PATTERN FORMING METHOD, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, MANUFACTURING METHOD OF ELECTRONIC DEVICE USING THE SAME, AND ELECTRONIC DEVICE
    13.
    发明申请
    PATTERN FORMING METHOD, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, MANUFACTURING METHOD OF ELECTRONIC DEVICE USING THE SAME, AND ELECTRONIC DEVICE 审中-公开
    图案形成方法,丙烯酸敏感性或辐射敏感性树脂组合物,耐蚀膜,使用其的电子器件的制造方法和电子设备

    公开(公告)号:US20150147688A1

    公开(公告)日:2015-05-28

    申请号:US14603811

    申请日:2015-01-23

    CPC classification number: G03F7/0392 G03F7/0397 G03F7/325

    Abstract: There is provided a pattern forming method comprising (1) a step of forming a film by using an actinic ray-sensitive or radiation-sensitive resin composition containing (P) a resin having a repeating unit represented by the specific formula, (2) a step of exposing the film by using an actinic ray or radiation, and (3) a step of developing the exposed film by using an organic solvent-containing developer to form a negative pattern, wherein the content of the repeating unit represented by the specific formula is 25 mol % or more based on all repeating units in the resin (P).

    Abstract translation: 提供一种图案形成方法,其包括(1)通过使用含有(P)具有由所述具体式表示的重复单元的树脂的光化射线敏感或辐射敏感性树脂组合物形成膜的步骤,(2)a 通过使用光化射线或辐射使膜曝光的步骤,以及(3)通过使用含有机溶剂的显影剂显影曝光的薄膜以形成负图案的步骤,其中由特定式表示的重复单元的含量 基于树脂(P)中的所有重复单元为25摩尔%以上。

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