TIWARI , MARK REITEN
Abstract: An artificial neural network device that utilizes one or more non-volatile memory arrays as the synapses. The synapses are configured to receive inputs and to generate therefrom outputs. Neurons are configured to receive the outputs. The synapses include a plurality of memory cells, wherein each of the memory cells includes spaced apart source and drain regions formed in a semiconductor substrate with a channel region extending there between, a floating gate disposed over and insulated from a first portion of the channel region and a non-floating gate disposed over and insulated from a second portion of the channel region. Each of the plurality of memory cells is configured to store a weight value corresponding to a number of electrons on the floating gate. The plurality of memory cells are configured to multiply the inputs by the stored weight values to generate the outputs.
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公开(公告)号:US11315636B2
公开(公告)日:2022-04-26
申请号:US16784183
申请日:2020-02-06
Applicant: Silicon Storage Technology, Inc.
Inventor: Hsuan Liang , Man Tang Wu , Jeng-Wei Yang , Hieu Van Tran , Lihsin Chang , Nhan Do
IPC: G11C16/16 , G11C16/04 , G11C16/08 , G11C16/10 , H01L27/11521
Abstract: A memory cell array with memory cells arranged in rows and columns, first sub source lines each connecting together the source regions in one of the rows and in a first plurality of the columns, second sub source lines each connecting together the source regions in one of the rows and in a second plurality of the columns, a first and second erase gate lines each connecting together all of the erase gates in the first and second plurality of the columns respectively, first select transistors each connected between one of first sub source lines and one of a plurality of source lines, second select transistors each connected between one of second sub source lines and one of the source lines, first select transistor line connected to gates of the first select transistors, and a second select transistor line connected to gates of the second select transistors.
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127.
公开(公告)号:US11289164B2
公开(公告)日:2022-03-29
申请号:US17104385
申请日:2020-11-25
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Thuan Vu , Stanley Hong , Stephen Trinh , Anh Ly
Abstract: Various embodiments of tandem row decoders are disclosed. Each embodiment of a tandem row decoder comprises a word line decoder and a control gate decoder. The tandem row decoder exhibits reduced leakage current on the word line and the control gate line when the tandem row decoder is not enabled.
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128.
公开(公告)号:US20210358551A1
公开(公告)日:2021-11-18
申请号:US17082956
申请日:2020-10-28
Applicant: Silicon Storage Technology, Inc.
Inventor: HIEU VAN TRAN , STANLEY HONG , STEPHEN TRINH , THUAN VU , STEVEN LEMKE , VIPIN TIWARI , NHAN DO
Abstract: Numerous embodiments of analog neural memory arrays are disclosed. Two or more physical memory cells are grouped together to form a logical cell that stores one of N possible levels. Within each logical cell, the memory cells can be programmed using different mechanisms. For example, one or more of the memory cells in a logical cell can be programmed using a coarse programming mechanism, one or more of the memory cells can be programmed using a fine mechanism, and one or more of the memory cells can be programmed using a tuning mechanism. This achieves extreme programming accuracy and programming speed.
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公开(公告)号:US11144824B2
公开(公告)日:2021-10-12
申请号:US16360955
申请日:2019-03-21
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Thuan Vu , Stephen Trinh , Stanley Hong , Anh Ly
IPC: G11C16/10 , G06N3/063 , G11C16/04 , G06N3/08 , G06F12/0811 , G11C11/4063 , G11C11/54
Abstract: Various algorithms are disclosed for verifying the stored weight in a non-volatile memory cell in a neural network following a multilevel programming operation of the non-volatile memory cell by converting the stored weight into a plurality of digital output bits. Circuity, such as an adjustable reference current source, for implementing the algorithms are disclosed.
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公开(公告)号:US20210295907A1
公开(公告)日:2021-09-23
申请号:US17024410
申请日:2020-09-17
Applicant: Silicon Storage Technology, Inc.
Inventor: HIEU VAN TRAN , THUAN VU , STEPHEN TRINH , STANLEY HONG , ANH LY , STEVEN LEMKE , VIPIN TIWARI , NHAN DO
Abstract: Numerous embodiments for performing tuning of a page or a word of non-volatile memory cells in an analog neural memory are disclosed. High voltage circuits used to generate high voltages applied to terminals of the non-volatile memory cells during the precision tuning process are also disclosed. Programming sequences for the application of the voltages to the terminals to minimize the occurrence of disturbances during tuning are also disclosed.
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