PROCESSING SYSTEM, RELATED INTEGRATED CIRCUIT, DEVICE AND METHOD

    公开(公告)号:US20230314506A1

    公开(公告)日:2023-10-05

    申请号:US18186624

    申请日:2023-03-20

    CPC classification number: G01R31/31721 G01R31/31724 G01R31/318566

    Abstract: In an embodiment a processing system includes a reset circuit configured to receive a reset-request signal and one or more further reset-request signals, wherein the one or more further reset-request signals are provided by a processing core, one or more further circuits and/or a terminal of the processing system and to generate a combined reset-request signal by combining the reset-request signal and the one or more further reset-request signals, and a hardware test circuit including for each of the one or more further reset-request signals, a respective first combinational circuit configured to selectively assert the respective further reset-request signal, a second combinational logic circuit configured to selectively mask the combined reset-request signal, and a control circuit configured to repeat operations during a diagnostic phase.

    SRAM cell layout including arrangement of multiple active regions and multiple gate regions

    公开(公告)号:US11758707B2

    公开(公告)日:2023-09-12

    申请号:US17118372

    申请日:2020-12-10

    CPC classification number: H10B10/12 H10B10/18

    Abstract: A memory cell including a set of active regions that overlay a set of gate regions to form a pair of cross-coupled inverters. A first active region extends along a first axis. A first gate region extends transversely to the first active region and overlays the first active region to form a first transistor of the pair of cross-coupled inverters. A second gate region extends transversely to the first active region and overlays the first active region to form a second transistor of the pair of cross-coupled inverters. A second active region extends along a second axis and overlays the first gate region to form a third transistor of the pair of cross-coupled inverters. A fourth active region extending along a third axis and overlays a gate region to form a transistor of a read port.

    Circuit and method for scan testing
    136.
    发明授权

    公开(公告)号:US11714131B1

    公开(公告)日:2023-08-01

    申请号:US17699900

    申请日:2022-03-21

    Abstract: In an embodiment, a method for performing scan testing includes: generating first and second scan clock signals; providing the first and second scan clock signals to first and second scan chains, respectively, where the first and second scan clock signals includes respective first shift pulses when a scan enable signal is asserted, and respective first capture pulses when the scan enable signal is deasserted, where the first shift pulse of the first and second scan clock signals correspond to a first clock pulse of a first clock signal, where the first capture pulse of the first scan clock signal corresponds to a second clock pulse of the first clock signal, and where the first capture pulse of the second scan clock signal corresponds to a first clock pulse of a second clock signal different from the first clock signal.

    TIME INTERLEAVING CIRCUIT HAVING GLITCH MITIGATION

    公开(公告)号:US20230231546A1

    公开(公告)日:2023-07-20

    申请号:US18151332

    申请日:2023-01-06

    Inventor: Aradhana KUMARI

    CPC classification number: H03K5/1252 H03K5/135

    Abstract: Provided is a time interleaving circuit to mitigate glitches. A first loading stage outputs first data representative of first serialized data. A second loading stage generates second serialized data. The second loading stage receives the first data output by the first loading stage. In response to the first data having a first state, the time interleaving circuit inverts the second serialized data to generate second data representative of the second serialized data. In response to the first data having a second state, the time interleaving circuit outputting the second data without inverting the second serialized data. Exclusive disjunction logic receives the second data and operates on the first data and the second data to generate output data.

    Glitch suppression apparatus and method

    公开(公告)号:US11687428B2

    公开(公告)日:2023-06-27

    申请号:US17152901

    申请日:2021-01-20

    CPC classification number: G06F11/263 G06F1/06 G06F11/2236

    Abstract: An apparatus includes a main core processor configured to receive a first signal through a first main buffer, a second signal through a second main buffer, a third signal through a third main buffer and a fourth signal through a fourth main buffer, a shadow core processor configured to receive the first signal through a first shadow buffer, the second signal through a second shadow buffer, the third signal through a third shadow buffer and the fourth signal through a fourth shadow buffer, and a first glitch suppression buffer coupled to a common node of an input of the first main buffer and an input of the first shadow buffer.

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