Semiconductor device and method of manufacturing a semiconductor device
    181.
    发明授权
    Semiconductor device and method of manufacturing a semiconductor device 失效
    半导体装置及其制造方法

    公开(公告)号:US07084028B2

    公开(公告)日:2006-08-01

    申请号:US10636750

    申请日:2003-08-08

    申请人: Yoshiaki Fukuzumi

    发明人: Yoshiaki Fukuzumi

    IPC分类号: H01L21/8242 H01L29/94

    摘要: A semiconductor device comprises a semiconductor substrate having a cavity region inside; a first insulation film formed on the inner wall of the cavity region; a first electrode formed on the inner wall of the first insulation film in the cavity region, and having a hollow cavity inside; a semiconductor region overlying the cavity region and including first semiconductor regions of a first conductivity type and second semiconductor regions of a second conductivity type which are adjacent to each other, said semiconductor region having a bottom surface on which the first electrode is formed via the first insulation film; a second insulation film covering the top surface of the semiconductor region; and a second electrode formed on the semiconductor region via the second insulation film and electrically insulated from the semiconductor region and the first electrode.

    摘要翻译: 半导体器件包括其内部具有空腔区域的半导体衬底; 形成在所述腔区域的内壁上的第一绝缘膜; 第一电极,形成在空腔区域中的第一绝缘膜的内壁上,并且在其内部具有中空腔; 覆盖所述空腔区域并且包括彼此相邻的第一导电类型的第一半导体区域和第二导电类型的第二半导体区域的半导体区域,所述半导体区域具有经由所述第一导电类型形成所述第一电极的底表面 绝缘膜; 覆盖半导体区域的顶表面的第二绝缘膜; 以及经由所述第二绝缘膜形成在所述半导体区域上并与所述半导体区域和所述第一电极电绝缘的第二电极。

    Magnetic random access memory
    182.
    发明授权
    Magnetic random access memory 失效
    磁性随机存取存储器

    公开(公告)号:US06980464B2

    公开(公告)日:2005-12-27

    申请号:US10310022

    申请日:2002-12-05

    申请人: Yoshiaki Fukuzumi

    发明人: Yoshiaki Fukuzumi

    CPC分类号: G11C11/16

    摘要: An MRAM includes a magneto resistive element, which has a record layer and a reference layer disposed to sandwich a tunnel barrier film and is configured to store data in the record layer. An electric current drive line is disposed to selectively apply a magnetic field to the magneto resistive element. The record layer has a first ferromagnetic layer while the reference layer has a second ferromagnetic layer. Retentivity of retaining a magnetization direction of the second ferromagnetic layer is smaller than retentivity of retaining a magnetization direction of the first ferromagnetic layer, against a magnetic field applied to the magneto resistive element by the electric current drive line.

    摘要翻译: MRAM包括磁阻元件,其具有设置成夹持隧道势垒膜的记录层和参考层,并被配置为将数据存储在记录层中。 设置电流驱动线以选择性地向磁阻元件施加磁场。 记录层具有第一铁磁层,而参考层具有第二铁磁层。 保持第二铁磁层的磁化方向的保持力小于通过电流驱动线施加到磁电阻元件的磁场而保持第一铁磁层的磁化方向的保持性。

    Semiconductor memory device comprising magneto resistive element and its manufacturing method
    183.
    发明申请
    Semiconductor memory device comprising magneto resistive element and its manufacturing method 有权
    包括磁阻元件的半导体存储器件及其制造方法

    公开(公告)号:US20050185459A1

    公开(公告)日:2005-08-25

    申请号:US11109675

    申请日:2005-04-20

    申请人: Yoshiaki Fukuzumi

    发明人: Yoshiaki Fukuzumi

    摘要: A semiconductor memory device includes a memory cell, a side wall insulating film, and an interlayer insulating film. A memory cell includes a first ferromagnetic film, a tunnel barrier film formed on the first ferromagnetic film, and a second ferromagnetic film formed on the tunnel barrier film. The side wall insulating film is formed so as to surround at least sides of the second ferromagnetic film. The interlayer insulating film is formed so as to cover the memory cell and the side wall insulating film.

    摘要翻译: 半导体存储器件包括存储单元,侧壁绝缘膜和层间绝缘膜。 存储单元包括形成在第一铁磁膜上的第一铁磁膜,隧道阻挡膜和形成在隧道势垒膜上的第二铁磁膜。 侧壁绝缘膜形成为围绕第二铁磁性膜的至少一侧。 层间绝缘膜形成为覆盖存储单元和侧壁绝缘膜。

    Magnetic memory device having magnetic circuit and method of manufacture thereof
    184.
    发明授权
    Magnetic memory device having magnetic circuit and method of manufacture thereof 失效
    具有磁路的磁存储装置及其制造方法

    公开(公告)号:US06882564B2

    公开(公告)日:2005-04-19

    申请号:US10359151

    申请日:2003-02-06

    申请人: Yoshiaki Fukuzumi

    发明人: Yoshiaki Fukuzumi

    摘要: A magnetic memory device includes first and second magnetoresistance elements. The first and second magnetoresistance elements store information and are provided apart from each other in a first direction. A first wiring to apply a magnetic field to the first and second magnetoresistance elements is provided along the first direction. A first magnetic circuit is formed along a side of the first wiring and has a notch in its portion between the first and second magnetoresistance elements.

    摘要翻译: 磁存储器件包括第一和第二磁阻元件。 第一和第二磁阻元件存储信息并且在第一方向彼此分开地设置。 沿着第一方向设置用于向第一和第二磁阻元件施加磁场的第一布线。 第一磁路沿着第一布线的一侧形成,并且在其第一和第二磁阻元件之间的部分具有凹口。

    Magnetic memory device and method of manufacturing the same
    186.
    发明申请
    Magnetic memory device and method of manufacturing the same 失效
    磁记忆体装置及其制造方法

    公开(公告)号:US20050007819A1

    公开(公告)日:2005-01-13

    申请号:US10915511

    申请日:2004-08-10

    申请人: Yoshiaki Fukuzumi

    发明人: Yoshiaki Fukuzumi

    摘要: A magnetic memory device includes a magnetoresistance configured to store information. A first wiring is provided along a first direction. The first wiring has a function of applying a magnetic field to the magnetoresistance element. The first wiring has a first surface and a second surface. The second surface faces the magnetoresistance element and the first surface is opposite to it. The second surface is smaller in width than the first surface.

    摘要翻译: 磁存储器件包括被配置为存储信息的磁阻。 沿着第一方向设置第一布线。 第一布线具有向磁阻元件施加磁场的功能。 第一布线具有第一表面和第二表面。 第二表面面对磁阻元件,第一表面与其相对。 第二表面的宽度小于第一表面。

    Method of manufacturing semiconductor device
    187.
    发明授权
    Method of manufacturing semiconductor device 失效
    制造半导体器件的方法

    公开(公告)号:US06593180B1

    公开(公告)日:2003-07-15

    申请号:US09708044

    申请日:2000-11-08

    IPC分类号: H01L218242

    摘要: A method of manufacturing semiconductor device comprises the step of forming the transistor in the semiconductor substrate, the step of forming the capacitor conducting to the transistor, and the step of forming the insulating film to cover the transistor and the capacitor; and the step of sintering the semiconductor substrate in an atmosphere including the mixture of hydrogen, nitrogen and oxygen gases.

    摘要翻译: 制造半导体器件的方法包括在半导体衬底中形成晶体管的步骤,形成对晶体管导通的电容器的步骤以及形成绝缘膜以覆盖晶体管和电容器的步骤; 以及在包括氢,氮和氧气的混合气体的气氛中烧结半导体衬底的步骤。

    Nonvolatile semiconductor memory device and method of fabricating the same
    188.
    发明授权
    Nonvolatile semiconductor memory device and method of fabricating the same 有权
    非易失性半导体存储器件及其制造方法

    公开(公告)号:US08624316B2

    公开(公告)日:2014-01-07

    申请号:US13227882

    申请日:2011-09-08

    IPC分类号: H01L29/792

    摘要: According to one embodiment, a semiconductor device, including a substrate, a stacked layer body provided above the substrate, the stacked layer body alternately stacking an insulator and an electrode film one on another, silicon pillars contained with fluorine, the silicon pillar penetrating through and provided in the stacked layer body, a tunnel insulator provided on a surface of the silicon pillar facing to the stacked layer body, a charge storage layer provided on a surface of the tunnel insulator facing to the stacked layer body, a block insulator provided on a surface of the charge storage layer facing to the stacked layer body, the block insulator being in contact with the electrode film, and an embedded portion provided in the silicon pillars.

    摘要翻译: 根据一个实施例,一种半导体器件,包括衬底,在衬底上方设置的层叠体,堆叠层体彼此交替堆叠绝缘体和电极膜,含有氟的硅柱,穿透硅柱的硅柱, 设置在堆叠层体上的隧道绝缘体,设置在与层叠体主体相对的硅柱的表面上的隧道绝缘体,设置在隧道绝缘体的面向堆叠层主体的表面上的电荷存储层, 面向堆叠层体的电荷存储层的表面,块绝缘体与电极膜接触,以及设置在硅柱中的嵌入部。